nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis
|
Lundy, D. R. |
|
1972 |
5 |
5 |
p. 380-381 |
artikel |
2 |
A method for aligning crystals in precession photography using monochromated radiation
|
Deganello, S. |
|
1972 |
5 |
5 |
p. 313-315 |
artikel |
3 |
A method of preparation of powder samples for Debye–Scherrer–Hull X-ray diffraction
|
Barns, R. L. |
|
1972 |
5 |
5 |
p. 381-382 |
artikel |
4 |
A unified theory of absolute intensity measurements in small-angle X-ray scattering
|
Hendricks, R. W. |
|
1972 |
5 |
5 |
p. 315-324 |
artikel |
5 |
Commission on Neutron Diffraction
|
|
|
1972 |
5 |
5 |
p. 383 |
artikel |
6 |
Crystal data for potassium sodium silicofluoride, K2SiF6.Na2SiF6
|
Howlett, D. R. |
|
1972 |
5 |
5 |
p. 378-379 |
artikel |
7 |
Crystal data for samarium, holmium and lutetium iron garnets
|
McCarthy, G. J. |
|
1972 |
5 |
5 |
p. 377-378 |
artikel |
8 |
Crystal data on mercury picramate, Hg[C6H2(NO2)2(NH2)O]2.H2O
|
Agrawal, S. P. |
|
1972 |
5 |
5 |
p. 379-380 |
artikel |
9 |
Crystallographers
|
|
|
1972 |
5 |
5 |
p. 383-384 |
artikel |
10 |
Effects of porosity and surface roughness on the X-ray intensity reflected from a powder specimen
|
Suortti, P. |
|
1972 |
5 |
5 |
p. 325-331 |
artikel |
11 |
Etude des profils de raies de diffraction des rayons X d'une poudre d'hydroxyde de nickel
|
Louër, D. |
|
1972 |
5 |
5 |
p. 353-359 |
artikel |
12 |
Guinier camera for single crystal investigation
|
Dachs, H. |
|
1972 |
5 |
5 |
p. 338-342 |
artikel |
13 |
Handbook of electronic materials. Vol. 6. Silicon nitride for microelectronic applications, Part 2 by J. T. Milek
|
|
|
1972 |
5 |
5 |
p. 388 |
artikel |
14 |
Hydrothermal synthesis of crystals edited by A. N. Lobachev
|
Schloemer, H. |
|
1972 |
5 |
5 |
p. 385 |
artikel |
15 |
K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya
|
Davydov, G. V. |
|
1972 |
5 |
5 |
p. 370-371 |
artikel |
16 |
Landolt–Börnstein. Numerical data and functional relationships in science and technology. Group III. Vol. 6. Structure data of elements and intermetallic phases edited by K.-H. Hellwege
|
Pearson, W. B. |
|
1972 |
5 |
5 |
p. 384 |
artikel |
17 |
Notes and News
|
|
|
1972 |
5 |
5 |
p. 383 |
artikel |
18 |
On the enhanced small-angle X-ray scattering from polished surfaces of aluminum
|
Parker, B. A. |
|
1972 |
5 |
5 |
p. 372-373 |
artikel |
19 |
On the phase transformation in cadmium iodide polytypic crystals
|
Tiwari, R. S. |
|
1972 |
5 |
5 |
p. 347-352 |
artikel |
20 |
Optical microscopy for the materials sciences by J. H. Richardson
|
|
|
1972 |
5 |
5 |
p. 388 |
artikel |
21 |
Polarization interferometers: applications in microscopy and macroscopy by M. Françon and S. Mallick
|
Geake, J. E. |
|
1972 |
5 |
5 |
p. 387 |
artikel |
22 |
Practical experiments in crystallography: simulation of structure-factor and one-dimensional electron-density calculations
|
Kennard, C. H. L. |
|
1972 |
5 |
5 |
p. 382 |
artikel |
23 |
Practical experiments in crystallography. Structure solution using `Patterson' heavy-atom technique
|
Kennard, C. H. L. |
|
1972 |
5 |
5 |
p. 382 |
artikel |
24 |
Precession photography: general transformation equations and a new alignment method
|
Millar, J. J. |
|
1972 |
5 |
5 |
p. 332-338 |
artikel |
25 |
Principles and Practice of X-ray Spectrometric Analysis by E. P. Bertin
|
Cauchois, Y. |
|
1972 |
5 |
5 |
p. 387-388 |
artikel |
26 |
Production of sensitive converter screens for thermal neutron diffraction patterns
|
Thomas, P. |
|
1972 |
5 |
5 |
p. 373-374 |
artikel |
27 |
Quantitative analysis of phase composition using X-ray diffraction methods
|
Majumdar, A. J. |
|
1972 |
5 |
5 |
p. 343-347 |
artikel |
28 |
Radiation hazards from X-ray diffraction equipment
|
Faloci, C. |
|
1972 |
5 |
5 |
p. 375-376 |
artikel |
29 |
Tables for microscopic identification of ore materials by W. Uytenbogaardt and E. A. J. Burke
|
Pauly, H. |
|
1972 |
5 |
5 |
p. 385-386 |
artikel |
30 |
The Physics of Metals and Metallography edited by S. V. Vonsovsky
|
Schulze, G. E. R. |
|
1972 |
5 |
5 |
p. 384-385 |
artikel |
31 |
The relation of physical properties to the symmetry of potassium iodate
|
Crane, G. R. |
|
1972 |
5 |
5 |
p. 360-365 |
artikel |
32 |
The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method
|
McGehee, R. |
|
1972 |
5 |
5 |
p. 365-370 |
artikel |