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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography Yi, J. M.
2006
39 1 p. 106-108
artikel
2 A rapidly filled capillary mount for both dry powder and polycrystalline slurry samples Von Dreele, R. B.
2006
39 1 p. 124-126
artikel
3 A simple method of shielding area detectors from unwanted Bragg diffraction Fábry, Jan
2006
39 1 p. 127
artikel
4 Automated diffraction image analysis and spot searching for high-throughput crystal screening Zhang, Zepu
2006
39 1 p. 112-119
artikel
5 CMPZ – an algorithm for the efficient comparison of periodic structures Hundt, R.
2006
39 1 p. 6-16
artikel
6 Comments on `On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006) Rauch, Edgar F.
2006
39 1 p. 104-105
artikel
7 Design and implementation of a simple and inexpensive GISAXS sample chamber Groves, Michael N.
2006
39 1 p. 120-123
artikel
8 Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniques Cheung, J. Y.
2006
39 1 p. 46-52
artikel
9 Investigation of growth modes of manganese mercury thiocyanate crystal by atomic force microscopy Yu, G. W.
2006
39 1 p. 53-56
artikel
10 Lattice-plane curvature and small-angle grain boundaries in SiC bulk crystals Hock, Rainer
2006
39 1 p. 17-23
artikel
11 Line profile analysis: pattern modelling versus profile fitting Leoni, Matteo
2006
39 1 p. 24-31
artikel
12 New algorithm for protein model building: extending a partial model in a map segment Zhou, Yong
2006
39 1 p. 57-63
artikel
13 Notes for authors 2006 2006
39 1 p. 128-133
artikel
14 Observations of the Gibeon meteorite and the inverse Greninger–Troiano orientation relationship Godet, Stephane
2006
39 1 p. 72-81
artikel
15 On the absolute calibration of bench-top small-angle X-ray scattering instruments: a comparison of different standard methods Jack, Kevin S.
2006
39 1 p. 32-38
artikel
16 On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope Bouzy, E.
2006
39 1 p. 101-103
artikel
17 Oriented sols for fiber diffraction from limited quantities or hazardous materials Kendall, Amy
2006
39 1 p. 39-41
artikel
18 Phase imaging using time-of-flight neutron diffraction Gutmann, M. J.
2006
39 1 p. 82-89
artikel
19 SAXS instruments with slit collimation: investigation of resolution and flux Bergmann, Alexander
2006
39 1 p. 64-71
artikel
20 Structure of the quaternary alloy Zn0.6Mn0.4In2S4 from synchrotron powder diffraction and electron transmission microscopy Mora, Asiloé J.
2006
39 1 p. 1-5
artikel
21 Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer Hibino, H.
2006
39 1 p. 90-100
artikel
22 TLSMD web server for the generation of multi-group TLS models Painter, Jay
2006
39 1 p. 109-111
artikel
23 X-ray diffraction single-crystal structure characterization of iron ludwigite from room temperature to 15 K Mir, M.
2006
39 1 p. 42-45
artikel
                             23 gevonden resultaten
 
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