| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A full-symmetry translation function. II. The introduction of positioned fragments
|
Rius, J.
|
|
1988
|
44 |
1 |
p. 79-81
|
artikel
|
| 2 |
A lattice-dynamical comparison of nonbonded potential parameters for hydrocarbons
|
Criado, A.
|
|
1988
|
44 |
1 |
p. 76-79
|
artikel
|
| 3 |
Application of the molecular replacement method to multidomain proteins. 1. Determination of the orientation of an immunoglobulin Fab fragment
|
Cygler, M.
|
|
1988
|
44 |
1 |
p. 38-45
|
artikel
|
| 4 |
A rigorous treatment of the asymptotic development of the probability density of a structure factor in P
|
Brosius, J.
|
|
1988
|
44 |
1 |
p. 14-17
|
artikel
|
| 5 |
Atomic physics, 10 edited by H. Narumi and I. Shimamura
|
|
|
1988
|
44 |
1 |
p. 104
|
artikel
|
| 6 |
Carrier scattering in metals and semiconductors by V. F. Gantmakher and Y. B. Levinson
|
|
|
1988
|
44 |
1 |
p. 104
|
artikel
|
| 7 |
Electron diffraction patterns of chrysotile: effect of specimen orientation
|
Chisholm, J. E.
|
|
1988
|
44 |
1 |
p. 70-76
|
artikel
|
| 8 |
Errors arising from numerical use of the Mott formula in electron image simulation
|
Peng, L.-M.
|
|
1988
|
44 |
1 |
p. 1-6
|
artikel
|
| 9 |
Image processing in high-resolution electron microscopy using the direct method. III. Structure-factor extrapolation
|
Liu, Yi-we
|
|
1988
|
44 |
1 |
p. 61-63
|
artikel
|
| 10 |
Multiple scattering and the 200 reflection in silicon and germanium
|
Tischler, J. Z.
|
|
1988
|
44 |
1 |
p. 22-25
|
artikel
|
| 11 |
Multiple scattering theory for fast electrons in single crystals and Kikuchi patterns
|
Dudarev, S. L.
|
|
1988
|
44 |
1 |
p. 51-61
|
artikel
|
| 12 |
Normalization factors for spherical harmonic density functions
|
Paturle, A.
|
|
1988
|
44 |
1 |
p. 6-8
|
artikel
|
| 13 |
On integrating the techniques of direct methods and isomorphous replacement. A new probabilistic formula for triplet invariants
|
Giacovazzo, C.
|
|
1988
|
44 |
1 |
p. 45-51
|
artikel
|
| 14 |
On the X-ray analysis of thin subsurface layers. Bicrystal diffraction analogues
|
Afanas'ev, A. M.
|
|
1988
|
44 |
1 |
p. 25-33
|
artikel
|
| 15 |
Phase determination using high-order multiple diffraction of X-rays
|
Chang, S.-L.
|
|
1988
|
44 |
1 |
p. 63-70
|
artikel
|
| 16 |
Phase observation in an organic crystal (benzil: C14H10O2) using long-wavelength X-rays
|
Shen, Q.
|
|
1988
|
44 |
1 |
p. 17-22
|
artikel
|
| 17 |
Photons: theory and experiments II by P. Brüesch
|
Dolling, G.
|
|
1988
|
44 |
1 |
p. 104
|
artikel
|
| 18 |
Report of the Executive Committee for 1986
|
|
|
1988
|
44 |
1 |
p. 81-104
|
artikel
|
| 19 |
The statistical significance of difference densities
|
Maslen, E. N.
|
|
1988
|
44 |
1 |
p. 33-38
|
artikel
|
| 20 |
X-ray topography of bent crystals
|
Chukhovskii, F. N.
|
|
1988
|
44 |
1 |
p. 8-14
|
artikel
|
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