nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes
|
Bellotti, Roberto |
|
|
5 |
2 |
p. 127-138 |
artikel |
2 |
Analysis of Line-Edge Roughness Using EUV Scatterometry
|
Fernández Herrero, Analía |
|
|
5 |
2 |
p. 149-158 |
artikel |
3 |
Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation
|
Schaude, Janik |
|
|
5 |
2 |
p. 139-148 |
artikel |
4 |
Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform
|
Wang, Fang |
|
|
5 |
2 |
p. 119-126 |
artikel |
5 |
Comparison of EUV Photomask Metrology Between CD-AFM and TEM
|
Dai, Gaoliang |
|
|
5 |
2 |
p. 91-100 |
artikel |
6 |
DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
|
Du, Hongchu |
|
|
5 |
2 |
p. 101-111 |
artikel |
7 |
Foreword to the Special Issue on Atomic and Close-to-Atomic Scale Metrology
|
Dai, Gaoliang |
|
|
5 |
2 |
p. 81-82 |
artikel |
8 |
Origins of Ultrafast Pulse Laser-Induced Nano Straight Lines with Potential Applications in Detecting Subsurface Defects in Silicon Carbide Wafers
|
Shu, Tan |
|
|
5 |
2 |
p. 167-178 |
artikel |
9 |
Polarization Measurement Method Based on Liquid Crystal Variable Retarder (LCVR) for Atomic Thin-Film Thickness
|
Yuan, Yucong |
|
|
5 |
2 |
p. 159-166 |
artikel |
10 |
Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan
|
Misumi, Ichiko |
|
|
5 |
2 |
p. 83-90 |
artikel |
11 |
Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication
|
Deng, Xiao |
|
|
5 |
2 |
p. 179-187 |
artikel |
12 |
Slice Thickness Optimization for the Focused Ion Beam-Scanning Electron Microscopy 3D Tomography of Hierarchical Nanoporous Gold
|
Shkurmanov, Alexander |
|
|
5 |
2 |
p. 112-118 |
artikel |