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                             35 results found
no title author magazine year volume issue page(s) type
1 A beam-stop mount designed for use with area detectors Bertok, Alexander
2000
33 2 p. 415-416
article
2 Accuracy of XRPD QPA using the combined Rietveld–RIR method Gualtieri, Alessandro F.
2000
33 2 p. 267-278
article
3 A correction for anisotropic line broadening due to structural defects in powder diffraction structure analysis Solovyov, Leonid A.
2000
33 2 p. 338-343
article
4 A non-linear positive method to reconstruct the parent textures from the inherited textures in phase transformation Humbert, M.
2000
33 2 p. 206-212
article
5 Application of high-energy synchrotron radiation for texture studies Mishin, O. V.
2000
33 2 p. 364-371
article
6 Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings Saerens, A.
2000
33 2 p. 312-322
article
7 Crystallization bench Cabric, B.
2000
33 2 p. 387-388
article
8 Deconvolution of X-ray diffraction profiles by using series expansion Sánchez-Bajo, F.
2000
33 2 p. 259-266
article
9 Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography Kudo, Y.
2000
33 2 p. 226-233
article
10 Extinction-corrected mean thickness and integral width used in the program UMWEG98 Rossmanith, Elisabeth
2000
33 2 p. 330-333
article
11 How the R factor changes as molecules become larger Krebs, Frederik C.
2000
33 2 p. 392-393
article
12 In situ X-ray crystallography McPherson, Alexander
2000
33 2 p. 397-400
article
13 Kinematical intensity profiles obtained for single and multiple diffraction in perfect spherical crystals Rossmanith, Elisabeth
2000
33 2 p. 323-329
article
14 Measurement of single-crystal elastic constants by neutron diffraction from polycrystals. Addendum and erratum Howard, C. J.
2000
33 2 p. 418
article
15 Modeling radial collimators for use in stress and texture measurements with neutron diffraction Wang, X.-L.
2000
33 2 p. 334-337
article
16 Multiple CCD detector for macromolecular X-ray crystallography Phillips, Walter C.
2000
33 2 p. 243-251
article
17 Next-near-neighbour interactions with Al in Li+- and Rb+-exchanged Na+ β-aluminas, detected by synchrotron X-ray absorption spectroscopy Marcelli, Augusto
2000
33 2 p. 234-242
article
18 Parallel-beam X-ray diffractometry using X-ray guide tubes Yamanoi, Toyoko
2000
33 2 p. 389-391
article
19 Performance of a multi-wavelength mono­chromator system for neutron single-crystal and powder diffraction Ahmed, F. U.
2000
33 2 p. 291-295
article
20 Phase transitions in ReO3 studied by high-pressure X-ray diffraction Staun Olsen, J.
2000
33 2 p. 279-284
article
21 Polar potassium rare earth nitrates K2[RE(NO3)5(H2O)2] (RE = La, Ce, Pr and Nd). I. Crystal growth and crystal structures Held, P.
2000
33 2 p. 372-379
article
22 Polar potassium rare earth nitrates K2[RE(NO3)5(H2O)2] (RE = La, Ce, Pr and Nd). II. Linear and nonlinear optical properties Hellwig, H.
2000
33 2 p. 380-386
article
23 Reconstruction of low-resolution three-dimensional density maps from one-dimensional small-angle X-ray solution scattering data for biomolecules Walther, Dirk
2000
33 2 p. 350-363
article
24 Refinement of free structure parameters of a thin film when only one reflection is available Meyer, Dirk C.
2000
33 2 p. 252-258
article
25 ROD: a program for surface X-ray crystallography Vlieg, Elias
2000
33 2 p. 401-405
article
26 SAXS experiments on absolute scale with Kratky systems using water as a secondary standard Orthaber, Doris
2000
33 2 p. 218-225
article
27 ShakePSD: automatic phase solver covering heavy-atom methods and direct methods for Windows PCs Okada, Sachiko
2000
33 2 p. 406-414
article
28 Small-angle X-ray scattering analysis of the periodic tricontinuous network structure of symmetric ABC triblock copolymers Seki, Motohiro
2000
33 2 p. 285-290
article
29 Solving crystal structures in P1: an automated procedure for finding an allowed origin in the correct space group Burla, Maria Cristina
2000
33 2 p. 307-311
article
30 SYMMOL – a program to find the maximum symmetry in an atom cluster: an upgrade Pilati, Tullio
2000
33 2 p. 417
article
31 The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron Ståhl, Kenny
2000
33 2 p. 394-396
article
32 Use of a crystallization robot to set up sitting-drop vapor-diffusion crystallization and in situ crystallization screens Snook, Christopher F.
2000
33 2 p. 344-349
article
33 X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities Velterop, L.
2000
33 2 p. 296-306
article
34 X-ray investigation and discussion of the magnetostriction of Gd3T (T = Ni, Rh, Irx) single crystals Kusz, J.
2000
33 2 p. 213-217
article
35 X-ray study of the light-induced metastable state of a spin-crossover compound Kusz, Joachim
2000
33 2 p. 201-205
article
                             35 results found
 
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