nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
AC and DC conductivity studies in pulsed laser ablated (Ba, Sr)TiO3 thin films
|
Saha, S. |
|
2001 |
33 |
1-4 |
p. 353-361 |
artikel |
2 |
An improvement of retention property by using surface treatment in SOL-GEL derived PZT films
|
Kim, H. H. |
|
2001 |
33 |
1-4 |
p. 9-18 |
artikel |
3 |
Characterization of SrBi2Ta2O9 films prepared by metalorganic decomposition using rapid thermal annealing
|
Ling, Huiqin |
|
2001 |
33 |
1-4 |
p. 253-259 |
artikel |
4 |
DC field induced antiferroelectric phase transition in bulk, single crystal strontium titanate
|
Gevorgian, S. |
|
2001 |
33 |
1-4 |
p. 323-329 |
artikel |
5 |
Deposition of high dielectric (Ba, Sr)TiO3 thin films by rf magnetron co-sputtering
|
Jaing, Cheng-Chung |
|
2001 |
33 |
1-4 |
p. 343-352 |
artikel |
6 |
Development of micromechanical and optical devices incorporating deposited PZT films
|
Wright, Robert V. |
|
2001 |
33 |
1-4 |
p. 209-220 |
artikel |
7 |
Dielectric nonlinearity of the PBB'B''O3 ferroelectric solid solutions
|
Dambekalne, Maruta |
|
2001 |
33 |
1-4 |
p. 101-108 |
artikel |
8 |
Dielectric response and complex impedance spectroscopy studies in pulsed laser ablated (Ba, Sr)TiO3 thin films
|
Saha, S. |
|
2001 |
33 |
1-4 |
p. 331-342 |
artikel |
9 |
Driving applications for ferroelectric NVMS
|
Zambrano, Raffaele |
|
2001 |
33 |
1-4 |
p. 1-8 |
artikel |
10 |
Effect of NO(Si3N4/SiO2) layers on the electrical properties of mfisfet using SBT (SrBi2Ta2O9) materials
|
You, In-Kyu |
|
2001 |
33 |
1-4 |
p. 177-184 |
artikel |
11 |
Effects of interface state on electrcal properties of SBT thin films
|
Choi, Gwang-Pyo |
|
2001 |
33 |
1-4 |
p. 165-176 |
artikel |
12 |
Electrical properties of MOCVD BST thin films annealed by rapid thermal annealing process
|
Kil, Deok-sin |
|
2001 |
33 |
1-4 |
p. 291-301 |
artikel |
13 |
Electrical properties of Pb1-xLax(ZryTi1-y)1-x/4O3 thin films with various iridium-based top electrodes
|
Yoon, Soon-Gil |
|
2001 |
33 |
1-4 |
p. 155-164 |
artikel |
14 |
Fabrication of PZT films on SI substrates by SOL-GEL method using Y2O3 buffer layers
|
Park, Byung-Eun |
|
2001 |
33 |
1-4 |
p. 109-116 |
artikel |
15 |
Ferroelectric properties of epitaxial barium titanate thin film capacitors on silicon substrate
|
Abe, Kazuhide |
|
2001 |
33 |
1-4 |
p. 281-290 |
artikel |
16 |
Ferroelectric properties of SOL-GEL derived thin solid film of barium titanate on ITO-glass
|
Han, X. Q. |
|
2001 |
33 |
1-4 |
p. 221-226 |
artikel |
17 |
Fully MOCVD obtained epitaxial ferroelectric capacitors
|
Novojilov, Mikhail A. |
|
2001 |
33 |
1-4 |
p. 79-89 |
artikel |
18 |
Guest editorial
|
Waser, Rainer |
|
2001 |
33 |
1-4 |
p. 9-10 |
artikel |
19 |
High temperature conductivity behavior of doped SrTiO3 thin films
|
Ohly, Christian |
|
2001 |
33 |
1-4 |
p. 363-372 |
artikel |
20 |
Improvement of process stability for PZT thin films formation by using modified SOL-GEL solutions
