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                             26 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Addenda to the optimization of quantitative X-ray diffraction analysis Szabó, P.
1982
15 4 p. 449-451
artikel
2 A goniometer for large single crystals Shaham, H.
1982
15 4 p. 469
artikel
3 A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon George, A.
1982
15 4 p. 412-416
artikel
4 A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10–300 K Allen, S.
1982
15 4 p. 382-387
artikel
5 Bibliography of Mathematical Crystallography 1982
15 4 p. 470
artikel
6 Computer program for the derivation of symmetry operations from the space-group symbols Burzlaff, H.
1982
15 4 p. 464-467
artikel
7 Crystallographers 1982
15 4 p. 469-470
artikel
8 Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography Chaudhuri, J.
1982
15 4 p. 423-429
artikel
9 Etude de la solution solide (CH3)4N.Mn1−xCuxCl3 (x=0–0,5) Cheikh-Rouhou, A.
1982
15 4 p. 462-463
artikel
10 Interactive computer display and analysis of small-molecule crystal structures Swanson, S. M.
1982
15 4 p. 439-442
artikel
11 Interactive dynamic molecular display Nix, C. L.
1982
15 4 p. 467-468
artikel
12 Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method Abad, E.
1982
15 4 p. 399-401
artikel
13 Noise level and resolution effects in EXAFS spectra Morrison, T. I.
1982
15 4 p. 388-390
artikel
14 Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss Wijetunge, M. H. C.
1982
15 4 p. 470
artikel
15 On the topography of chemically etched (00) surfaces of ZnO Cope, J. O.
1982
15 4 p. 396-398
artikel
16 Precise lattice-constant determinations using measured beam and crystal tilts Nemiroff, M.
1982
15 4 p. 375-377
artikel
17 Profile shape functions in Rietveld refinements Young, R. A.
1982
15 4 p. 430-438
artikel
18 Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor Borso, C. S.
1982
15 4 p. 443-448
artikel
19 Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry Arzi, E.
1982
15 4 p. 402-405
artikel
20 Structural ordering in amorphous TbFe2 and YFe2 D'Antonio, P.
1982
15 4 p. 452-460
artikel
21 Sur l'origine des canaux dans les cristaux Scandale, E.
1982
15 4 p. 417-422
artikel
22 The cation-atom distribution in a (Cr, Fe, Al, Mg)3O4 spinel as revealed from the channelling effect in electron-induced X-ray emission Taftø, J.
1982
15 4 p. 378-381
artikel
23 The evaluation of crystal perfection by means of the asymmetric Bragg reflections Wołcyrz, M.
1982
15 4 p. 406-411
artikel
24 The Rietveld method in neutron and X-ray powder diffraction Albinati, A.
1982
15 4 p. 361-374
artikel
25 Thermal expansion of α-HgI2 Gauthier, S.
1982
15 4 p. 461-462
artikel
26 Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies Gastaldi, J.
1982
15 4 p. 391-395
artikel
                             26 gevonden resultaten
 
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