| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of the fast Fourier and trigonometric Fourier algorithms
|
Hubbard, C. R.
|
|
1972
|
5 |
3 |
p. 234-235
|
artikel
|
| 2 |
Adaption d'un ensemble de détection Si(Li) à un diffractometre X
|
Lauriat, J. P.
|
|
1972
|
5 |
3 |
p. 177-183
|
artikel
|
| 3 |
A device for aligning a Weissenberg X-ray diffractometer to a monochromator
|
Cole, W. F.
|
|
1972
|
5 |
3 |
p. 249-250
|
artikel
|
| 4 |
Advances in X-ray analysis edited by C. S. Barrett and C. Ruud
|
|
|
1972
|
5 |
3 |
p. 253
|
artikel
|
| 5 |
A simple small-scale recrystallization apparatus
|
Watkin, D. J.
|
|
1972
|
5 |
3 |
p. 250
|
artikel
|
| 6 |
A technique for the preparation of metal samples for Debye–Scherrer cameras
|
Beaudry, B. J.
|
|
1972
|
5 |
3 |
p. 243-244
|
artikel
|
| 7 |
Computer-generated transmission electron diffraction patterns
|
Ploc, R. A.
|
|
1972
|
5 |
3 |
p. 244-247
|
artikel
|
| 8 |
Crystal data on tin(II) phosphate chloride, Sn2PO4Cl
|
Berndt, A. F.
|
|
1972
|
5 |
3 |
p. 248-249
|
artikel
|
| 9 |
Etude radiocristallographique du bicarbonate de césium
|
Caranoni, C.
|
|
1972
|
5 |
3 |
p. 247-248
|
artikel
|
| 10 |
Examination of the solid phases in the system AgI–NaI–H2O
|
Johnson, L. R.
|
|
1972
|
5 |
3 |
p. 194-200
|
artikel
|
| 11 |
Further studies on the nickel–aluminium system. I. β-NiAl and δ-Ni2Al3 phase fields
|
Taylor, A.
|
|
1972
|
5 |
3 |
p. 201-209
|
artikel
|
| 12 |
Further studies on the nickel–aluminum system. II. Vacancy filling in β and δ-phase alloys by compression at high temperatures
|
Taylor, A.
|
|
1972
|
5 |
3 |
p. 210-215
|
artikel
|
| 13 |
Handbook of electronic materials. Volume 5. Group IV semiconducting materials by M. Neuberger
|
|
|
1972
|
5 |
3 |
p. 253
|
artikel
|
| 14 |
Instrumental and radiochemical activation analysis by J. Hoste, J. Op. de Beeck, R. Gijbels, F. Adams, P. Van den Winkel and D. de Soete
|
|
|
1972
|
5 |
3 |
p. 253
|
artikel
|
| 15 |
IUCr-UNESCO Project on the Teaching of Crystallography
|
|
|
1972
|
5 |
3 |
p. 251-252
|
artikel
|
| 16 |
Key to the Second Supplement to the Crystallographic Book List
|
|
|
1972
|
5 |
3 |
p. 254
|
artikel
|
| 17 |
Langage algorithmique de mesure d'intensités
|
Bassi, G. C.
|
|
1972
|
5 |
3 |
p. 230-233
|
artikel
|
| 18 |
Physics of thin films. Volume 6 edited by M. H. Francome
|
Prutton, M.
|
|
1972
|
5 |
3 |
p. 252-253
|
artikel
|
| 19 |
Precise measurement of lattice parameters of single crystals in conjunction with a hot stage
|
Halliwell, M. A. G.
|
|
1972
|
5 |
3 |
p. 240-241
|
artikel
|
| 20 |
Preparation and properties of solid state material. Vol. 1 edited by R. A. Lefever
|
Rieck, G. D.
|
|
1972
|
5 |
3 |
p. 252
|
artikel
|
| 21 |
Small-angle X-ray scattering study of glassy GeO2
|
Pierre, A.
|
|
1972
|
5 |
3 |
p. 216-221
|
artikel
|
| 22 |
The cell dimensions of W1xTaxSe2
|
Al-Hilli, A. A.
|
|
1972
|
5 |
3 |
p. 221-224
|
artikel
|
| 23 |
The definition of the indexing figure of merit M20
|
de Wolff, P. M.
|
|
1972
|
5 |
3 |
p. 243
|
artikel
|
| 24 |
The effect of multiple diffraction on the electron-microscope image
|
Lipson, H.
|
|
1972
|
5 |
3 |
p. 239-240
|
artikel
|
| 25 |
The identification of twins from intensity statistics
|
Stanley, E.
|
|
1972
|
5 |
3 |
p. 191-194
|
artikel
|
| 26 |
The influence of preferred orientation on the line width and peak shift of (hk) interferences
|
Ruland, W.
|
|
1972
|
5 |
3 |
p. 225-230
|
artikel
|
| 27 |
The precision determination of the lattice parameters and the coefficients of thermal expansion of BiFeO3
|
Bucci, J. D.
|
|
1972
|
5 |
3 |
p. 187-191
|
artikel
|
| 28 |
The symmetry of the structure of the phase in Zr and Ti alloys
|
Sass, S. L.
|
|
1972
|
5 |
3 |
p. 236-238
|
artikel
|
| 29 |
Vergleichende Untersuchung über die röntgentopographischen Verfahren der Abbildung von Kristalldefekten
|
Wattenberg, U.
|
|
1972
|
5 |
3 |
p. 169-177
|
artikel
|
| 30 |
X-ray small-angle scattering of glassy carbon
|
Perret, R.
|
|
1972
|
5 |
3 |
p. 183-187
|
artikel
|
| 31 |
X-ray Spectrometry - an International Journal edited by R. Jenkins
|
|
|
1972
|
5 |
3 |
p. 253
|
artikel
|
| 32 |
X-ray topographic studies on the lattice distortions of single crystals of silicon due to scratching
|
Renninger, M.
|
|
1972
|
5 |
3 |
p. 163-169
|
artikel
|
| 33 |
Zur Elementarzelle von Ca3TeO6
|
Trömel, M.
|
|
1972
|
5 |
3 |
p. 241-242
|
artikel
|
Tijdschrift beschrijving