| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of various commonly used correlation functions for describing total scattering
|
Keen, David A.
|
|
2001
|
34 |
2 |
p. 172-177
|
artikel
|
| 2 |
An X-ray interferometer with a large and variable path length difference
|
Fezzaa, K.
|
|
2001
|
34 |
2 |
p. 166-171
|
artikel
|
| 3 |
A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction on l-(−)-ephedrine hemihydrate
|
Krebs, Frederik C.
|
|
2001
|
34 |
2 |
p. 203-207
|
artikel
|
| 4 |
Asymmetries of the Voigt line shape
|
Flores-Llamas, H.
|
|
2001
|
34 |
2 |
p. 136-143
|
artikel
|
| 5 |
A very simple and cheap greasing device for crystallization plates
|
Watanabe, Nobuhisa
|
|
2001
|
34 |
2 |
p. 224
|
artikel
|
| 6 |
Characterization of H defects in the aluminium–hydrogen system using small-angle scattering techniques
|
Buckley, C. E.
|
|
2001
|
34 |
2 |
p. 119-129
|
artikel
|
| 7 |
Clear strategy screens for macromolecular crystallization
|
Brzozowski, Andrzej Marek
|
|
2001
|
34 |
2 |
p. 97-101
|
artikel
|
| 8 |
Determination of the crystallized fractions of a largely amorphous multiphase material by the Rietveld method
|
Orlhac, X.
|
|
2001
|
34 |
2 |
p. 114-118
|
artikel
|
| 9 |
Diffuse scattering anisotropy and the P21/a ↔ A2/a phase transition in titanite, CaTiOSiO4
|
Malcherek, Thomas
|
|
2001
|
34 |
2 |
p. 108-113
|
artikel
|
| 10 |
Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes
|
Popa, N. C.
|
|
2001
|
34 |
2 |
p. 187-195
|
artikel
|
| 11 |
Estimation of cobalt coating layer thickness on acicular Fe3O4 powder using HR-TEM
|
Sakai, Keitarou
|
|
2001
|
34 |
2 |
p. 102-107
|
artikel
|
| 12 |
EXPGUI, a graphical user interface for GSAS
|
Toby, Brian H.
|
|
2001
|
34 |
2 |
p. 210-213
|
artikel
|
| 13 |
Global indicators of X-ray data quality
|
Weiss, Manfred S.
|
|
2001
|
34 |
2 |
p. 130-135
|
artikel
|
| 14 |
Harry Brumberger (1926–2000)
|
|
|
2001
|
34 |
2 |
p. 225
|
artikel
|
| 15 |
Kinematical two-dimensional multiple-diffraction intensity profiles. Application to ω–ψ scans of silicon and diamond obtained with synchrotron radiation
|
Rossmanith, E.
|
|
2001
|
34 |
2 |
p. 157-165
|
artikel
|
| 16 |
Ludo Frevel Crystallography Scholarship
|
|
|
2001
|
34 |
2 |
p. 225
|
artikel
|
| 17 |
Peak profile function for synchrotron X-ray diffractometry
|
Ida, T.
|
|
2001
|
34 |
2 |
p. 144-151
|
artikel
|
| 18 |
Reduced-price subscriptions to IUCr journals
|
|
|
2001
|
34 |
2 |
p. 225
|
artikel
|
| 19 |
Refinement of proteins at subatomic resolution with MOPRO
|
Guillot, Benoit
|
|
2001
|
34 |
2 |
p. 214-223
|
artikel
|
| 20 |
Rietveld quantitative amorphous content analysis
|
De La Torre, A. G.
|
|
2001
|
34 |
2 |
p. 196-202
|
artikel
|
| 21 |
Temperature dependence of lattice constants of the rare-earth hexaborides EuB6 and GdB6
|
Takahashi, Yasuhiko
|
|
2001
|
34 |
2 |
p. 208-209
|
artikel
|
| 22 |
The reliability index R2 as a versatile tool in structure analysis of inorganic and small molecular compounds
|
Beurskens, Paul T.
|
|
2001
|
34 |
2 |
p. 178-186
|
artikel
|
| 23 |
Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle
|
Martorana, A.
|
|
2001
|
34 |
2 |
p. 152-156
|
artikel
|
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