nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A helium-flushed beam tunnel
|
Parkin, S. |
|
1995 |
28 |
2 |
p. 243 |
artikel |
2 |
A Large-Format High-Resolution Area X-ray Detector Based on a Fiber-Optically Bonded Charge-Coupled Device (CCD)
|
Tate, M. W. |
|
1995 |
28 |
2 |
p. 196-205 |
artikel |
3 |
A Monte Carlo Estimate of Crystallite-Size and Microstrain Distribution Functions from X-ray Line Broadening
|
Di Nunzio, P. E. |
|
1995 |
28 |
2 |
p. 146-159 |
artikel |
4 |
A novel device for the recovery of frozen crystals
|
Mancia, F. |
|
1995 |
28 |
2 |
p. 224-225 |
artikel |
5 |
An X-ray Topographic Study of the Paraelectric-to-Ferroelectric Phase Transformation in Nearly Perfect Single Crystals of Ammonium Sulfate
|
Bhat, H. L. |
|
1995 |
28 |
2 |
p. 168-188 |
artikel |
6 |
BREADTH – a program for analyzing diffraction line broadening
|
Balzar, D. |
|
1995 |
28 |
2 |
p. 244-245 |
artikel |
7 |
Crystallographers
|
|
|
1995 |
28 |
2 |
p. 245-246 |
artikel |
8 |
Crystallographic computing 6. A window on modern crystallography. (IUCr Crystallographic Symposia No. 6) edited by H. D. Flack, L. Párkányi and K. Simon
|
|
|
1995 |
28 |
2 |
p. 246 |
artikel |
9 |
Determination of Liquid Structures of the Primary Alcohols Methanol, Ethanol, 1-Propanol, 1-Butanol and 1-Octanol by X-ray Scattering
|
Serimaa, R. |
|
1995 |
28 |
2 |
p. 189-195 |
artikel |
10 |
Determination of the Gyration Tensor Components of Ammonium Rochelle Salt
|
Brożek, Z. |
|
1995 |
28 |
2 |
p. 78-85 |
artikel |
11 |
Determining the Degree of Crystallinity in Semicrystalline Materials by means of the Rietveld Analysis
|
Riello, P. |
|
1995 |
28 |
2 |
p. 121-126 |
artikel |
12 |
DS – a 3D graphics simulation program for single-crystal diffractometry
|
Zheng, C. |
|
1995 |
28 |
2 |
p. 225-227 |
artikel |
13 |
FHKL – a program to compute rocking curves and crystallographic data of interest for the dynamical theory of X-rays
|
Soyer, A. |
|
1995 |
28 |
2 |
p. 244 |
artikel |
14 |
Instrumental Smearing Effects in Radially Symmetric Small-Angle Neutron Scattering by Numerical and Analytical Methods
|
Barker, J. G. |
|
1995 |
28 |
2 |
p. 105-114 |
artikel |
15 |
LAUEGEN, an X-windows-based program for the processing of Laue diffraction data
|
Campbell, J. W. |
|
1995 |
28 |
2 |
p. 228-236 |
artikel |
16 |
Modern crystallography, Vol. 1, Fundamentals of crystals. Symmetry, and methods of structural crystallography by B. K. Vainshtein
|
|
|
1995 |
28 |
2 |
p. 246 |
artikel |
17 |
New Commercial Products
|
|
|
1995 |
28 |
2 |
p. 246 |
artikel |
18 |
Preferred-Orientation Correction and Normalization Procedure for Ab Initio Structure Determination from Powder Data
|
Peschar, R. |
|
1995 |
28 |
2 |
p. 127-140 |
artikel |
19 |
Re-investigation of Yttria–Tetragonal Zirconia Polycrystal (Y-TZP) by Neutron Powder Diffraction – a Cautionary Tale
|
Argyriou, D. N. |
|
1995 |
28 |
2 |
p. 206-208 |
artikel |
20 |
Structural Parameters of Multilayers from X-ray Reflectivity: an Easy-to-Handle Approach
|
Manciu, M. |
|
1995 |
28 |
2 |
p. 160-167 |
artikel |
21 |
Structural Study of Crystalline Approximants of the Al–Cu–Fe–Cr Decagonal Quasicrystal
|
Li, X. Z. |
|
1995 |
28 |
2 |
p. 96-104 |
artikel |
22 |
The multi-drop approach: more efficient screening of crystallization conditions
|
Bruns, C. M. |
|
1995 |
28 |
2 |
p. 242-243 |
artikel |
23 |
The Number of Reflections of a Neutron Beam Transmitted by a Capillary Fiber
|
Mildner, D. F. R. |
|
1995 |
28 |
2 |
p. 69-77 |
artikel |
24 |
The `Seed-Skewness' Method for Integration of Peaks on Imaging Plates
|
Bolotovsky, R. |
|
1995 |
28 |
2 |
p. 86-95 |
artikel |
25 |
The Three-Dimensional Resolution Function for Small-Angle Scattering and Laue Geometries
|
Harris, P. |
|
1995 |
28 |
2 |
p. 209-222 |
artikel |
26 |
Three-dimensional periodicity and inversion axes in crystals
|
Sharma, B. D. |
|
1995 |
28 |
2 |
p. 223 |
artikel |
27 |
Vacancy Ordering in γ-Fe2O3: Synchrotron X-ray Powder Diffraction and High-Resolution Electron Microscopy Studies
|
Shmakov, A. N. |
|
1995 |
28 |
2 |
p. 141-145 |
artikel |
28 |
XDLVIEW, an X-windows-based toolkit for crystallographic and other applications
|
Campbell, J. W. |
|
1995 |
28 |
2 |
p. 236-242 |
artikel |
29 |
X-ray Rietveld Analysis with a Physically Based Background
|
Riello, P. |
|
1995 |
28 |
2 |
p. 115-120 |
artikel |