| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A low-temperature device for protein crystallography
|
Marsh, D. J.
|
|
1973
|
6 |
2 |
p. 76-80
|
article
|
| 2 |
An incident-beam ionization chamber and charge integration system for stabilization of X-ray diffraction experiments
|
Hendricks, R. W.
|
|
1973
|
6 |
2 |
p. 129-132
|
article
|
| 3 |
A two-dimensional model of crystal-growth disorder
|
Welberry, T. R.
|
|
1973
|
6 |
2 |
p. 87-96
|
article
|
| 4 |
Computerization of Ruland's X-ray method for determination of the crystallinity in polymers
|
Vonk, C. G.
|
|
1973
|
6 |
2 |
p. 148-152
|
article
|
| 5 |
Consideration of the optimum precession angle for upper-level precession photographs. A correction
|
Cross, J. H.
|
|
1973
|
6 |
2 |
p. 158
|
article
|
| 6 |
Crystal data on 11-chloro-indazole [2,3-9][3,1]benzoxazin-5-one, C14H7ClN2O2
|
Clarke, P. T.
|
|
1973
|
6 |
2 |
p. 161
|
article
|
| 7 |
Crystal growth 1971. Proceedings of 3rd International Conference, France 1971 edited by R. A. Laudise, J. B. Mullin and B. Mutaftschiev
|
Goodwin, D. W.
|
|
1973
|
6 |
2 |
p. 163
|
article
|
| 8 |
Crystallographers
|
|
|
1973
|
6 |
2 |
p. 162
|
article
|
| 9 |
Double diffraction des rayons X par une substance amorphe
|
Malet, G.
|
|
1973
|
6 |
2 |
p. 139-144
|
article
|
| 10 |
Errors in quantitative analysis of diffuse scattering from alloys
|
Gragg, J. E.
|
|
1973
|
6 |
2 |
p. 59-66
|
article
|
| 11 |
Etude des systèmes à trois phases par diffusion centrale des rayons X
|
Renouprez, A.
|
|
1973
|
6 |
2 |
p. 105-113
|
article
|
| 12 |
Herstellung von Kupfereinkristallen Kleiner Versetzungsdichte by E. Kappler, W. Uelhoff, H. Ehmer and F. Abbink
|
Hocart, R.
|
|
1973
|
6 |
2 |
p. 163
|
article
|
| 13 |
Influence of crystal size on electron diffraction intensities
|
Schoening, F. R. L.
|
|
1973
|
6 |
2 |
p. 145-148
|
article
|
| 14 |
Intersect distributions and small-angle X-ray scattering theory. III. The intersect distribution for an ellipsoid
|
Wu, H.-I.
|
|
1973
|
6 |
2 |
p. 66-72
|
article
|
| 15 |
Introduction to glass science edited by L. D. Pye, H. J. Stevens and W. C. La Course
|
Scholze, H.
|
|
1973
|
6 |
2 |
p. 164
|
article
|
| 16 |
Intérêt du filtrage des énergies en diffraction electronique
|
Duval, P.
|
|
1973
|
6 |
2 |
p. 113-116
|
article
|
| 17 |
Investigation of non-ideal two-phase polymer structures by small-angle X-ray scattering
|
Vonk, C. G.
|
|
1973
|
6 |
2 |
p. 81-86
|
article
|
| 18 |
Methode d'analyse qualitative de la texture. Application à la description de la texture idéale de laminage du cuivre pur polycristallin
|
Ruer, D.
|
|
1973
|
6 |
2 |
p. 98-104
|
article
|
| 19 |
Notes and News
|
|
|
1973
|
6 |
2 |
p. 162
|
article
|
| 20 |
Observation of Pendellösung fringes in a melt-grown lithium niobate single crystal
|
Sugh, K.
|
|
1973
|
6 |
2 |
p. 97-98
|
article
|
| 21 |
Observation, par méthode de Lang, de différents arrangements de dislocations après recuit sur des cristaux de fluorure de lithium
|
Pavis, B.
|
|
1973
|
6 |
2 |
p. 158-160
|
article
|
| 22 |
Orientation factors for fiber X-ray diffraction data obtained by the precession method
|
Miller, D. P.
|
|
1973
|
6 |
2 |
p. 73-75
|
article
|
| 23 |
Precision lattice parameters and the coefficients of thermal expansion of hexagonal germanium dioxide
|
Rao, K. V. K.
|
|
1973
|
6 |
2 |
p. 136-138
|
article
|
| 24 |
Researches in powder metallurgy edited by B. A. Borok
|
Ridal, K. A.
|
|
1973
|
6 |
2 |
p. 162
|
article
|
| 25 |
Technik-Wörterbuch Kristallografie. Englisch-Deutsch-Französisch-Russisch by K.-O. Backhaus
|
Woolfson, M. M.
|
|
1973
|
6 |
2 |
p. 163-164
|
article
|
| 26 |
The measurement of single-crystal lattice parameters using a double-diffraction technique
|
Spooner, F. J.
|
|
1973
|
6 |
2 |
p. 132-135
|
article
|
| 27 |
The precision of interplanar distances measured by an energy-dispersive diffractometer
|
Fukamachi, T.
|
|
1973
|
6 |
2 |
p. 117-122
|
article
|
| 28 |
Unit-cell dimension measurements from pairs of X-ray diffraction lines
|
Popović, S.
|
|
1973
|
6 |
2 |
p. 122-128
|
article
|
| 29 |
X-ray powder diffractometry of small (20 mg to 1 μg) samples using standard equipment
|
Baldock, P. J.
|
|
1973
|
6 |
2 |
p. 153-157
|
article
|
Journal description