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                             46 results found
no title author magazine year volume issue page(s) type
1 Advanced computing in electron microscopy. By Earl J. Kirkland. Pp. ix + 250 (CD-ROM included). New York: Plenum Press, 1998. Price: US $72.50. ISBN 0-306-45936-1. Dorset, Douglas L.
1999
32 2 p. 378-379
article
2 A new Cu Kα2-elimination algorithm Dong, C.
1999
32 2 p. 168-173
article
3 A strengthened zero-scattering-alloy pressure cylinder for neutron powder diffraction Knorr, K.
1999
32 2 p. 373-374
article
4 Automatic determination of diffuse-peak positions and the centre of a diffraction pattern Wilkinson, S. J.
1999
32 2 p. 332-335
article
5 AXES1.9: new tools for estimation of crystallite size and shape by Williamson–Hall analysis Mändar, Hugo
1999
32 2 p. 345-350
article
6 Combination of energy minimizations and rigid-body Rietveld refinement: the structure of 2,5-dihydroxybenzo[de]benzo[4,5]imidazo[2,1-a]isoquinolin-7-one Schmidt, Martin U.
1999
32 2 p. 178-186
article
7 Correction of diffraction optics and P–V–T determination using thermoelastic equations of state of multiple phases Zhao, Yusheng
1999
32 2 p. 218-225
article
8 Crystalline and microstructure study of the AlN–Al2O3 section in the Al–N–O system. II. ϕ′- and δ-AlON spinel phases Tabary, P.
1999
32 2 p. 253-272
article
9 Crystalline and microstructure study of the AlN–Al2O3 section in the Al–N–O system. I. Polytypes and γ-AlON spinel phase Tabary, P.
1999
32 2 p. 241-252
article
10 Crystallographica Search-Match 1999
32 2 p. 379-380
article
11 Crystallographic CourseWare Kastner, M. E.
1999
32 2 p. 327-331
article
12 Crystal structures and voids in diesel waxes Gerson, A. R.
1999
32 2 p. 296-299
article
13 Diffuse X-ray scattering by 2,3-dimethylnaphthalene Schreier, R.
1999
32 2 p. 309-321
article
14 Disperse systems. By Makoto Takeo, Pp. xi + 317. Weinheim: Wiley-VCH Verlag GmbH, 1999. Price £85.00. ISBN 3-527-29458-9. 1999
32 2 p. 379
article
15 Effect of pressure on phase transitions in K1−xNaxMnF3 (x = 0.04) Åsbrink, S.
1999
32 2 p. 174-177
article
16 EXPO: a program for full powder pattern decomposition and crystal structure solution Altomare, Angela
1999
32 2 p. 339-340
article
17 FINDNCS: a program to detect non-crystallographic symmetries in protein crystals from heavy-atom sites Lu, Guoguang
1999
32 2 p. 365-368
article
18 Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantation d'Acapito, Francesco
1999
32 2 p. 234-240
article
19 Group III nitride semiconductor compounds. Physics and applications. Edited by Bernard Gill. New York: Oxford University Press, 1998. Pp. xvii + 470. Price US $145.00. ISBN 0-19-850159-5. 1999
32 2 p. 379
article
20 1999 ICDD Crystallography Scholarship Recipients are Announced 1999
32 2 p. 377-378
article
21 Influence of miscut on crystal truncation rod scattering Munkholm, A.
1999
32 2 p. 143-153
article
22 Investigation of particle size distribution and aggregate structure of various ferrofluids by small-angle scattering experiments Eberbeck, Dietmar
1999
32 2 p. 273-280
article
23 Java applets for crystallography Weber, S.
1999
32 2 p. 375
article
24 LAYER – a computer program for the graphic display of intensity data as simulated precession photographs Barbour, Leonard J.
1999
32 2 p. 351-352
article
25 Making the most of commercial sparse-matrix protein crystallization screening kits Albert, Armando
1999
32 2 p. 336-338
article
26 MESO – a program to convert X-ray diffraction data from angular to reciprocal space Locherer, K. R.
1999
32 2 p. 362-364
article
27 Morphological characterization of ion-sputtered C–Ag, C/C–Ag and Ag/C films by GISAXS Babonneau, D.
1999
32 2 p. 226-233
article
28 PATTERN: a precession simulation program for displaying reciprocal-space reflection data Lu, Guoguang
1999
32 2 p. 375-376
article
29 Phenomenological model of anisotropic peak broadening in powder diffraction Stephens, Peter W.
1999
32 2 p. 281-289
article
30 Polycapillary X-ray optics for microdiffraction MacDonald, C. A.
1999
32 2 p. 160-167
article
31 Portable xenon pressure chamber 1999
32 2 p. 379
article
32 Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experiments Laaziri, Khalid
1999
32 2 p. 322-326
article
33 Scanning probe microscopy of polymers. (ACS Symposium Series 694). Edited by B. D. Ratner and V. V. Tsukruk. New York: Oxford University Press, 1998. Pp. xii + 367. Price US $125.00. ISBN 0-8412-3562-7. 1999
32 2 p. 379
article
34 Secondary extinction in textured films Yamakov, V.
1999
32 2 p. 300-308
article
35 SECTION – a computer program for the graphic display of cross sections through a unit cell Barbour, Leonard J.
1999
32 2 p. 353-354
article
36 Small-angle scattering of interacting particles. II. Generalized indirect Fourier transformation under consideration of the effective structure factor for polydisperse systems Weyerich, B.
1999
32 2 p. 197-209
article
37 Synchrotron radiation topographic observation of KTiOPO4 crystals under an electric field Jiang, S. S.
1999
32 2 p. 187-192
article
38 Tcl/Tk-based programs. III. CRITXPL: graphical analysis of the X-PLOR refinement log files Urzhumtseva, L. M.
1999
32 2 p. 376-377
article
39 The dislocation model of strain anisotropy in whole powder-pattern fitting: the case of an Li–Mn cubic spinel Ungár, T.
1999
32 2 p. 290-295
article
40 Topological analysis of experimental electron densities Souhassou, Mohamed
1999
32 2 p. 210-217
article
41 TOPOS3.1 – program package for multipurpose geometrical and topological analysis of crystal structures Blatov, V. A.
1999
32 2 p. 377
article
42 Towards general diffractometry. II. Unrestricted normal-beam equatorial geometry Dera, Przemysław
1999
32 2 p. 193-196
article
43 UMWEG-98: a program for calculation and graphical representation of multiple diffraction patterns Rossmanith, Elisabeth
1999
32 2 p. 355-361
article
44 VALMAP2.0: contour maps using the bond-valence-sum method González-Platas, Javier
1999
32 2 p. 341-344
article
45 White-beam topography of Rayleigh waves: a numerical study Mocella, V.
1999
32 2 p. 154-159
article
46 X-ray design constraints for in situ electrochemical cells: importance of window material, electrolyte and X-ray wavelength Nahlé, A. H.
1999
32 2 p. 369-372
article
                             46 results found
 
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