nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A finite group that derives all the 14 Bravais lattices as its subgroups
|
Hosoya, Masahiko |
|
2000 |
56 |
3 |
p. 259-263 |
artikel |
2 |
Discrete Fourier transform in arbitrary dimensions by a generalized Beevers–Lipson algorithm
|
Schneider, Martin |
|
2000 |
56 |
3 |
p. 248-251 |
artikel |
3 |
Enantiomorph determination using inverse reference-beam diffraction images
|
Shen, Qun |
|
2000 |
56 |
3 |
p. 264-267 |
artikel |
4 |
Evaluation of net atomic charges and atomic and molecular electrostatic moments through topological analysis of the experimental charge density
|
Volkov, Anatoliy |
|
2000 |
56 |
3 |
p. 252-258 |
artikel |
5 |
Expansion of scalar validation criteria to three dimensions: the R tensor. Erratum
|
Parkin, Sean |
|
2000 |
56 |
3 |
p. 317 |
artikel |
6 |
On the extrapolation of the magnitudes |E| of the normalized structure factors E
|
Xu, Hongliang |
|
2000 |
56 |
3 |
p. 284-287 |
artikel |
7 |
Reconstruction of the projected crystal potential in transmission electron microscopy by means of a maximum-likelihood refinement algorithm
|
Lentzen, M. |
|
2000 |
56 |
3 |
p. 235-247 |
artikel |
8 |
Shake-and-Bake applications using simulated reference-beam data for crambin
|
Weeks, Charles M. |
|
2000 |
56 |
3 |
p. 280-283 |
artikel |
9 |
Statistical dynamical theory of X-ray diffraction in the Bragg case: application to triple-crystal diffractometry
|
Pavlov, Konstantin M. |
|
2000 |
56 |
3 |
p. 227-234 |
artikel |
10 |
Systematic intensity errors and model imperfection as the consequence of spectral truncation
|
Rousseau, Bart |
|
2000 |
56 |
3 |
p. 300-307 |
artikel |
11 |
The NaCl- to CsCl-type phase transition discussed on the basis of the cP to cI deformation with the symmetry Cmcm 4(c) m2m
|
Sowa, H. |
|
2000 |
56 |
3 |
p. 288-299 |
artikel |
12 |
The weak hydrogen bond in structural chemistry and biology. By Gautam R. Desiraju and Thomas Steiner. IUCr Monographs on Crystallography, Vol. 9. Oxford: Oxford University Press/International Union of Crystallography, 1999, pp. xiv + 507. Price £85.00. ISBN 0-19-850252-4.
|
|
|
2000 |
56 |
3 |
p. 318 |
artikel |
13 |
Triplet-phase measurements using reference-beam X-ray diffraction
|
Shen, Qun |
|
2000 |
56 |
3 |
p. 268-279 |
artikel |
14 |
X-ray dynamical diffraction: the concept of a locally plane wave
|
Mocella, V. |
|
2000 |
56 |
3 |
p. 308-316 |
artikel |