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5 results found
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title
author
magazine
year
volume
issue
page(s)
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1
Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
Sun, Cheng
2019
5
1
p. 1-9
article
2
Fast approximate STEM image simulations from a machine learning model
Combs, Aidan H.
2019
5
1
p. 1-10
article
3
Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations
Pretzsch, Rebecca
2019
5
1
p. 1-11
article
4
Optimal principal component analysis of STEM XEDS spectrum images
Potapov, Pavel
2019
5
1
p. 1-21
article
5
Unsupervised machine learning applied to scanning precession electron diffraction data
Martineau, Ben H.
2019
5
1
p. 1-14
article
5 results found
Koninklijke Bibliotheek -
National Library of the Netherlands