| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A low-temperature X-ray Weissenberg goniometer with closed-cycle cooling to about 28 K
|
Adlhart, W.
|
|
1982
|
15 |
2 |
p. 241-244
|
artikel
|
| 2 |
An N-pattern display for an SSD X-ray diffractometer
|
Hosoya, S.
|
|
1982
|
15 |
2 |
p. 232-235
|
artikel
|
| 3 |
An X-ray camera for single-crystal studies at high temperatures under controlled atmosphere
|
Aldhart, W.
|
|
1982
|
15 |
2 |
p. 236-240
|
artikel
|
| 4 |
A structural study of amorphous Fe4.7Co70.3Si15B10
|
Williams, D. E. G.
|
|
1982
|
15 |
2 |
p. 206-210
|
artikel
|
| 5 |
A uniaxial stress apparatus for single-crystal X-ray diffraction on a four-circle diffractometer: application to silicon and diamond
|
d'Armour, H.
|
|
1982
|
15 |
2 |
p. 148-153
|
artikel
|
| 6 |
Commission on Journals. Chemical Formulae and Nomenclature
|
|
|
1982
|
15 |
2 |
p. 249
|
artikel
|
| 7 |
Commission on Journals. Decisions taken at meetings in Ottawa, August 1981
|
|
|
1982
|
15 |
2 |
p. 249-250
|
artikel
|
| 8 |
Crystal cooling for protein crystallography with synchrotron radiation
|
Bartunik, H. D.
|
|
1982
|
15 |
2 |
p. 227-231
|
artikel
|
| 9 |
Crystal data for NH(CH3)3GeCl3
|
Möller, A.
|
|
1982
|
15 |
2 |
p. 247-248
|
artikel
|
| 10 |
Crystal data for two cis-o,o'-azodioxytoluene modifications
|
Azoulay, M.
|
|
1982
|
15 |
2 |
p. 245-246
|
artikel
|
| 11 |
Crystallographers
|
|
|
1982
|
15 |
2 |
p. 248-249
|
artikel
|
| 12 |
Crystallographic computing on an array processor
|
Furey, W.
|
|
1982
|
15 |
2 |
p. 160-166
|
artikel
|
| 13 |
Crystal powder data of MoGa5(CuS2)0.0556
|
Horyn, R.
|
|
1982
|
15 |
2 |
p. 248
|
artikel
|
| 14 |
Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection
|
Cousins, C. S. G.
|
|
1982
|
15 |
2 |
p. 154-159
|
artikel
|
| 15 |
Determination of the correlation function directly from slit-smeared small-angle X-ray scattering curves
|
Gerber, T.
|
|
1982
|
15 |
2 |
p. 143-147
|
artikel
|
| 16 |
Examination of errors in the determination of phase boundary thickness by small-angle X-ray scattering
|
Roe, R.-J.
|
|
1982
|
15 |
2 |
p. 182-189
|
artikel
|
| 17 |
Experimental and computed HREM images of the structure and defects in gadolinium silicate
|
Nissen, H.-U.
|
|
1982
|
15 |
2 |
p. 211-215
|
artikel
|
| 18 |
Fifty Years of Electron Diffraction
|
|
|
1982
|
15 |
2 |
p. 250
|
artikel
|
| 19 |
Lattice modulation in the hexagonal-type antiphase domain structure of Au–33at.%Cd alloy
|
Watanbe, Y.
|
|
1982
|
15 |
2 |
p. 174-181
|
artikel
|
| 20 |
Laue photography of fine crystalline particles
|
Steinberger, I. T.
|
|
1982
|
15 |
2 |
p. 216-226
|
artikel
|
| 21 |
Molecular Structures and Dimensions
|
|
|
1982
|
15 |
2 |
p. 250
|
artikel
|
| 22 |
Profile separation in complex powder patterns
|
Naidu, S. V. N.
|
|
1982
|
15 |
2 |
p. 190-198
|
artikel
|
| 23 |
Seventh Euopean Crystallographic Meeting. Book of Abstracts
|
|
|
1982
|
15 |
2 |
p. 250
|
artikel
|
| 24 |
Structure Reports
|
|
|
1982
|
15 |
2 |
p. 250
|
artikel
|
| 25 |
The Cambridge Crystallography Subroutine Library
|
Matthewman, J. C.
|
|
1982
|
15 |
2 |
p. 167-173
|
artikel
|
| 26 |
Two new SiC polytypes belonging to the [(44)n43]3 structure family
|
Kuo, C. L.
|
|
1982
|
15 |
2 |
p. 199-205
|
artikel
|
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