| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A critical comparative review of PZT and SBT - based science and technology for non-volatile ferroelectric memories
|
Auciello, Orlando
|
|
1997
|
15 |
1-4 |
p. 211-220
|
artikel
|
| 2 |
A model for optical and electrical polarization fatigue in srbi2ta2o9 and Pb(Zr,Ti)o3
|
Al-shareef, H. N.
|
|
1997
|
15 |
1-4 |
p. 53-67
|
artikel
|
| 3 |
Bismuth based layered perovskite thin films as a charge storage material for low power nonvolatile gaas memory applications
|
Melnick, B. M.
|
|
1997
|
15 |
1-4 |
p. 221-233
|
artikel
|
| 4 |
Characteristics of srbi2ta2o9 thin films fabricated by the r. f. magnetron sputtering technique
|
Lee, Eon Kook
|
|
1997
|
15 |
1-4 |
p. 115-125
|
artikel
|
| 5 |
Characterization of Pb(Zr,Ti)O3 thin films by MOCVD using the total reflection X-ray diffraction method
|
Fujisawa, Hironori
|
|
1997
|
15 |
1-4 |
p. 1-8
|
artikel
|
| 6 |
Dielectric analysis of intergrated ceramic thin film capacitors
|
Waser, Rainer
|
|
1997
|
15 |
1-4 |
p. 39-51
|
artikel
|
| 7 |
Dielectric breakdown strength in sol-gel derived PZT thick films
|
Chen, H. Daniel
|
|
1997
|
15 |
1-4 |
p. 89-98
|
artikel
|
| 8 |
Dielectric properties of srtio3 thin films with ca and zr partial substitutions for active microwave applications
|
Knauss, L. A.
|
|
1997
|
15 |
1-4 |
p. 173-180
|
artikel
|
| 9 |
Electrical properties of ferroelectric-capacitor-gate si mos transistors using p(l)zt films
|
Tokumitsu, Eisuke
|
|
1997
|
15 |
1-4 |
p. 137-144
|
artikel
|
| 10 |
Elucidation of the switching processes in tetragonal pzt by hysteresis loop and impedance analysis
|
Wouters, Dirk J.
|
|
1997
|
15 |
1-4 |
p. 79-87
|
artikel
|
| 11 |
Fabrication and characterization of ferroelectric composite ceramics
|
Sengupta, L. C.
|
|
1997
|
15 |
1-4 |
p. 181-190
|
artikel
|
| 12 |
Fabrication and characterization of metal-ferroelectrics-semiconductor field effect transistors using epitaxial bamgf4 films grown on si(111) substrates
|
Aizawa, Koji
|
|
1997
|
15 |
1-4 |
p. 245-252
|
artikel
|
| 13 |
Fabrication process of pzt piezoelectric cantilever unimorphs using surface micromachining
|
Kim, Joon Han
|
|
1997
|
15 |
1-4 |
p. 325-332
|
artikel
|
| 14 |
Growth and characterization of thin film dielectrics for microwave applications
|
O'bryan, H. M.
|
|
1997
|
15 |
1-4 |
p. 155-162
|
artikel
|
| 15 |
Guest editorial
|
Dey, Sandwip K.
|
|
1997
|
15 |
1-4 |
p. 7-8
|
artikel
|
| 16 |
High frequency electrical characterization of bst capacitors
|
Jammy, Rajmo
|
|
1997
|
15 |
1-4 |
p. 235-243
|
artikel
|
| 17 |
Imprint induced failure modes in ferroelectric non-volatile memories
|
Benedetto, J. M.
|
|
1997
|
15 |
1-4 |
p. 29-38
|
artikel
|
| 18 |
Infared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films
|
Webb, J. D.
|
|
1997
|
15 |
1-4 |
p. 9-18
|
artikel
|
| 19 |
Integrated ferroelectric monomorph transducers for acoustic imaging
|
Bernstein, J.
|
|
1997
|
15 |
1-4 |
p. 289-307
|
artikel
|
| 20 |
Nucleation and orientation of sol-gel pzt-films on pt electrodes
|
Willems, G. J.
|
|
1997
|
15 |
1-4 |
p. 19-28
|
artikel
|
| 21 |
Optical waveguide losses of pzt thin films with various zr/ti stoichiometries
|
Teowee, G.
|
|
1997
|
15 |
1-4 |
p. 281-288
|
artikel
|
| 22 |
Paraelectric thin films for microwave applications
|
Findikoglu, A. T.
|
|
1997
|
15 |
1-4 |
p. 163-171
|
artikel
|
| 23 |
Performance of srbi2ta2o9 for low-voltage, non-volatile memory applications
|
Jones, Robert E.
|
|
1997
|
15 |
1-4 |
p. 199-210
|
artikel
|
| 24 |
Piezoelectric and dielectric aging in pb(zr,ti)o3 thin films and bulk ceramics
|
Kholkin, A. L.
|
|
1997
|
15 |
1-4 |
p. 317-324
|
artikel
|
| 25 |
Potassium tantalate niobate thin films for spaceborne pyroelectric detectors
|
Cherry, H. B.
|
|
1997
|
15 |
1-4 |
p. 261-269
|
artikel
|
| 26 |
Processing and dielectric properties of sol-gel derived bst thin films
|
Tahan, Danielle M.
|
|
1997
|
15 |
1-4 |
p. 99-106
|
artikel
|
| 27 |
Properties of pbtio3, La-modified pbtio3 and Pb(Zr,Ti)O3 thin films and their application to infrared detectors
|
Ren, Wei
|
|
1997
|
15 |
1-4 |
p. 271-279
|
artikel
|
| 28 |
Reliability study on bst capacitors for gaas mmic
|
Noma, Atsushi
|
|
1997
|
15 |
1-4 |
p. 69-78
|
artikel
|
| 29 |
Scanning force microscopy study of domain structure in pb (zrxti1-x)o3 thin films and pt/pzt/pt and ruo2/pzt/ruo2 capacitors
|
Auciello, Orlando
|
|
1997
|
15 |
1-4 |
p. 107-114
|
artikel
|
| 30 |
Self-assembling patterns in ferroelectrics a new diagnostic tool for memory materials
|
Scott, J. F.
|
|
1997
|
15 |
1-4 |
p. 253-260
|
artikel
|
| 31 |
Sr content dependence of ferroelectric properties in srbi2ta2o9 thin films
|
Hase, Takashi
|
|
1997
|
15 |
1-4 |
p. 127-135
|
artikel
|
| 32 |
Srgeo3-srtio3 perovskites: high-pressure synthesis, structure, and dielectric properties
|
Grzechnik, Andrzej
|
|
1997
|
15 |
1-4 |
p. 191-198
|
artikel
|
| 33 |
Statistical investigation of dielectric breakdown of strontium bismuth tantalate thin film capacitors
|
Finder, J.
|
|
1997
|
15 |
1-4 |
p. 145-154
|
artikel
|
| 34 |
Thin film characterization by acoustic microscopy
|
Kundu, Tribmram
|
|
1997
|
15 |
1-4 |
p. 309-316
|
artikel
|
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