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                             12 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Advances in Crystallographic Image Processing for Scanning Probe Microscopy: Unambiguous identification of the translation symmetry of a 2D periodic image Moeck, Peter

1712 1 p. 1-6
artikel
2 A Study of Structural Damage & Recovery of Si, Ge and Ga FIB implants in Silicon Balasubramanian, Prabhu

1712 1 p. 45-50
artikel
3 Characterization of Localized Electrochemical Properties of Si3N4-TiC Ceramic Nanocomposite Using Dual-Electrode Scanning Probes Liu, Bernard Haochih

1712 1 p. 7-12
artikel
4 Characterization of Micro-Pore Structure in Novel Cement Matrices Yoon, Seyoon

1712 1 p. 57-62
artikel
5 Dynamic investigation of defects induced by short, high current pulses of high energy lithium ions Guo, Hua

1712 1 p. 39-44
artikel
6 Fabrication of Coaxial and Triaxial Atomic Force Microscope Imaging Probes Westervelt, Robert M.

1712 1 p. 13-21
artikel
7 In-situ annealing of self-ion irradiation damage in tungsten Yi, Xiaoou.

1712 1 p. 33-38
artikel
8 In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques Cornelius, Thomas W.

1712 1 p. 63-68
artikel
9 In-situ Pair Distribution Function Study of the Growth of Supported Platinum Particles in Zeolite X Gámez, Liliana M.

1712 1 p. 69-75
artikel
10 Ion-Beam Modification of Colloidal Silica Particle Masks to Tailor the Size of Ordered Arrays of Ag Nanostructures Produced by Nanosphere Lithography Reséndiz, Eder

1712 1 p. 51-56
artikel
11 Probe Rotating Atomic Force Microscopy for material characterization Lee, Sang Heon

1712 1 p. 22-26
artikel
12 Rapid Time Domain Molecular Conductance Measurement of Alkanedithiols Using STM Ma, James

1712 1 p. 27-32
artikel
                             12 gevonden resultaten
 
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