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                             26 results found
no title author magazine year volume issue page(s) type
1 A focusing X-ray camera for recording low-angle diffraction from small specimens Milch, J. R.
1983
16 2 p. 198-203
article
2 A method for the interpretation of the Warren–Averbach mean-squared strains and its application to recovery in aluminium Turunen, M. J.
1983
16 2 p. 176-182
article
3 An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation Phizackerley, R. P.
1983
16 2 p. 220-232
article
4 A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. II. Application to triglycine–sulphuric acid (NH2CH2CO2H)3.H2SO4 Kobayashi, J.
1983
16 2 p. 212-219
article
5 A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction Kobayashi, J.
1983
16 2 p. 204-211
article
6 An interactive program for the interpretation and simulation of Laue patterns Laughier, J.
1983
16 2 p. 281-283
article
7 A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis Louër, D.
1983
16 2 p. 183-191
article
8 A rapid and precise method of measuring Kendrew-model coordinates with theodolites Lebioda, L.
1983
16 2 p. 270-273
article
9 Crystal data for bis(η5-tert-butylcyclopentadienyl)hafnium(IV) dihydride dimer, [(η5-t-BuC5H4)2HfH(μ-H)]2 Laarif, A.
1983
16 2 p. 277
article
10 Crystal data for 2-(4-methyl-2-pyridyliminomethyl)phenol and 2-(4,6-dimethyl-2-pyridyliminomethyl)phenol Escobar, C.
1983
16 2 p. 276
article
11 Crystal data for nickel and cadmium α-l-alaninates Démaret, A.
1983
16 2 p. 279-281
article
12 Crystallographers 1983
16 2 p. 284
article
13 Difference thermal analysis of crystalline solids by the use of energy-dispersive X-ray diffraction Eisenreich, N.
1983
16 2 p. 259-263
article
14 Double hexagonal superstructure of Au–Mg alloy containing 20 at.% Mg studied by high-voltage high-resolution electron microscopy Shindo, D.
1983
16 2 p. 233-238
article
15 International Tables for Crystallography 1983
16 2 p. 284
article
16 Kristallstrukturdaten von PdPb0.2As0.8(m) Ellner, M.
1983
16 2 p. 277-278
article
17 Microdiffraction from stacking faults and twin boundaries in F.c.c. crystals Zhu, J.
1983
16 2 p. 171-175
article
18 Oscillation camera data processing. 3. General diffraction spot size, shape and energy profile: formalism for polychromatic diffraction experiments with monochromatized synchrotron X-radiation from a singly bent triangular monochromator Greenhough, T. J.
1983
16 2 p. 242-250
article
19 Reciprocal-lattice-compatible representation of linear position-sensitive detector output McL Mathieson, A.
1983
16 2 p. 257-258
article
20 Routine recording of diffuse scattering from disordered molecular crystals Welberry, T. R.
1983
16 2 p. 192-197
article
21 The determination of the crystallinity in glass-ceramic materials by the method of Ruland Vonk, C. G.
1983
16 2 p. 274-276
article
22 The estimation of standard deviations in powder diffraction Rietveld refinements Scott, H. G.
1983
16 2 p. 159-163
article
23 The structure of Na2UCl6 and Li2UCl6 from multiphase powder neutron profile refinement Bendall, P. J.
1983
16 2 p. 164-170
article
24 X-ray diffraction studies on the arrangement of water molecules in a smectite. I.Homogeneous two-water-layer Na-beidellite Brahim, J. B.
1983
16 2 p. 264-269
article
25 X-ray guide tube for diffraction experiments Nakazawa, H.
1983
16 2 p. 239-241
article
26 X-ray measurement of the static Debye–Waller factor of NbHx Behr, H.
1983
16 2 p. 251-256
article
                             26 results found
 
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