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                             34 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accuracy in Rietveld quantitative phase analysis of Portland cements De la Torre, A. G.
2003
36 5 p. 1169-1176
artikel
2 A contribution to the practical implementation of a variable-geometry converging multichannel collimator for SANS Falcão, A. N.
2003
36 5 p. 1266-1269
artikel
3 A full-pattern fitting algorithm for energy-dispersive X-ray diffraction Dong, Yu-Hui
2003
36 5 p. 1123-1127
artikel
4 A quick and gentle method for mounting crystals in capillaries Petri, Edward T.
2003
36 5 p. 1297-1298
artikel
5 Automatic inference of protein quaternary structure from crystals Ponstingl, Hannes
2003
36 5 p. 1116-1122
artikel
6 CIF applications. XIII. CIFEDIT, a program for viewing and editing CIFs Toby, Brian H.
2003
36 5 p. 1288-1289
artikel
7 CIF applications. XII. Inspecting Rietveld fits from pdCIF: pdCIFplot Toby, Brian H.
2003
36 5 p. 1285-1287
artikel
8 CIF applications. XIV. Reporting of Rietveld results using pdCIF: GSAS2CIF Toby, Brian H.
2003
36 5 p. 1290-1294
artikel
9 Determination of nanoparticle structure type, size and strain distribution from X-ray data for monatomic f.c.c.-derived non-crystallographic nanoclusters Cervellino, Antonio
2003
36 5 p. 1148-1158
artikel
10 Diffraction peak profiles from spherical crystallites with lognormal size distribution Ida, T.
2003
36 5 p. 1107-1115
artikel
11 Estimation of chord length distributions from small-angle scattering using indirect Fourier transformation Hansen, Steen
2003
36 5 p. 1190-1196
artikel
12 General-case data interpretation of spin-echo small-angle neutron scattering Zhao, Jinkui
2003
36 5 p. 1177-1181
artikel
13 Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode Lai, X.
2003
36 5 p. 1230-1235
artikel
14 High-resolution electron microscopy. 3rd edition. By John C. H. Spence. Pp. xvi + 401. Oxford University Press, 2003. GBP 69.95. ISBN 0-19-850915-4. 2003
36 5 p. 1299
artikel
15 In situ determination of stresses from time-of-flight neutron transmission spectra Steuwer, Axel
2003
36 5 p. 1159-1168
artikel
16 In situ X-ray diffraction studies of aluminium-induced crystallization of hydrogenated amorphous silicon Hotz, Chris
2003
36 5 p. 1236-1239
artikel
17 Intensity and resolution effects in converging multichannel collimators for SANS by Monte Carlo simulation Falcão, A. N.
2003
36 5 p. 1262-1265
artikel
18 Investigation of distorted subsurface layers of thick perfect crystals Aboyan, A. O.
2003
36 5 p. 1256-1261
artikel
19 MgCl2.2.5C2H5OH–NaCl mixed crystals Jiang, Xue
2003
36 5 p. 1272-1273
artikel
20 Microscope detection options for colorless protein crystals grown in lipidic cubic phases Nollert, Peter
2003
36 5 p. 1295-1296
artikel
21 Monte Carlo simulation of models for biological systems: thermodynamic properties and small-angle scattering from collections of interacting binary mixtures of spheres Sjöberg, Bo
2003
36 5 p. 1128-1134
artikel
22 Note on Bravais–Miller indices Schwarzenbach, D.
2003
36 5 p. 1270-1271
artikel
23 OLEX: new software for visualization and analysis of extended crystal structures Dolomanov, Oleg V.
2003
36 5 p. 1283-1284
artikel
24 PRIMUS: a Windows PC-based system for small-angle scattering data analysis Konarev, Petr V.
2003
36 5 p. 1277-1282
artikel
25 Quasicrystals. The state of the art. 2nd edition. Edited by D. P. Vincenzo and P. J. Steinhardt. Series on Directions in Condensed Matter Physics, Vol. 16. Pp. xi + 618. Singapore: World Scientific, 1999. Price (hardback) USD 113, GBP 71, ISBN 981-02-4155-0; (paperback) USD 55, GBP 34, ISBN 981-02-4156-9. 2003
36 5 p. 1299
artikel
26 Residual stresses in tool steel due to hard-turning Ordás, Nerea
2003
36 5 p. 1135-1143
artikel
27 SAPI: a direct-methods program for finding heavy-atom sites with SAD or SIR data Hao, Q.
2003
36 5 p. 1274-1276
artikel
28 Scan profiles for neutron spectrometers. I. Gaussian-profile elements by acceptance-diagram methods Cussen, L. D.
2003
36 5 p. 1204-1213
artikel
29 Scan profiles for neutron spectrometers. III. Rectangular-profile elements by numerical methods Cussen, L. D.
2003
36 5 p. 1225-1229
artikel
30 Scan profiles for neutron spectrometers. II. Rectangular-profile elements by acceptance-diagram methods Cussen, L. D.
2003
36 5 p. 1214-1224
artikel
31 Strategies for solving neighboring-element problems: a case study using resonant X-ray diffraction and pulsed neutron diffraction to examine Sr8Ga16Ge30 Lee, Peter L.
2003
36 5 p. 1182-1189
artikel
32 Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation Bunge, Hans Joachim
2003
36 5 p. 1240-1255
artikel
33 Thick-mode resonance of a PZT/Si wafer stack investigated by X-ray diffraction in Bragg geometry de Souza, Paulo Eduardo Narcizo
2003
36 5 p. 1144-1147
artikel
34 Twinning in La0.95Sr0.05Ga0.9Mg0.1O2.92 crystal studied by white-beam (Laue) X-ray microdiffraction Savytskii, D. I.
2003
36 5 p. 1197-1203
artikel
                             34 gevonden resultaten
 
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