nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Ba6CoNb9O30 and Ba6FeNb9O30: Two New Tungsten-Bronze-Type Ferroelectrics. Centrosymmetry of Ba5.2K0.8U2.4Nb7.6O30 at 300 K
|
Foster, M. C. |
|
1997 |
30 |
4 |
p. 495-501 |
artikel |
2 |
λ/2 Contamination in charge-coupled-device area-detector data
|
Kirschbaum, K. |
|
1997 |
30 |
4 |
p. 514-516 |
artikel |
3 |
Crystallization in a chamber furnace
|
Cabrić, B. |
|
1997 |
30 |
4 |
p. 512 |
artikel |
4 |
Crystallographers
|
|
|
1997 |
30 |
4 |
p. 526 |
artikel |
5 |
Diffraction elastic constants of a cubic polycrystal
|
de Wit, R. |
|
1997 |
30 |
4 |
p. 510-511 |
artikel |
6 |
Diffraction Peak Displacement in Residual Stress Samples Due to Partial Burial of the Sampling Volume
|
Spooner, S. |
|
1997 |
30 |
4 |
p. 449-455 |
artikel |
7 |
Equipment for controlling nucleation and tailoring the size of solution-grown single crystals
|
König, O. |
|
1997 |
30 |
4 |
p. 507-509 |
artikel |
8 |
Freeze-Trapping Isomorphous Xenon Derivatives of Protein Crystals
|
Sauer, O. |
|
1997 |
30 |
4 |
p. 476-486 |
artikel |
9 |
New Commercial Products
|
|
|
1997 |
30 |
4 |
p. 526 |
artikel |
10 |
Outlier Treatment in Data Merging
|
Blessing, R. H. |
|
1997 |
30 |
4 |
p. 421-426 |
artikel |
11 |
Quantitative texture analysis by Rietveld refinement
|
Von Dreele, R. B. |
|
1997 |
30 |
4 |
p. 517-525 |
artikel |
12 |
Quantitative Texture Analysis from X-ray Diffraction Spectra
|
Wang, Y. D. |
|
1997 |
30 |
4 |
p. 443-448 |
artikel |
13 |
Simple device for mounting crystals for single-crystal diffractometry
|
Vochten, R. |
|
1997 |
30 |
4 |
p. 513 |
artikel |
14 |
Small-Angle Scattering of Interacting Particles. I. Basic Principles of a Global Evaluation Technique
|
Brunner-Popela, J. |
|
1997 |
30 |
4 |
p. 431-442 |
artikel |
15 |
Statistical Analysis and Modelling of Crystallization Outcomes
|
Sedzik, J. |
|
1997 |
30 |
4 |
p. 502-506 |
artikel |
16 |
The Quantification of Different Forms of Cristobalite in Devitrified Alumino-Silicate Ceramic Fibres
|
Butler, M. A. |
|
1997 |
30 |
4 |
p. 467-475 |
artikel |
17 |
The π/2 Side-Reflection Laue Technique and the New Chart
|
Park, Y.-H. |
|
1997 |
30 |
4 |
p. 456-460 |
artikel |
18 |
The Use of Quartz as an Internal Pressure Standard in High-Pressure Crystallography
|
Angel, R. J. |
|
1997 |
30 |
4 |
p. 461-466 |
artikel |
19 |
The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis
|
Sánchez-Bajo, F. |
|
1997 |
30 |
4 |
p. 427-430 |
artikel |
20 |
Two-Dimensional Small-Angle X-ray Scattering Investigation of Stretched Borosilicate Glasses
|
Polizzi, S. |
|
1997 |
30 |
4 |
p. 487-494 |
artikel |