| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Commercial Scanner Applied as a Microdensitometer for Gas Electron-Diffraction Photographic Plates
|
Gundersen, S.
|
|
1996
|
29 |
6 |
p. 638-645
|
artikel
|
| 2 |
Admixtures in crystallization by J. Nývly and J. Ulrich
|
|
|
1996
|
29 |
6 |
p. 748
|
artikel
|
| 3 |
A 4He Cryostat for Synchrotron Single-Crystal Diffraction Experiments in the Temperature Range 1.6 to 300 K
|
Brückel, Th.
|
|
1996
|
29 |
6 |
p. 686-691
|
artikel
|
| 4 |
Analysis of Trade-Offs Between Spatial Resolution and Detective Area in Crystallographic Detectors for Use with Large-Unit-Cell Crystals
|
Williams, M. B.
|
|
1996
|
29 |
6 |
p. 717-726
|
artikel
|
| 5 |
A New High-Resolution X-ray Powder Diffractometer Working in the 3–470 K Range for Phase-Transition Analyses
|
Fertey, P.
|
|
1996
|
29 |
6 |
p. 692-699
|
artikel
|
| 6 |
A procedure compatible with X-PLOR for the calculation of electron-density maps weighted using an R-free-likelihood approach
|
Urzhumtsev, A. G.
|
|
1996
|
29 |
6 |
p. 741-744
|
artikel
|
| 7 |
Correlation Effects in Small-Angle Neutron Scattering from Closely Packed Spheres
|
Bertram, W. K.
|
|
1996
|
29 |
6 |
p. 682-685
|
artikel
|
| 8 |
Cross-Section Structure of Cylindrical and Polymer-Like Micelles from Small-Angle Scattering Data. I. Test of Analysis Methods
|
Pedersen, J. S.
|
|
1996
|
29 |
6 |
p. 646-661
|
artikel
|
| 9 |
Crystallographers
|
|
|
1996
|
29 |
6 |
p. 746
|
artikel
|
| 10 |
Derivation of the rotation matrix in general rectilinear systems by means of vector and matrix formalism
|
Stróz, K.
|
|
1996
|
29 |
6 |
p. 736-737
|
artikel
|
| 11 |
Design of an inverted spindle axis for frozen crystal screening and storage
|
Goodwill, K. E.
|
|
1996
|
29 |
6 |
p. 738-740
|
artikel
|
| 12 |
Determination of a Mean Orientation from a Cloud of Orientations. Application to Electron Back-Scattering Pattern Measurements
|
Humbert, M.
|
|
1996
|
29 |
6 |
p. 662-666
|
artikel
|
| 13 |
Electrooptic effects in liquid crystal materials by L. M. Blinov and V. G. Chigrinov
|
|
|
1996
|
29 |
6 |
p. 748
|
artikel
|
| 14 |
Instrument Function in Powder Diffraction
|
Honkimäki, V.
|
|
1996
|
29 |
6 |
p. 617-624
|
artikel
|
| 15 |
Mineral scale formation and inhibition edited by Z. Amjad
|
|
|
1996
|
29 |
6 |
p. 748
|
artikel
|
| 16 |
New Commercial Products
|
|
|
1996
|
29 |
6 |
p. 746
|
artikel
|
| 17 |
Obtaining crystals in a crucible furnace
|
Čabrić, B.
|
|
1996
|
29 |
6 |
p. 745
|
artikel
|
| 18 |
Prices of IUCr journals
|
|
|
1996
|
29 |
6 |
p. 746-748
|
artikel
|
| 19 |
Profile Function of Bragg Reflections in Powder Diffraction
|
Honkimäki, V.
|
|
1996
|
29 |
6 |
p. 625-631
|
artikel
|
| 20 |
Rietveld Refinement using Synchrotron X-ray Powder Diffraction Data Collected in Transmission Geometry using an Imaging-Plate Detector: Application to Standard m-ZrO2
|
Gualtieri, A.
|
|
1996
|
29 |
6 |
p. 707-713
|
artikel
|
| 21 |
Solving Crystal Structures from Powder Data. II. Pseudotranslational Symmetry and Powder-Pattern Decomposition
|
Altomare, A.
|
|
1996
|
29 |
6 |
p. 674-681
|
artikel
|
| 22 |
Solving Crystal Structures from Powder Data. I. The Role of the Prior Information in the Two-Stage Method
|
Altomare, A.
|
|
1996
|
29 |
6 |
p. 667-673
|
artikel
|
| 23 |
Structural Parameters of Multilayers as Deduced from X-ray Specular Reflectivity: Effect of Statistical Thickness Fluctuations
|
Manciu, M.
|
|
1996
|
29 |
6 |
p. 632-637
|
artikel
|
| 24 |
Teaching Diffraction with the Aid of Computer Simulations
|
Neder, R. B.
|
|
1996
|
29 |
6 |
p. 727-735
|
artikel
|
| 25 |
Ultrasonic Measurements of the Elastic Constants and their Temperature Dependence for Nearly Perfect Single Crystals of Potassium Tetrachlorozincate (K2ZnCl4)
|
El Korashy, A.
|
|
1996
|
29 |
6 |
p. 700-706
|
artikel
|
| 26 |
Verification of Protein Structures: Side-Chain Planarity
|
Hooft, R. W. W.
|
|
1996
|
29 |
6 |
p. 714-716
|
artikel
|
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