nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A general computer program for the analysis of X-ray diffraction data for liquids
|
Licheri, G. |
|
1975 |
8 |
1 |
p. 73-75 |
artikel |
2 |
A miniature goniometer head
|
Atoji, M. |
|
1975 |
8 |
1 |
p. 75 |
artikel |
3 |
An Introduction to X-ray spectrometry by R. Jenkins
|
Cox, G. A. |
|
1975 |
8 |
1 |
p. 77 |
artikel |
4 |
Applied mineralogy. Vol. 5. Apatite by D. McConnell
|
Pautard, F. G. E. |
|
1975 |
8 |
1 |
p. 77-78 |
artikel |
5 |
A silicon powder diffraction standard reference material
|
Hubbard, C. R. |
|
1975 |
8 |
1 |
p. 45-48 |
artikel |
6 |
Automatic collection of powder data from photographs
|
Sonneveld, E. J. |
|
1975 |
8 |
1 |
p. 1-7 |
artikel |
7 |
Computer simulation of X-ray topographs of stacking faults in silicon
|
Wonsiewicz, B. C. |
|
1975 |
8 |
1 |
p. 67-68 |
artikel |
8 |
Crystal data for C.I. pigment Red 6, 4-chloro-2-nitrophenylazo-2-naphthol
|
Whitaker, A. |
|
1975 |
8 |
1 |
p. 69-70 |
artikel |
9 |
Crystal data for Mn5Si2
|
Sénateur, J. P. |
|
1975 |
8 |
1 |
p. 70-73 |
artikel |
10 |
Crystallographers
|
|
|
1975 |
8 |
1 |
p. 75 |
artikel |
11 |
Diffusion and defect data edited by F. H. Wöhlbier
|
Lowe, I. |
|
1975 |
8 |
1 |
p. 77 |
artikel |
12 |
Dislocations and plastic deformation by I. Kovács and L. Zsoldos
|
Thomas, J. M. |
|
1975 |
8 |
1 |
p. 78 |
artikel |
13 |
Electron-induced decomposition of Tin(IV) sulphide in the electron microscope
|
Tatlock, G. J. |
|
1975 |
8 |
1 |
p. 49-53 |
artikel |
14 |
Lattice parameter of the non-stoichiometric compound TiNx
|
Nagakura, S. |
|
1975 |
8 |
1 |
p. 65-66 |
artikel |
15 |
Measurement of strain and lattice parameter in epitaxic layers
|
Hart, M. |
|
1975 |
8 |
1 |
p. 42-44 |
artikel |
16 |
Mechanische anisotropie edited by H. P. Stüwe
|
|
|
1975 |
8 |
1 |
p. 78 |
artikel |
17 |
Misorientation contrast of crystal subgrain boundaries in Berg–Barrett X-ray micrographs
|
Wu, C. Cm. |
|
1975 |
8 |
1 |
p. 29-36 |
artikel |
18 |
Notes and News
|
|
|
1975 |
8 |
1 |
p. 76-77 |
artikel |
19 |
PERNOD - Ein Programm zur Verfeinerung von Kristallstrukturparametern aus Neutronenbeugungspulverdiagrammen
|
Klein, S. |
|
1975 |
8 |
1 |
p. 54-59 |
artikel |
20 |
Quantitative interpretation of X-ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities
|
Chung, F. H. |
|
1975 |
8 |
1 |
p. 17-19 |
artikel |
21 |
Studies of the size and the misorientation of the mosaic blocks in pure and doped single crystals of potassium chloride
|
Mitra, G. B. |
|
1975 |
8 |
1 |
p. 15-16 |
artikel |
22 |
Tenth General Assembly and International Congress of Crystallography
|
|
|
1975 |
8 |
1 |
p. 76 |
artikel |
23 |
The avoidance of multiple diffraction errors in single-crystal intensity measurements at low temperatures
|
Hine, R. |
|
1975 |
8 |
1 |
p. 37-41 |
artikel |
24 |
The effects of instrumental distortion in X-ray diffraction studies of liquids. I. A study of the relative effectiveness of several monochromatizing techniques
|
Smelser, S. C. |
|
1975 |
8 |
1 |
p. 8-11 |
artikel |
25 |
The measurement of integrated intensities from polymeric-fibre X-ray diffraction photographs
|
Hall, I. H. |
|
1975 |
8 |
1 |
p. 60-64 |
artikel |
26 |
The neutron Fourier chopper in protein crystallography
|
Nunes, A. C. |
|
1975 |
8 |
1 |
p. 20-28 |
artikel |
27 |
The variances of the Cu Kβ and Fe Kβ spectral distributions
|
Langford, J. I. |
|
1975 |
8 |
1 |
p. 66 |
artikel |
28 |
Thickness measurements of wet protein crystals in the electron microscope
|
Dorset, D. L. |
|
1975 |
8 |
1 |
p. 12-14 |
artikel |