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                             18 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A computer program to derive (3+1)-dimensional symmetry operations from two-line symbols Fu, Z.-Q.
1997
30 1 p. 73-78
artikel
2 Advances in Texture Analysis from Diffraction Spectra Matthies, S.
1997
30 1 p. 31-42
artikel
3 A High-Energy Monochromatic Laue (MonoLaue) X-ray Diffuse Scattering Study of KMnF3 using an Image Plate Gibaud, A.
1997
30 1 p. 16-20
artikel
4 A simple method for making reproducible fibre loops for protein cryocrystallography Sauer, U. H.
1997
30 1 p. 71-72
artikel
5 CIF Applications. VI. CIFLIB: an application program interface to CIF dictionaries and data files Westbrook, J. D.
1997
30 1 p. 79-83
artikel
6 Crystallographers 1997
30 1 p. 86
artikel
7 Determination of Deuterium Incorporation into RNA and Protein Components of the Escherichia Coli Ribosome at Biosynthetic Deuteration by Small-Angle Neutron Scattering Fan, L.
1997
30 1 p. 59-64
artikel
8 Improved Signal-to-Background Ratio in Small-Angle X-ray Scattering Experiments with Synchrotron Radiation using an Evacuated Cell for Solutions Dubuisson, J.-M.
1997
30 1 p. 49-54
artikel
9 KOQUA2.0: a program for simulating divergent-beam diffraction patterns for crystals and quasicrystals Weber, S.
1997
30 1 p. 85-86
artikel
10 Notes for Authors 1997
30 1 p. 1-6
artikel
11 Orientation Analysis of Bulk YBCO from Incomplete Neutron Diffraction Data Chateigner, D.
1997
30 1 p. 43-48
artikel
12 RSD-PLOT: a program for plotting Rietveld refinement data Weber, S.
1997
30 1 p. 84-85
artikel
13 Synchrotron Powder Diffraction using Imaging Plates: Crystal Structure Determination and Rietveld Refinement Norby, P.
1997
30 1 p. 21-30
artikel
14 The ϕ Extent of the Reflection Range in the Oscillation Method According to the Mosaicity-Cap Model Bolotovsky, R.
1997
30 1 p. 65-70
artikel
15 The Monolithic Double-Crystal Spectrometer: Theory and Design Principles Gang, O.
1997
30 1 p. 7-15
artikel
16 UNITCELL: a nonlinear least-squares program for cell-parameter refinement and implementing regression and deletion diagnostics Holland, T. J. B.
1997
30 1 p. 84
artikel
17 Use of R Factors in the Study of the Structural Defects in Phyllosilicates by X-ray Powder Diffraction Taşer, M.
1997
30 1 p. 55-58
artikel
18 XRSV: a program for displaying structures on the PC-AT Weber, S.
1997
30 1 p. 85
artikel
                             18 gevonden resultaten
 
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