| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Adaptive Silicon Monochromators for High-Power Insertion Devices. Tests at CHESS, ESRF and HASYLAB
|
Quintana, J. P.
|
|
1995
|
2 |
1 |
p. 1-5
|
article
|
| 2 |
Evaluation of Reflection Intensities for the Components of Multiple Laue Diffraction Spots. III. Using a Real-Space Density Modification Method
|
Hao, Q.
|
|
1995
|
2 |
1 |
p. 27-30
|
article
|
| 3 |
Fixed-Exit Monochromators for High-Energy Synchrotron Radiation
|
Suortti, P.
|
|
1995
|
2 |
1 |
p. 6-12
|
article
|
| 4 |
Image-Plate Synchrotron Laue Data Collection and Subsequent Structural Analysis of a Small Test Crystal of a Nickel-Containing Aluminophosphate
|
Snell, E.
|
|
1995
|
2 |
1 |
p. 22-26
|
article
|
| 5 |
Imaging Plates for Use with Synchrotron Radiation
|
Amemiya, Y.
|
|
1995
|
2 |
1 |
p. 13-21
|
article
|
| 6 |
Interpretation of EXAFS Data
|
Gurman, S. J.
|
|
1995
|
2 |
1 |
p. 56-63
|
article
|
| 7 |
New Commercial Products
|
|
|
1995
|
2 |
1 |
p. 76
|
article
|
| 8 |
Notes for Authors
|
|
|
1995
|
2 |
1 |
p. 70-74
|
article
|
| 9 |
Polarized Dispersion for X-rays Scattered by an Aromatic Bromide
|
Templeton, L. K.
|
|
1995
|
2 |
1 |
p. 31-35
|
article
|
| 10 |
Quick Fluorescence-EXAFS: an Improved Method for Collection of Conventional XAFS Data, an Improved Method for Collection of Conventional XAFS Data and for Studying Reaction Intermediates in Dilute Systems
|
Murphy, L. M.
|
|
1995
|
2 |
1 |
p. 64-69
|
article
|
| 11 |
Rapid Mapping of Texture in Polycrystalline Materials Using an Imaging Plate on a Synchrotron Radiation Source
|
Kawasaki, K.
|
|
1995
|
2 |
1 |
p. 49-55
|
article
|
| 12 |
The Multiwavelength Anomalous Solvent Contrast (MASC) Method in Macromolecular Crystallography
|
Fourme, R.
|
|
1995
|
2 |
1 |
p. 36-48
|
article
|
Journal description