| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate cells from area-detector images
|
Duisenberg, Albert J. M.
|
|
2000
|
33 |
3-2 |
p. 893-898
|
artikel
|
| 2 |
An introductory exercise in Fourier synthesis and structure-factor calculation for undergraduates, using an EXCEL workbook
|
Taylor, Max R.
|
|
2000
|
33 |
3-2 |
p. 975-976
|
artikel
|
| 3 |
Approximate calculation of multiple-diffraction patterns based on Renninger's kinematical `simplest approach'
|
Rossmanith, Elisabeth
|
|
2000
|
33 |
3-2 |
p. 921-927
|
artikel
|
| 4 |
A simple technique to control macromolecular crystal nucleation efficiently using a standard vapour-diffusion setup
|
Jovine, Luca
|
|
2000
|
33 |
3-2 |
p. 988-989
|
artikel
|
| 5 |
Birefringence imaging of phase transitions: application to Na0.5Bi0.5TiO3
|
Geday, M.
|
|
2000
|
33 |
3-2 |
p. 909-914
|
artikel
|
| 6 |
Chemical and crystallographic investigations on the cracking of blue corundum, Al2O3, produced by the Verneuil technique
|
Rinaudo, C.
|
|
2000
|
33 |
3-2 |
p. 947-952
|
artikel
|
| 7 |
CONSCRIPT: a program for generating electron density isosurfaces for presentation in protein crystallography
|
Bourke, P.
|
|
2000
|
33 |
3-2 |
p. 990-991
|
artikel
|
| 8 |
Displacements from Cu4Ti in a Cu–Ti single crystal using small-angle and diffuse X-ray scattering: a synchrotron radiation study
|
Lyon, O.
|
|
2000
|
33 |
3-2 |
p. 928-937
|
artikel
|
| 9 |
Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting
|
Langford, J. I.
|
|
2000
|
33 |
3-2 |
p. 964-974
|
artikel
|
| 10 |
Estimation of the background in powder diffraction patterns through a robust smoothing procedure
|
Brückner, Sergio
|
|
2000
|
33 |
3-2 |
p. 977-979
|
artikel
|
| 11 |
FBR: a robust method to determine the basis matrix of the Bravais lattice from oscillation images
|
Döhring, Klaus
|
|
2000
|
33 |
3-2 |
p. 958-963
|
artikel
|
| 12 |
First results from a macromolecular crystallography system with a polycapillary collimating optic and a microfocus X-ray generator
|
Gubarev, Mikhail
|
|
2000
|
33 |
3-2 |
p. 882-887
|
artikel
|
| 13 |
GraphEnt: a maximum-entropy program with graphics capabilities
|
Glykos, Nicholas M.
|
|
2000
|
33 |
3-2 |
p. 982-985
|
artikel
|
| 14 |
Icosahedral quasicrystals applied as a harmonic-free crystal analyser
|
Capitan, M. J.
|
|
2000
|
33 |
3-2 |
p. 888-892
|
artikel
|
| 15 |
Improvement of SAXS measurements on Kratky slit systems by Göbel mirrors and imaging-plate detectors
|
Bergmann, Alexander
|
|
2000
|
33 |
3-2 |
p. 869-875
|
artikel
|
| 16 |
Ionization chambers for monitoring the position and tilt of X-ray beams
|
Arndt, U. W.
|
|
2000
|
33 |
3-2 |
p. 986-987
|
artikel
|
| 17 |
Lead mercaptides: materials useful as powder secondary standards and internal references for calibration of X-ray diffractometers at small and medium angles
|
Tiers, George V. D.
|
|
2000
|
33 |
3-2 |
p. 915-920
|
artikel
|
| 18 |
OASIS: a computer program for breaking phase ambiguity in one-wavelength anomalous scattering or single isomorphous substitution (replacement) data
|
Hao, Q.
|
|
2000
|
33 |
3-2 |
p. 980-981
|
artikel
|
| 19 |
ORTHON: transformation from triclinic axes and atomic coordinates to orthonormal ones
|
Kim, Jin-Gyu
|
|
2000
|
33 |
3-2 |
p. 994
|
artikel
|
| 20 |
Resonant X-ray diffraction using high-resolution image-plate data
|
Ehrenberg, H.
|
|
2000
|
33 |
3-2 |
p. 953-957
|
artikel
|
| 21 |
Systematic errors in the high-accuracy universal polarimeter: application to determining temperature-dependent optical anisotropy of KDC and KDP crystals
|
Hernández-Rodríguez, C.
|
|
2000
|
33 |
3-2 |
p. 938-946
|
artikel
|
| 22 |
Tcl/Tk-based programs. IV. CALCRYS: crystallographic calculator
|
Urzhumtseva, L. M.
|
|
2000
|
33 |
3-2 |
p. 992
|
artikel
|
| 23 |
Use of Cr Kα radiation to enhance the signal from anomalous scatterers including sulfur
|
Kwiatkowski, Witek
|
|
2000
|
33 |
3-2 |
p. 876-881
|
artikel
|
| 24 |
VOID: a PC program for the location and display of voids in crystal structures
|
McArdle, P.
|
|
2000
|
33 |
3-2 |
p. 993
|
artikel
|
| 25 |
Whole-profile structure solution from powder diffraction data using simulated annealing
|
Coelho, A. A.
|
|
2000
|
33 |
3-2 |
p. 899-908
|
artikel
|
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