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                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Absorption Corrections of Powder Diffraction Intensities Recorded in Transmission Geometry Pitschke, W.
1996
29 5 p. 561-567
artikel
2 Analysis of Slit-Smeared Small-Angle Scattering Data from Interacting Systems via Indirect-Transformation Methods Castelletto, V.
1996
29 5 p. 555-560
artikel
3 A New Kösters Prism Interferometer for Simultaneous Determination of Refractive Index and Thermal Expansion of Crystals as a Function of Temperature Womersley, M. N.
1996
29 5 p. 574-583
artikel
4 Application of the Rietveld method in the study of the reaction of formation of Y2BaCuO5 Ferraz, M. C. C.
1996
29 5 p. 588-590
artikel
5 A simple device for studying macromolecular crystals under moderate gas pressures (0.1–10 MPa) Stowell, M. H. B.
1996
29 5 p. 608-613
artikel
6 CIF Applications. V. CIFtbx2: extended tool box for manipulating CIFs Hall, S. R.
1996
29 5 p. 598-603
artikel
7 Defect recognition and image processing in semiconductors 1995 edited by A. R. Mickelson 1996
29 5 p. 616
artikel
8 Design of a new flat sample holder for air-sensitive substances fitting to an Enraf-Nonius FR552 Guinier camera Sing, M.
1996
29 5 p. 607
artikel
9 Distributions of rotation axes for randomly oriented symmetric objects. Erratum Morawiec, A.
1996
29 5 p. 593
artikel
10 Glycerol concentrations required for cryoprotection of 50 typical protein crystallization solutions Garman, E. F.
1996
29 5 p. 584-587
artikel
11 Growth of crystals. Vol. 20. edited by E. I. Givargizov and A. M. Melnikova 1996
29 5 p. 616
artikel
12 In Situ Small-Angle X-ray Scattering Observations of Pt/NaY Catalysts During Processing: Sintering of Pt Brumberger, H.
1996
29 5 p. 526-530
artikel
13 New Commercial Products 1996
29 5 p. 614-616
artikel
14 New Editor-in-Chief of IUCr journals 1996
29 5 p. 614
artikel
15 On the insensitivity of the asymptotic behaviour of small-angle neutron and X-ray scattering data to multiple scattering Monkenbusch, M.
1996
29 5 p. 591-592
artikel
16 Reflection Asymmetric Powder Diffraction with Flat-Plate Sample using a Curved Position-Sensitive Detector (INEL CPS 120) Masson, O.
1996
29 5 p. 540-546
artikel
17 Silicon carbide and related materials 1995 edited by S. Nakashima, H. Matsunami, S. Yoshida and H. Harima 1996
29 5 p. 616
artikel
18 Texture Approximation or Texture Modelling with Components Represented by the von Mises–Fisher Matrix Distribution on SO(3) and the Bingham Distribution on S4++ Schaeben, H.
1996
29 5 p. 516-525
artikel
19 The Resolution Function in Diffuse X-ray Reflectivity de Jeu, W. H.
1996
29 5 p. 511-515
artikel
20 The Use of Small-Angle Scattering and the Maximum-Entropy Method for Shape-Model Determination from Distance-Distribution Functions Müller, J. J.
1996
29 5 p. 547-554
artikel
21 Thin-Film Study using Low-Incidence and Bragg–Brentano Texture Goniometry. Application to Mono- and Bilayers of Al and Al/Fe Tizliouine, A.
1996
29 5 p. 531-539
artikel
22 Two methods of expanding the measurement abilities of a four-circle diffractometer Steinborn, T.
1996
29 5 p. 604-606
artikel
23 Visualization of macromolecular crystal packing using Virtual Reality Modelling Language (VRML) Fu, T. Y.
1996
29 5 p. 594-597
artikel
24 X-ray Moiré Topography on SIMOX Structures Ohler, M.
1996
29 5 p. 568-573
artikel
                             24 gevonden resultaten
 
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