| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A measuring procedure for single-crystal diffraction using synchrotron radiation
|
Wendschuh-Josties, M.
|
|
1989
|
22 |
4 |
p. 382-383
|
artikel
|
| 2 |
An X-ray determination of the thermal expansion of α-phase Cu–Si alloys at high temperature
|
Pradhan, S. K.
|
|
1989
|
22 |
4 |
p. 380-381
|
artikel
|
| 3 |
An X-ray monochromator system using successive reflection and its application to measurements of diffraction curves of annealed GaAs wafers
|
Fukumori, T.
|
|
1989
|
22 |
4 |
p. 334-339
|
artikel
|
| 4 |
A procedure for the selection and transferring of crystals at low temperatures to diffractometers
|
Boese, R.
|
|
1989
|
22 |
4 |
p. 394-395
|
artikel
|
| 5 |
A simple capillary-specimen attachment for parafocusing powder diffractometers
|
Wood, I. G.
|
|
1989
|
22 |
4 |
p. 395-396
|
artikel
|
| 6 |
A simple capillary vapor diffusion apparatus for surveying macromolecular crystallization conditions
|
Luft, J.
|
|
1989
|
22 |
4 |
p. 396
|
artikel
|
| 7 |
Crystallization of low-molecular-weight organic compounds for X-ray crystallography
|
van der Sluis, P.
|
|
1989
|
22 |
4 |
p. 340-344
|
artikel
|
| 8 |
Crystallographers
|
|
|
1989
|
22 |
4 |
p. 398
|
artikel
|
| 9 |
Diffraction from quasi-crystals and disordered twinned aggregates
|
Welberry, T. R.
|
|
1989
|
22 |
4 |
p. 308-314
|
artikel
|
| 10 |
DREADD – data reduction and error analysis for single-crystal diffractometer data
|
Blessing, R. H.
|
|
1989
|
22 |
4 |
p. 396-397
|
artikel
|
| 11 |
Effect of stress from the glue on single-crystal X-ray intensities at high or low temperatures
|
Argoud, R.
|
|
1989
|
22 |
4 |
p. 378-380
|
artikel
|
| 12 |
Electronically focused time-of-flight powder diffractometers at the intense pulsed neutron source
|
Jorgensen, J. D.
|
|
1989
|
22 |
4 |
p. 321-333
|
artikel
|
| 13 |
High-pressure single-crystal X-ray diffraction studies of MoO3. I. Lattice parameters up to 7.4 GPa. Erratum
|
Åsbrink, S.
|
|
1989
|
22 |
4 |
p. 380
|
artikel
|
| 14 |
LAUE – a program for high-precision orientation of crystals using the Laue method
|
Christiansen, G.
|
|
1989
|
22 |
4 |
p. 397
|
artikel
|
| 15 |
Modeling of Bragg intensity profiles. 1. Allowance for crystal mosaicity
|
Laktionov, A. V.
|
|
1989
|
22 |
4 |
p. 315-320
|
artikel
|
| 16 |
New Commercial Products
|
|
|
1989
|
22 |
4 |
p. 398-400
|
artikel
|
| 17 |
NRCVAX – an interactive program system for structure analysis
|
Gabe, E. J.
|
|
1989
|
22 |
4 |
p. 384-387
|
artikel
|
| 18 |
Polarized neutron scattering by polarized protons of bovine serum albumin in deuterated solvent
|
Knop, W.
|
|
1989
|
22 |
4 |
p. 352-362
|
artikel
|
| 19 |
RAD, a program for analysis of X-ray diffraction data from amorphous materials for personal computers
|
Petkov, V.
|
|
1989
|
22 |
4 |
p. 387-389
|
artikel
|
| 20 |
SIR88 – a direct-methods program for the automatic solution of crystal structures
|
Burla, M. C.
|
|
1989
|
22 |
4 |
p. 389-393
|
artikel
|
| 21 |
Some consideration of data corrections for a SAXS system employing a linear PSPC
|
Li, H.
|
|
1989
|
22 |
4 |
p. 376-378
|
artikel
|
| 22 |
Stress distribution and lattice curvature determinations in multilayer structures by simulation of X-ray rocking curves
|
Cembali, F.
|
|
1989
|
22 |
4 |
p. 345-351
|
artikel
|
| 23 |
The determination of crystal size and disorder from X-ray diffraction photographs of polymer fibres. 1. The accuracy of determination of Fourier coefficients of the intensity profile of a reflection
|
Somashekar, R.
|
|
1989
|
22 |
4 |
p. 363-371
|
artikel
|
| 24 |
X-ray diffraction line broadening due to dislocations in non-cubic crystalline materials. III. Experimental results for plastically deformed zirconium
|
Kužel, R.
|
|
1989
|
22 |
4 |
p. 299-307
|
artikel
|
| 25 |
X-ray diffractometry of AlGaAs/GaAs superlattices and GaAs in the temperature range 5–295 K
|
Clec'h, G.
|
|
1989
|
22 |
4 |
p. 372-375
|
artikel
|
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