| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Comprehensive FIB Lift-out Sample Preparation Method for Scanning Probe Microscopy
|
Ji, F.
|
|
|
5 |
1 |
p. 67-79
|
artikel
|
| 2 |
Atomic-Scale Friction Studies on Single-Crystal Gallium Arsenide Using Atomic Force Microscope and Molecular Dynamics Simulation
|
Fan, Pengfei
|
|
|
5 |
1 |
p. 39-49
|
artikel
|
| 3 |
Deterministic Dual Control of Phase Competition in Strained BiFeO3: A Multiparametric Structural Lithography Approach
|
Black, Nathan
|
|
|
5 |
1 |
p. 60-66
|
artikel
|
| 4 |
Fabrication of Nanoscale Active Plasmonic Elements Using Atomic Force Microscope Tip-Based Nanomachining
|
Barron, Ciarán
|
|
|
5 |
1 |
p. 50-59
|
artikel
|
| 5 |
Foreword to the Special Issue on SPM-Based Nanofabrication: Machining, Electrochemistry, and Lithography
|
Rodriguez, Brian J.
|
|
|
5 |
1 |
p. 1
|
artikel
|
| 6 |
Patterning Functionalized Surfaces of 2D Materials by Nanoshaving
|
O’Neill, Katie
|
|
|
5 |
1 |
p. 23-31
|
artikel
|
| 7 |
Tip-Based Nanomachining on Thin Films: A Mini Review
|
Chang, Shunyu
|
|
|
5 |
1 |
p. 2-22
|
artikel
|
| 8 |
Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching
|
Han, Wei
|
|
|
5 |
1 |
p. 32-38
|
artikel
|
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