| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of the asymptotic properties of X-ray line broadening caused by dislocations
|
Groma, I.
|
|
2000
|
33 |
6 |
p. 1329-1334
|
artikel
|
| 2 |
A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements
|
Nakashima, Kiichi
|
|
2000
|
33 |
6 |
p. 1376-1385
|
artikel
|
| 3 |
A small-angle neutron scattering model for polydisperse spherical particles with diffusion zones and application to soft magnetic metallic glass
|
Hermann, Helmut
|
|
2000
|
33 |
6 |
p. 1386-1392
|
artikel
|
| 4 |
Bayesian estimation of hyperparameters for indirect Fourier transformation in small-angle scattering
|
Hansen, Steen
|
|
2000
|
33 |
6 |
p. 1415-1421
|
artikel
|
| 5 |
Comments on Extinction-corrected mean thickness and integral width used in the program UMWEG98 by Rossmanith (2000)
|
Larsen, Helge B.
|
|
2000
|
33 |
6 |
p. 1447
|
artikel
|
| 6 |
Completion of crystal structures from powder data: the use of the coordination polyhedra
|
Altomare, Angela
|
|
2000
|
33 |
6 |
p. 1305-1310
|
artikel
|
| 7 |
Coupling between spatial and angular variables in surface X-ray diffraction: effects on the line shapes and integrated intensities
|
Jedrecy, Nathalie
|
|
2000
|
33 |
6 |
p. 1365-1375
|
artikel
|
| 8 |
Electric-field-induced structural changes measured with a CCD-coupled X-ray image intensifier
|
van Reeuwijk, S. J.
|
|
2000
|
33 |
6 |
p. 1422-1429
|
artikel
|
| 9 |
Estimating nanoparticle size from diffraction measurements
|
Hall, B. D.
|
|
2000
|
33 |
6 |
p. 1335-1341
|
artikel
|
| 10 |
Estimation of statistical uncertainties in quantitative phase analysis using the Rietveld method and the whole-powder-pattern decomposition method
|
Toraya, H.
|
|
2000
|
33 |
6 |
p. 1324-1328
|
artikel
|
| 11 |
European Crystallography Prize
|
|
|
2000
|
33 |
6 |
p. 1450
|
artikel
|
| 12 |
Evolution structurale de la nacrite en fonction de la nature des molécules organiques intercalees
|
Ben Haj Amara, A.
|
|
2000
|
33 |
6 |
p. 1351-1359
|
artikel
|
| 13 |
Extended pseudo-Voigt function for approximating the Voigt profile
|
Ando, M.
|
|
2000
|
33 |
6 |
p. 1311-1316
|
artikel
|
| 14 |
Hardness of oxide films formed as a result of aluminium anode oxidation processes
|
Chis, M.
|
|
2000
|
33 |
6 |
p. 1360-1364
|
artikel
|
| 15 |
High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry. Erratum
|
Butler, B. D.
|
|
2000
|
33 |
6 |
p. 1449
|
artikel
|
| 16 |
Kinematical two-dimensional multiple-diffraction intensity profiles. Application to ω–ψ scans obtained with Cu Kα radiation
|
Rossmanith, Elisabeth
|
|
2000
|
33 |
6 |
p. 1405-1414
|
artikel
|
| 17 |
Kα1–Kα2 characteristic of a parabolic graded multilayer
|
Toraya, H.
|
|
2000
|
33 |
6 |
p. 1317-1323
|
artikel
|
| 18 |
Molsee: a Tcl/Tk-based program to control Rasmol
|
Mao, Fenglou
|
|
2000
|
33 |
6 |
p. 1445-1446
|
artikel
|
| 19 |
On the resolution of neutron scattering instruments
|
Cussen, Leo D.
|
|
2000
|
33 |
6 |
p. 1399-1404
|
artikel
|
| 20 |
OVIONE: a new vector-search rotation-function program for macromolecular crystallography
|
Álvarez-Rúa, Carmen
|
|
2000
|
33 |
6 |
p. 1436-1444
|
artikel
|
| 21 |
Preferred orientation in Debye–Scherrer geometry: interpretation of the March coefficient
|
Howard, C. J.
|
|
2000
|
33 |
6 |
p. 1434-1435
|
artikel
|
| 22 |
Professor K. Banerjee Endowment Lecture Silver Medal
|
|
|
2000
|
33 |
6 |
p. 1450
|
artikel
|
| 23 |
Quantitative X-ray standing-wave phase analysis by means of photoelectrons
|
Mukhamedzhanov, E. Kh.
|
|
2000
|
33 |
6 |
p. 1430-1433
|
artikel
|
| 24 |
Resolution calculations for novel neutron beam elements
|
Cussen, Leo D.
|
|
2000
|
33 |
6 |
p. 1393-1398
|
artikel
|
| 25 |
Response to Larsen & Thorkildsen's comments on Extinction-corrected mean thickness and integrated width used in the program UMWEG98
|
Rossmanith, E.
|
|
2000
|
33 |
6 |
p. 1448
|
artikel
|
| 26 |
Velibor Marinković (1929-2000)
|
|
|
2000
|
33 |
6 |
p. 1450
|
artikel
|
| 27 |
X-ray diffractometer for structural studies of surfaces and interfaces
|
van Silfhout, R. G.
|
|
2000
|
33 |
6 |
p. 1342-1350
|
artikel
|
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