nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Advanced Integration Process Technology for Highly Reliable Ferroelectric Devices
|
Song, Y. J. |
|
2004 |
61 |
1 |
p. 97-103 |
artikel |
2 |
Anomalous "Fatigue" Effect in High-Temperature Ferroelectric Crystal LaBGeO5
|
Milov, E. V. |
|
2004 |
61 |
1 |
p. 205-211 |
artikel |
3 |
A Novel Ferroelectric FET Based Memory Cell of Minimum Size and Non-Destructive Reading
|
Chu, D. P. |
|
2004 |
61 |
1 |
p. 71-76 |
artikel |
4 |
Current and Future High Density FRAM Technology
|
Kim, Kinam |
|
2004 |
61 |
1 |
p. 3-15 |
artikel |
5 |
Dielectric and Electrical Characteristics of the Barium Strontium Titanate Zirconium Thin Film by RF Sputtering
|
Chen, Kai-Huang |
|
2004 |
61 |
1 |
p. 129-132 |
artikel |
6 |
Dielectric Properties of Na0.5Bi0.5TiO3 - BaTiO3 Ceramics
|
Gomah-Pettry, J. R. |
|
2004 |
61 |
1 |
p. 155-158 |
artikel |
7 |
Dielectric Properties of Spark Plasma Sintered (SPS) Barium Strontium Titanate (BST) Ceramics
|
Su, B. |
|
2004 |
61 |
1 |
p. 117-122 |
artikel |
8 |
Disorder in BaTiO3 and Ti EFG Tensors
|
Blinc, R. |
|
2004 |
61 |
1 |
p. 255-260 |
artikel |
9 |
Effects of Thermal Stabilities for the Ultra Thin Chromium Layers Applied on (Ba, Sr)TiO3 Thin Films
|
Kuo, Meng-Wei |
|
2004 |
61 |
1 |
p. 183-187 |
artikel |
10 |
Electrical Properties of Na0.5Bi0.5TiO3 - SrTiO3 Ceramics
|
Gomah-Pettry, J. R. |
|
2004 |
61 |
1 |
p. 159-162 |
artikel |
11 |
Epitaxial Lead Zirconate Titanate Nanocrystals Obtained by a Self-Patterning Method
|
Szafraniak, I. |
|
2004 |
61 |
1 |
p. 231-238 |
artikel |
12 |
Fabrication and Properties of Silicon-Based PLZT Thin Films for MFSFET Applications
|
Shao, Tian-Qi |
|
2004 |
61 |
1 |
p. 189-195 |
artikel |
13 |
Failure Analysis of FeCAPs. Electrical Behaviour Under Synchrotron X-Ray Irradiation
|
Menou, N. |
|
2004 |
61 |
1 |
p. 89-95 |
artikel |
14 |
Ferroelectric Bi4-x Smx Ti3 O12 Thin Films Fabricated by Pulsed Laser Deposition for Nv-RAM Applications
|
Hu, X. B. |
|
2004 |
61 |
1 |
p. 123-127 |
artikel |
15 |
Ferroelectric Non-Volatile Logic Devices
|
Takasu, Hidemi |
|
2004 |
61 |
1 |
p. 83-88 |
artikel |
16 |
Ferroelectric Properties of Mo-Doped Bi4-XLaXTi3O12 Films
|
Ohki, Hiroshi |
|
2004 |
61 |
1 |
p. 37-42 |
artikel |
17 |
FIB Milled PZT Nanocapacitors Tested Using PFM
|
Marshall, J. M. |
|
2004 |
61 |
1 |
p. 223-230 |
artikel |
18 |
Frequency Dependence of Microwave Quality Factor of Doped BaxSr1 - xTiO3 Ferroelectric Ceramics
|
Karmanenko, S. F. |
|
2004 |
61 |
1 |
p. 177-181 |
artikel |
19 |
Frequency Dependence of Polarization Hysteresis Loop in CaBi4 Ti4 O14 Ferroelectric Thin Films
|
Fu, Desheng |
|
2004 |
61 |
1 |
p. 19-23 |
artikel |
20 |
Fundamental Study on Ferroelectric Data Storage with the Density Above 1 Tbit/inch2 Using Congruent Lithium Tantalate
