nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Advances in Crystallographic Image Processing for Scanning Probe Microscopy: Unambiguous identification of the translation symmetry of a 2D periodic image
|
Moeck, Peter |
|
|
1712 |
1 |
p. 1-6 |
artikel |
2 |
A Study of Structural Damage & Recovery of Si, Ge and Ga FIB implants in Silicon
|
Balasubramanian, Prabhu |
|
|
1712 |
1 |
p. 45-50 |
artikel |
3 |
Characterization of Localized Electrochemical Properties of Si3N4-TiC Ceramic Nanocomposite Using Dual-Electrode Scanning Probes
|
Liu, Bernard Haochih |
|
|
1712 |
1 |
p. 7-12 |
artikel |
4 |
Characterization of Micro-Pore Structure in Novel Cement Matrices
|
Yoon, Seyoon |
|
|
1712 |
1 |
p. 57-62 |
artikel |
5 |
Dynamic investigation of defects induced by short, high current pulses of high energy lithium ions
|
Guo, Hua |
|
|
1712 |
1 |
p. 39-44 |
artikel |
6 |
Fabrication of Coaxial and Triaxial Atomic Force Microscope Imaging Probes
|
Westervelt, Robert M. |
|
|
1712 |
1 |
p. 13-21 |
artikel |
7 |
In-situ annealing of self-ion irradiation damage in tungsten
|
Yi, Xiaoou. |
|
|
1712 |
1 |
p. 33-38 |
artikel |
8 |
In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques
|
Cornelius, Thomas W. |
|
|
1712 |
1 |
p. 63-68 |
artikel |
9 |
In-situ Pair Distribution Function Study of the Growth of Supported Platinum Particles in Zeolite X
|
Gámez, Liliana M. |
|
|
1712 |
1 |
p. 69-75 |
artikel |
10 |
Ion-Beam Modification of Colloidal Silica Particle Masks to Tailor the Size of Ordered Arrays of Ag Nanostructures Produced by Nanosphere Lithography
|
Reséndiz, Eder |
|
|
1712 |
1 |
p. 51-56 |
artikel |
11 |
Probe Rotating Atomic Force Microscopy for material characterization
|
Lee, Sang Heon |
|
|
1712 |
1 |
p. 22-26 |
artikel |
12 |
Rapid Time Domain Molecular Conductance Measurement of Alkanedithiols Using STM
|
Ma, James |
|
|
1712 |
1 |
p. 27-32 |
artikel |