nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Addenda to the optimization of quantitative X-ray diffraction analysis
|
Szabó, P. |
|
1982 |
15 |
4 |
p. 449-451 |
artikel |
2 |
A goniometer for large single crystals
|
Shaham, H. |
|
1982 |
15 |
4 |
p. 469 |
artikel |
3 |
A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon
|
George, A. |
|
1982 |
15 |
4 |
p. 412-416 |
artikel |
4 |
A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10–300 K
|
Allen, S. |
|
1982 |
15 |
4 |
p. 382-387 |
artikel |
5 |
Bibliography of Mathematical Crystallography
|
|
|
1982 |
15 |
4 |
p. 470 |
artikel |
6 |
Computer program for the derivation of symmetry operations from the space-group symbols
|
Burzlaff, H. |
|
1982 |
15 |
4 |
p. 464-467 |
artikel |
7 |
Crystallographers
|
|
|
1982 |
15 |
4 |
p. 469-470 |
artikel |
8 |
Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography
|
Chaudhuri, J. |
|
1982 |
15 |
4 |
p. 423-429 |
artikel |
9 |
Etude de la solution solide (CH3)4N.Mn1−xCuxCl3 (x=0–0,5)
|
Cheikh-Rouhou, A. |
|
1982 |
15 |
4 |
p. 462-463 |
artikel |
10 |
Interactive computer display and analysis of small-molecule crystal structures
|
Swanson, S. M. |
|
1982 |
15 |
4 |
p. 439-442 |
artikel |
11 |
Interactive dynamic molecular display
|
Nix, C. L. |
|
1982 |
15 |
4 |
p. 467-468 |
artikel |
12 |
Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method
|
Abad, E. |
|
1982 |
15 |
4 |
p. 399-401 |
artikel |
13 |
Noise level and resolution effects in EXAFS spectra
|
Morrison, T. I. |
|
1982 |
15 |
4 |
p. 388-390 |
artikel |
14 |
Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss
|
Wijetunge, M. H. C. |
|
1982 |
15 |
4 |
p. 470 |
artikel |
15 |
On the topography of chemically etched (00) surfaces of ZnO
|
Cope, J. O. |
|
1982 |
15 |
4 |
p. 396-398 |
artikel |
16 |
Precise lattice-constant determinations using measured beam and crystal tilts
|
Nemiroff, M. |
|
1982 |
15 |
4 |
p. 375-377 |
artikel |
17 |
Profile shape functions in Rietveld refinements
|
Young, R. A. |
|
1982 |
15 |
4 |
p. 430-438 |
artikel |
18 |
Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor
|
Borso, C. S. |
|
1982 |
15 |
4 |
p. 443-448 |
artikel |
19 |
Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry
|
Arzi, E. |
|
1982 |
15 |
4 |
p. 402-405 |
artikel |
20 |
Structural ordering in amorphous TbFe2 and YFe2
|
D'Antonio, P. |
|
1982 |
15 |
4 |
p. 452-460 |
artikel |
21 |
Sur l'origine des canaux dans les cristaux
|
Scandale, E. |
|
1982 |
15 |
4 |
p. 417-422 |
artikel |
22 |
The cation-atom distribution in a (Cr, Fe, Al, Mg)3O4 spinel as revealed from the channelling effect in electron-induced X-ray emission
|
Taftø, J. |
|
1982 |
15 |
4 |
p. 378-381 |
artikel |
23 |
The evaluation of crystal perfection by means of the asymmetric Bragg reflections
|
Wołcyrz, M. |
|
1982 |
15 |
4 |
p. 406-411 |
artikel |
24 |
The Rietveld method in neutron and X-ray powder diffraction
|
Albinati, A. |
|
1982 |
15 |
4 |
p. 361-374 |
artikel |
25 |
Thermal expansion of α-HgI2
|
Gauthier, S. |
|
1982 |
15 |
4 |
p. 461-462 |
artikel |
26 |
Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies
|
Gastaldi, J. |
|
1982 |
15 |
4 |
p. 391-395 |
artikel |