nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A laboratory transmission diffraction Laue setup to evaluate single-crystal quality
|
Arnaud, Alexiane |
|
|
53 |
4 |
p. 914-926 |
artikel |
2 |
A new approach to phason disorder for a decagonal quasicrystal: the moment series expansion of the tiling distribution function for AlCuRh
|
Bugański, Ireneusz |
|
|
53 |
4 |
p. 904-913 |
artikel |
3 |
A new parafocusing paradigm for X-ray diffraction
|
Prokopiou, Danae |
|
|
53 |
4 |
p. 1073-1079 |
artikel |
4 |
Assessment of structure factors for analysis of small-angle scattering data from desired or undesired aggregates
|
Larsen, Andreas Haahr |
|
|
53 |
4 |
p. 991-1005 |
artikel |
5 |
Chirok: a post-refinement tool to analyse absolute structure
|
Dyadkin, Vadim |
|
|
53 |
4 |
p. 1138-1140 |
artikel |
6 |
Complex modeling for the quantification of nanoscale disorder using genetic algorithms, density functional theory and line-profile analysis
|
Koch, Robert J. |
|
|
53 |
4 |
p. 1087-1100 |
artikel |
7 |
Crystallography of γ′-Fe4N formation in single-crystalline α-Fe whiskers
|
Schumann, Helge |
|
|
53 |
4 |
p. 865-879 |
artikel |
8 |
Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs
|
Boureau, Victor |
|
|
53 |
4 |
p. 885-895 |
artikel |
9 |
Defining the hematite topotaxial crystal growth in magnetite–hematite phase transformation
|
Braga de Oliveira, Flávia |
|
|
53 |
4 |
p. 896-903 |
artikel |
10 |
Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals
|
Gradwohl, Kevin-P. |
|
|
53 |
4 |
p. 880-884 |
artikel |
11 |
EDDIDAT: a graphical user interface for the analysis of energy-dispersive diffraction data
|
Apel, Daniel |
|
|
53 |
4 |
p. 1130-1137 |
artikel |
12 |
Effect of 2,4-dinitrophenol dye doping on tristhioureazinc(II) sulfate single crystals: a potential nonlinear optical material
|
Durgababu, G. |
|
|
53 |
4 |
p. 972-981 |
artikel |
13 |
From atoms to bonds, angles and torsions: molecular metrics from crystal space, and two Excel implementations
|
Glasser, Leslie |
|
|
53 |
4 |
p. 1101-1107 |
artikel |
14 |
GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials
|
Savikhin, Victoria |
|
|
53 |
4 |
p. 1108-1129 |
artikel |
15 |
In situ monitoring of hydrothermal reactions by X-ray diffraction with Bragg–Brentano geometry
|
Mesecke, Karsten |
|
|
53 |
4 |
p. 1163-1166 |
artikel |
16 |
In situ temperature profile measurements with high-energy X-rays as a probe of optical floating zone crystal growth environment
|
Denney, Jonathan J. |
|
|
53 |
4 |
p. 982-990 |
artikel |
17 |
Iterative X-ray spectroscopic ptychography
|
Chang, Huibin |
|
|
53 |
4 |
p. 937-948 |
artikel |
18 |
MrPIXEL: automated execution of Pixel calculations via the Mercury interface
|
Reeves, Matthew G. |
|
|
53 |
4 |
p. 1154-1162 |
artikel |
19 |
New method to measure domain-wall motion contribution to piezoelectricity: the case of PbZr0.65Ti0.35O3 ferroelectric
|
Gorfman, Semën |
|
|
53 |
4 |
p. 1039-1050 |
artikel |
20 |
Predicting the available work from deformation-induced α′′ martensite formation in metastable β Ti alloys
|
Niessen, Frank |
|
|
53 |
4 |
p. 1015-1028 |
artikel |
21 |
Professor Dr Dirk Feil (1933–2020)
|
Moss, Grant |
|
|
53 |
4 |
p. 1167-1168 |
artikel |
22 |
Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
|
Morgan, Andrew J. |
|
|
53 |
4 |
p. 927-936 |
artikel |
23 |
PtyNAMi: ptychographic nano-analytical microscope
|
Schropp, Andreas |
|
|
53 |
4 |
p. 957-971 |
artikel |
24 |
Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
|
Sala, Simone |
|
|
53 |
4 |
p. 949-956 |
artikel |
25 |
Real-time tracking of the self-assembled growth of a 3D Ge quantum dot lattice in an alumina matrix
|
Shaji, Ashin |
|
|
53 |
4 |
p. 1029-1038 |
artikel |
26 |
Resolving pseudosymmetry in tetragonal ZrO2 using electron backscatter diffraction with a modified dictionary indexing approach
|
Pang, Edward L. |
|
|
53 |
4 |
p. 1060-1072 |
artikel |
27 |
Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis
|
Aarão-Rodrigues, Lorena |
|
|
53 |
4 |
p. 1006-1014 |
artikel |
28 |
SAS-cam: a program for automatic processing and analysis of small-angle scattering data
|
Wu, Hongjin |
|
|
53 |
4 |
p. 1147-1153 |
artikel |
29 |
Viscous-medium-based crystal support in a sample holder for fixed-target serial femtosecond crystallography
|
Lee, Keondo |
|
|
53 |
4 |
p. 1051-1059 |
artikel |
30 |
X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals
|
Wicht, Thomas |
|
|
53 |
4 |
p. 1080-1086 |
artikel |
31 |
X-Seed 4: updates to a program for small-molecule supramolecular crystallography
|
Barbour, Leonard J. |
|
|
53 |
4 |
p. 1141-1146 |
artikel |