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                             12 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes Bellotti, Roberto

5 2 p. 127-138
artikel
2 Analysis of Line-Edge Roughness Using EUV Scatterometry Fernández Herrero, Analía

5 2 p. 149-158
artikel
3 Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation Schaude, Janik

5 2 p. 139-148
artikel
4 Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform Wang, Fang

5 2 p. 119-126
artikel
5 Comparison of EUV Photomask Metrology Between CD-AFM and TEM Dai, Gaoliang

5 2 p. 91-100
artikel
6 DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images Du, Hongchu

5 2 p. 101-111
artikel
7 Foreword to the Special Issue on Atomic and Close-to-Atomic Scale Metrology Dai, Gaoliang

5 2 p. 81-82
artikel
8 Origins of Ultrafast Pulse Laser-Induced Nano Straight Lines with Potential Applications in Detecting Subsurface Defects in Silicon Carbide Wafers Shu, Tan

5 2 p. 167-178
artikel
9 Polarization Measurement Method Based on Liquid Crystal Variable Retarder (LCVR) for Atomic Thin-Film Thickness Yuan, Yucong

5 2 p. 159-166
artikel
10 Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan Misumi, Ichiko

5 2 p. 83-90
artikel
11 Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication Deng, Xiao

5 2 p. 179-187
artikel
12 Slice Thickness Optimization for the Focused Ion Beam-Scanning Electron Microscopy 3D Tomography of Hierarchical Nanoporous Gold Shkurmanov, Alexander

5 2 p. 112-118
artikel
                             12 gevonden resultaten
 
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