|
Soyama, Nobuyuki |
|
2001 |
33 |
1-4 |
p. 227-234 |
artikel |
21 |
Kinetics of fatigue effect
|
Shur, V. Ya. |
|
2001 |
33 |
1-4 |
p. 117-132 |
artikel |
22 |
Microstructure and electrical properties of epitaxial SrBi2Nb2O9 And SrBi2Ta2O9 films
|
Zurbuchen, Mark A. |
|
2001 |
33 |
1-4 |
p. 27-37 |
artikel |
23 |
Net spontaneous polarisation in as-grown SBT films
|
Jimenez, R. |
|
2001 |
33 |
1-4 |
p. 49-57 |
artikel |
24 |
Optical properties of potassium lithium niobate films
|
Zhang, H. X. |
|
2001 |
33 |
1-4 |
p. 71-78 |
artikel |
25 |
Physical insights on imprint and application to functional memory with ferroelectric materials
|
Fujii, Y. |
|
2001 |
33 |
1-4 |
p. 261-270 |
artikel |
26 |
Polarization switching of SrBi2Ta2O9 thin films prepared by MOD method
|
Chen, Xiaobing |
|
2001 |
33 |
1-4 |
p. 145-153 |
artikel |
27 |
Preparation of antiferroelectric PZT thin films on bare and on RuO2 coated steel substrates
|
Seveno, R. |
|
2001 |
33 |
1-4 |
p. 185-197 |
artikel |
28 |
Relationship between PB content, crystallographic texture and ferroelectric properties of plzt thin films for FRAMĀ® applications
|
Chu, Fan |
|
2001 |
33 |
1-4 |
p. 19-26 |
artikel |
29 |
Relaxation effects and steady-state conduction in non-stoichiometric SBT films
|
Bachhofer, Harald |
|
2001 |
33 |
1-4 |
p. 245-252 |
artikel |
30 |
Relaxation mechanisms in ferroelectric thin film capacitors for feram application
|
Lohse, O. |
|
2001 |
33 |
1-4 |
p. 39-48 |
artikel |
31 |
Residual strain analysis of epitaxial grown SBT thin films prepared by MOCVD
|
Saito, Keisuke |
|
2001 |
33 |
1-4 |
p. 59-69 |
artikel |
32 |
Retention behavior of ferroelectric memory devices depending on the capacitor processes
|
Kim, Jeong |
|
2001 |
33 |
1-4 |
p. 133-143 |
artikel |
33 |
Segregation phenomena in thin films of BaTiO3
|
Szot, K. |
|
2001 |
33 |
1-4 |
p. 303-310 |
artikel |
34 |
Strain induced ferroelectrosity in epitaxial SrTiO3 films
|
Gevorgian, S. |
|
2001 |
33 |
1-4 |
p. 311-321 |
artikel |
35 |
Structural and dielectric properties of BaTiO3SrTiO3-multilayers deposited by PLD
|
Koebernik, G. |
|
2001 |
33 |
1-4 |
p. 373-378 |
artikel |
36 |
The post annealing effects on ferroelectric properties of SrBi2Ta2O9 thin films prepared by R.F. magnetron sputtering
|
Park, Sang-Shik |
|
2001 |
33 |
1-4 |
p. 199-208 |
artikel |
37 |
The reliability properties of MOCVD PZT thin films on multilayer PT/IR electrodes
|
Li, Tingkai |
|
2001 |
33 |
1-4 |
p. 91-99 |
artikel |
38 |
The resistance degradation of (Ba0.5Sr0.5)TiO3 thin films
|
Yan, F. |
|
2001 |
33 |
1-4 |
p. 379-388 |
artikel |
39 |
Thickness dependence of the ferroelectric characteristics of SBT and SBTN thin films
|
Park, Joo Dong |
|
2001 |
33 |
1-4 |
p. 235-244 |
artikel |
40 |
Thickness effects on the physical properties in ferroelectric thin films
|
Zhu, Jinsong |
|
2001 |
33 |
1-4 |
p. 271-279 |
artikel |