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                             34 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A combined approach to characterize ligand-induced solid–solid phase transitions in biomacromolecular crystals Ramakrishnan, Saminathan

54 3 p. 787-796
artikel
2 Aerosol-based ligand soaking of reservoir-free protein crystals Ross, Breyan

54 3 p. 895-902
artikel
3 A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments Nadazdy, Peter

54 3 p. 730-738
artikel
4 Alignment facility and software for single-crystal time-of-flight neutron spectroscopy Liu, Zihao

54 3 p. 957-962
artikel
5 Analyses of hierarchical structures in vulcanized SBR rubber by using contrast-variation USANS and SANS Takenaka, Mikihito

54 3 p. 949-956
artikel
6 A novel method to obtain integral parameters of the orientation distribution function of textured polycrystals from wavelength-resolved neutron transmission spectra Vicente Alvarez, Miguel Angel

54 3 p. 903-913
artikel
7 A polarization-switch effect of silicon crystals under multiple-beam diffraction geometry Tang, Zheng

54 3 p. 976-981
artikel
8 ASAXS measurements on ferritin and apoferritin at the bioSAXS beamline P12 (PETRA III, DESY) Wieland, D. C. F.

54 3 p. 830-838
artikel
9 Characterizing dislocation loops in irradiated polycrystalline Zr alloys by X-ray line profile analysis of powder diffraction patterns with satellites Ungár, Tamás

54 3 p. 803-821
artikel
10 Combined specular and off-specular reflectometry: elucidating the complex structure of soft buried interfaces Hafner, Aljoša

54 3 p. 924-948
artikel
11 CrystalExplorer: a program for Hirshfeld surface analysis, visualization and quantitative analysis of molecular crystals Spackman, Peter R.

54 3 p. 1006-1011
artikel
12 Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns Nolze, Gert

54 3 p. 1012-1022
artikel
13 Design and use of a sapphire single-crystal gas-pressure cell for in situ neutron powder diffraction Finger, Raphael

54 3 p. 839-846
artikel
14 Detailed total scattering analysis of disorder in ZIF-8 Metz, Peter C.

54 3 p. 759-767
artikel
15 Ekkehart Tillmanns (1941–2020) Paufler, Peter

54 3 p. 1027-1028
artikel
16 Grazing-incidence X-ray scattering of lamellar thin films. Erratum Smilgies, Detlef-M.

54 3 p. 1024
artikel
17 High-throughput macromolecular polymorph screening via an NMR and X-ray powder diffraction synergistic approach: the case of human insulin co-crystallized with resorcinol derivatives Spiliopoulou, Maria

54 3 p. 963-975
artikel
18 Incommensurately modulated structure zone in α-Zr instigated by the drag force on a grain boundary Zhang, Yingdong

54 3 p. 982-986
artikel
19 Infrared furnace for in situ neutron single-crystal diffraction studies in controlled gas atmospheres at high temperatures Magro, Fernando

54 3 p. 822-829
artikel
20 Investigation of precision, accuracy and confidence of X-ray diffraction for determining crystallite size in nanopowders Moore, Alexander P.

54 3 p. 856-866
artikel
21 Joseph Yariv (1927–2021) Helliwell, John R.

54 3 p. 1025-1026
artikel
22 lamaGOET: an interface for quantum crystallography Malaspina, Lorraine A.

54 3 p. 987-995
artikel
23 Multipurpose diffractometer for in situ X-ray crystallography of functional materials Gorfman, Semën

54 3 p. 914-923
artikel
24 On the use of the scattering amplitude in coherent X-ray Bragg diffraction imaging Godard, Pierre

54 3 p. 797-802
artikel
25 Quantifying the robustness of the neutron reflectometry technique for structural characterization of polymer brushes Gresham, Isaac J.

54 3 p. 739-750
artikel
26 Quantitative texture analysis using the NOMAD time-of-flight neutron diffractometer Peterson, N. E.

54 3 p. 867-877
artikel
27 Robust surface structure analysis with reliable uncertainty estimation using the exchange Monte Carlo method. Corrigendum Nagai, Kazuki

54 3 p. 1023
artikel
28 SHELIXIR: automation of experimental phasing procedures using SHELXC/D/E Kolenko, Petr

54 3 p. 996-1005
artikel
29 Structure determination of organic compounds by a fit to the pair distribution function from scratch without prior indexing Schlesinger, Carina

54 3 p. 776-786
artikel
30 The advanced treatment of hydrogen bonding in quantum crystallography Malaspina, Lorraine A.

54 3 p. 718-729
artikel
31 The effect of data quality and model parameters on the quantitative phase analysis of X-ray diffraction data by the Rietveld method Rowles, Matthew R.

54 3 p. 878-894
artikel
32 Time-of-flight modulated intensity small-angle neutron scattering measurement of the self-diffusion constant of water Kuhn, Stephen J.

54 3 p. 751-758
artikel
33 Validation of non-negative matrix factorization for rapid assessment of large sets of atomic pair distribution function data Liu, Chia-Hao

54 3 p. 768-775
artikel
34 X-ray scattering profiles: revealing the porosity gradient in porous silicon Romanitan, Cosmin

54 3 p. 847-855
artikel
                             34 gevonden resultaten
 
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