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                             5 results found
no title author magazine year volume issue page(s) type
1 Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope Sun, Cheng
2019
5 1 p. 1-9
article
2 Fast approximate STEM image simulations from a machine learning model Combs, Aidan H.
2019
5 1 p. 1-10
article
3 Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations Pretzsch, Rebecca
2019
5 1 p. 1-11
article
4 Optimal principal component analysis of STEM XEDS spectrum images Potapov, Pavel
2019
5 1 p. 1-21
article
5 Unsupervised machine learning applied to scanning precession electron diffraction data Martineau, Ben H.
2019
5 1 p. 1-14
article
                             5 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands