| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accuracies of experimental structure factor values
|
Miyake, S.
|
|
1969
|
25 |
1 |
p. 257-264
|
artikel
|
| 2 |
Accuracy of intensity measurements from large single crystals
|
Brogren, G.
|
|
1969
|
25 |
1 |
p. 111-116
|
artikel
|
| 3 |
Addition of higher cumulants to the crystallographic structure-factor equation: a generalized treatment for thermal-motion effects
|
Johnson, C. K.
|
|
1969
|
25 |
1 |
p. 187-194
|
artikel
|
| 4 |
An accurate absolute scattering factor for silicon
|
Hart, M.
|
|
1969
|
25 |
1 |
p. 134-138
|
artikel
|
| 5 |
Assessment of accuracy in powder intensity measurement
|
Inkinen, O.
|
|
1969
|
25 |
1 |
p. 214-217
|
artikel
|
| 6 |
Charge density and momentum density – a comparison between theory and experiment
|
Weiss, R. J.
|
|
1969
|
25 |
1 |
p. 248-257
|
artikel
|
| 7 |
Comparison of X-ray and neutron diffraction structural results: a study in methods of error analysis
|
Hamilton, W. C.
|
|
1969
|
25 |
1 |
p. 194-206
|
artikel
|
| 8 |
Conversion of relative intensities to an absolute scale
|
Chipman, D. R.
|
|
1969
|
25 |
1 |
p. 209-214
|
artikel
|
| 9 |
Current status of the IUCr powder intensity project
|
Jennings, L. D.
|
|
1969
|
25 |
1 |
p. 217-222
|
artikel
|
| 10 |
Debye–Waller factor and anomalous absorption (Ge: 293–5°K)
|
Ludewig, J.
|
|
1969
|
25 |
1 |
p. 116-118
|
artikel
|
| 11 |
Determination of the atom form factor by high-voltage electron diffraction
|
Watanabe, D.
|
|
1969
|
25 |
1 |
p. 138-140
|
artikel
|
| 12 |
Electronic and mechanical sources of error in diffractometry
|
Hoppe, W.
|
|
1969
|
25 |
1 |
p. 67-76
|
artikel
|
| 13 |
Error evaluation versus `on line' correction
|
Furnas, T. C.
|
|
1969
|
25 |
1 |
p. 76-81
|
artikel
|
| 14 |
Errors in the calculated structure factors caused by the free-atom form factor model
|
Coppens, P.
|
|
1969
|
25 |
1 |
p. 180-186
|
artikel
|
| 15 |
Estimates of X-ray attenuation coefficients for the elements and their compounds
|
Deslattes, R. D.
|
|
1969
|
25 |
1 |
p. 89-93
|
artikel
|
| 16 |
Experimental absorption correction: results
|
Huber, R.
|
|
1969
|
25 |
1 |
p. 143-152
|
artikel
|
| 17 |
Experimental determination of the extinction factor by the use of polarized X-rays
|
Chandrasekhar, S.
|
|
1969
|
25 |
1 |
p. 140-142
|
artikel
|
| 18 |
Focusing monochromators
|
Witz, J.
|
|
1969
|
25 |
1 |
p. 30-42
|
artikel
|
| 19 |
Indicators of accuracy in structure factor measurement
|
Abrahams, S. C.
|
|
1969
|
25 |
1 |
p. 165-173
|
artikel
|
| 20 |
Instruments and techniques required for accurate relative intensities from powder specimens
|
de Wolff, P. M.
|
|
1969
|
25 |
1 |
p. 206-209
|
artikel
|
| 21 |
International Meeting on Accurate Determination of X-ray Intensities and Structure Factors, concluding remarks
|
Zachariasen, W. H.
|
|
1969
|
25 |
1 |
p. 276
|
artikel
|
| 22 |
Introduction to the dynamical theory of X-ray diffraction
|
Ewald, P. P.
|
|
1969
|
25 |
1 |
p. 103-108
|
artikel
|
| 23 |
Measurements of intensities from X-ray photographs
|
Abrahamsson, S.
|
|
1969
|
25 |
1 |
p. 158-161
|
artikel
|
| 24 |
Present problems and future opportunities in precise intensity measurements with single-crystal X-ray diffractometers
|
Young, R. A.
|
|
1969
|
25 |
1 |
p. 55-66
|
artikel
|
| 25 |
Profile analysis in single-crystal diffractometry
|
Diamond, R.
|
|
1969
|
25 |
1 |
p. 43-55
|
artikel
|
| 26 |
Rapid parallel measurement of X-ray reflexions from macromolecular crystals
|
Arndt, U. W.
|
|
1969
|
25 |
1 |
p. 161-164
|
artikel
|
| 27 |
Real crystals as a source of error
|
Milledge, H. J.
|
|
1969
|
25 |
1 |
p. 173-180
|
artikel
|
| 28 |
Survey of results for ionic crystals and metallic oxides, carbides and nitrates
|
Hosoya, S.
|
|
1969
|
25 |
1 |
p. 243-248
|
artikel
|
| 29 |
Survey of results in the determination of X-ray intensities and structure factors for metals, alloys and covalent compounds
|
Sirota, N. N.
|
|
1969
|
25 |
1 |
p. 223-243
|
artikel
|
| 30 |
The correction of measured structure factors for thermal diffuse scattering
|
Cochran, W.
|
|
1969
|
25 |
1 |
p. 95-101
|
artikel
|
| 31 |
The determination of structure factors by means of intensity measurements from large single crystals
|
Batterman, B. W.
|
|
1969
|
25 |
1 |
p. 109-110
|
artikel
|
| 32 |
The determination of structure factors by means of Pendellösung fringes
|
Kato, N.
|
|
1969
|
25 |
1 |
p. 119-128
|
artikel
|
| 33 |
The determination of structure factors from dynamical effects in electron diffraction
|
Cowley, J. M.
|
|
1969
|
25 |
1 |
p. 129-134
|
artikel
|
| 34 |
The early history of intensity measurements
|
Bragg, W. L.
|
|
1969
|
25 |
1 |
p. 1-3
|
artikel
|
| 35 |
The geometry of integrated intensity measurement and errors due to non-monochromatic radiation
|
Kheiker, D. M.
|
|
1969
|
25 |
1 |
p. 82-88
|
artikel
|
| 36 |
The intensities of multiple diffraction effects
|
Post, B.
|
|
1969
|
25 |
1 |
p. 94-95
|
artikel
|
| 37 |
The intensity of reflexion of X-rays by crystals
|
Bragg, W. H.
|
|
1969
|
25 |
1 |
p. 3-11
|
artikel
|
| 38 |
Theoretical corrections for extinction
|
Zachariasen, W. H.
|
|
1969
|
25 |
1 |
p. 102
|
artikel
|
| 39 |
The role of intensity measurement projects
|
McL Mathieson, A.
|
|
1969
|
25 |
1 |
p. 264-275
|
artikel
|
| 40 |
The significance of accurate structure factors
|
Dawson, B.
|
|
1969
|
25 |
1 |
p. 12-29
|
artikel
|
| 41 |
Welcome to participants, International Meeting on Accurate Determination of X-ray Intensities and Structure Factors
|
Belov, N. V.
|
|
1969
|
25 |
1 |
p. 1
|
artikel
|
| 42 |
X-ray photography as a means of accurate intensity measurement
|
Jeffery, J. W.
|
|
1969
|
25 |
1 |
p. 153-157
|
artikel
|
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