| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A comparison of the merits of isotopic substitution in neutron small-angle scattering and anomalous X-ray scattering for the evaluation of partial structure functions in a ternary alloy
|
Simon, J. P.
|
|
1985
|
18 |
4 |
p. 230-236
|
article
|
| 2 |
Calculation of intensity distribution in the case of oblique texture electron diffraction
|
Plançon, A.
|
|
1985
|
18 |
4 |
p. 191-196
|
article
|
| 3 |
Crystallographers
|
|
|
1985
|
18 |
4 |
p. 264
|
article
|
| 4 |
Current topics in materials sceince. Vol. 10 edited by E. Kaldis
|
Bottani, C. E.
|
|
1985
|
18 |
4 |
p. 265-266
|
article
|
| 5 |
Electron optical study of rutile
|
Creek, R. C.
|
|
1985
|
18 |
4 |
p. 197-204
|
article
|
| 6 |
GENEV, GENSIN, GENTAN: phase determination within the XTAL system
|
Hall, S. R.
|
|
1985
|
18 |
4 |
p. 263-264
|
article
|
| 7 |
Industrial crystallization edited by Grootscholten Jančić P. A. M.
|
Mullin, J. W.
|
|
1985
|
18 |
4 |
p. 264-265
|
article
|
| 8 |
Industrial crystallization 84 edited by S. J. Jančić and E. J. de Jong
|
Mullin, J. W.
|
|
1985
|
18 |
4 |
p. 265
|
article
|
| 9 |
LASIP: a liquid and amorphous structure investigation package
|
Lecante, P.
|
|
1985
|
18 |
4 |
p. 214-218
|
article
|
| 10 |
Lissage d'un profil de raie de diffraction pour analyse de Fourier
|
Bourniquel, B.
|
|
1985
|
18 |
4 |
p. 248-252
|
article
|
| 11 |
Parameterizations of scattering intensities and values of the angularities and of the interphase surfaces for three-component amorphous samples
|
Ciccariello, S.
|
|
1985
|
18 |
4 |
p. 219-229
|
article
|
| 12 |
Particle size distribution from small-angle X-ray scattering data
|
Walter, G.
|
|
1985
|
18 |
4 |
p. 205-213
|
article
|
| 13 |
Some geometrical problems related to the rotation camera. I. X-ray diffraction pattern generation
|
Taupin, D.
|
|
1985
|
18 |
4 |
p. 253-257
|
article
|
| 14 |
STRUPLO84, a Fortran plot program for crystal structure illustrations in polyhedral representation
|
Fischer, R. X.
|
|
1985
|
18 |
4 |
p. 258-262
|
article
|
| 15 |
The model resolution function – a technique for estimating the quality of approximation of particles by models in small-angle X-ray or neutron scattering
|
Müller, J. J.
|
|
1985
|
18 |
4 |
p. 241-247
|
article
|
| 16 |
The structural chirality and optical activity of α-LiIO3
|
Stadnicka, K.
|
|
1985
|
18 |
4 |
p. 237-240
|
article
|
| 17 |
XTAL: a program system for crystallographic calculations
|
Stewart, J. M.
|
|
1985
|
18 |
4 |
p. 263
|
article
|
Journal description