|
Cho, Yasuo |
|
2004 |
61 |
1 |
p. 77-81 |
artikel |
21 |
Growth, Microwave Properties and Microstructure of Ba0.05Sr0.95TiO3 Thin Films
|
Koutsonas, I. |
|
2004 |
61 |
1 |
p. 139-142 |
artikel |
22 |
High Frequency Thick Film BST Ferroelectric Phase Shifter
|
Yeo, K. S. K. |
|
2004 |
61 |
1 |
p. 65-70 |
artikel |
23 |
Influence of Electron Irradiation on the Properties of Ferroelectric BaxSr1-xTiO3 Films
|
Pavlovskaja, M. V. |
|
2004 |
61 |
1 |
p. 149-153 |
artikel |
24 |
Inhomogeneous Local Conductivity Induced by Thermal Reduction in BaTiO3 Thin Films and Single Crystals
|
Reichenberg, B. |
|
2004 |
61 |
1 |
p. 43-49 |
artikel |
25 |
Investigation of Ferroelectricity in Ultrathin PbTiO3 Films
|
Lichtensteiger, C. |
|
2004 |
61 |
1 |
p. 143-148 |
artikel |
26 |
Lead Zirconate Titanate Film Formation Technology with Use of Spray Coating Method
|
Ichiki, Masaaki |
|
2004 |
61 |
1 |
p. 167-172 |
artikel |
27 |
Nano-Phased Crystallisation of Ferroelectrics from Glasses in the K2O-TiO2-P2O5 and K2O-Nb2O5-SiO2 Systems
|
Sigaev, V. N. |
|
2004 |
61 |
1 |
p. 249-253 |
artikel |
28 |
On-Wafer Measurements of Tuneability in Ba0.5Sr0.5TiO3 Thin Films
|
Suherman, P. M. |
|
2004 |
61 |
1 |
p. 133-137 |
artikel |
29 |
P-E Measurements for Ferroelectric Gate Capacitors
|
Yoshimura, Takeshi |
|
2004 |
61 |
1 |
p. 59-64 |
artikel |
30 |
Preparation and Characterizations of High-K (Ca, Sr)ZrO3 Gate Dielectric Thin Films by Sol-Gel Technology
|
Zhu, W. |
|
2004 |
61 |
1 |
p. 25-35 |
artikel |
31 |
Processing of Chemical Solution Deposited Ca-Modified PbTiO3 Films for High Frequency Components and Dynamic Random Access Memories
|
Bretos, I. |
|
2004 |
61 |
1 |
p. 105-110 |
artikel |
32 |
Progressive Loss of Ferroelectricity Under Bipolar Pulsed Fields and Experimental Determination of Non-Switchable Polarization in Au/Ba0.5Sr0.5-TiO3/SrRuO3 Thin-Film Capacitors
|
Jiang, A. Q. |
|
2004 |
61 |
1 |
p. 111-115 |
artikel |
33 |
Pyroelectric Thin Films Integrated with CCD
|
Sigov, Alexander |
|
2004 |
61 |
1 |
p. 197-204 |
artikel |
34 |
Reactive Ion Etching and Ion Beam Etching for Ferroelectric Memories
|
Shao, Tian-Qi |
|
2004 |
61 |
1 |
p. 213-220 |
artikel |
35 |
The Dielectric Properties of Ultrafine-Grained BaTi1 - xZrxO3 Based Ceramics Prepared by a Novel Two-Step Sintering Method
|
Wang, Xiaohui |
|
2004 |
61 |
1 |
p. 173-176 |
artikel |
36 |
Thin Film Capacitor Cut from Single Crystals Using Focused Ion Beam Milling
|
Saad, M. M. |
|
2004 |
61 |
1 |
p. 239-248 |
artikel |
37 |
Thin Films of Na0.5Bi0.5TiO3 Deposited by Spin-Coating
|
Mercurio, J. P. |
|
2004 |
61 |
1 |
p. 163-165 |
artikel |
38 |
Understanding Thickness Effects in Thin Film Capacitors
|
Lookman, A. |
|
2004 |
61 |
1 |
p. 51-58 |
artikel |