| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Advances in X-ray analysis. Vol. 22 edited by G. J. McCarthy, C. S. Barrett, D. E. Leyden, J. B. Newkirk and C. O. Ruud
|
Giordani, M.
|
|
1980
|
13 |
5 |
p. 462-463
|
artikel
|
| 2 |
A novel low-temperature X-ray goniometer with closed-cycle cooling to about 18 K
|
Samson, S.
|
|
1980
|
13 |
5 |
p. 425-432
|
artikel
|
| 3 |
An X-ray diffraction study of the system Al2Se3In2Se3 in the In-rich region
|
Gržeta-Plenković, B.
|
|
1980
|
13 |
5 |
p. 454-458
|
artikel
|
| 4 |
A technique for controlling preferred orientation in powder diffraction samples
|
Calvert, L. D.
|
|
1980
|
13 |
5 |
p. 462
|
artikel
|
| 5 |
A white-X-ray four-circle diffractometer
|
Sakamaki, T.
|
|
1980
|
13 |
5 |
p. 433-437
|
artikel
|
| 6 |
Computer program for radial distribution calculation from known bonding topologies
|
D'Antonio, P.
|
|
1980
|
13 |
5 |
p. 459-461
|
artikel
|
| 7 |
Crystal data for a third polymorph (γ) of C.I. Pigment Red 1,1-[(4-nitrophenyl)azo]-2-naphthol
|
Whitaker, A.
|
|
1980
|
13 |
5 |
p. 458-459
|
artikel
|
| 8 |
Crystallographers
|
|
|
1980
|
13 |
5 |
p. 462
|
artikel
|
| 9 |
Crystal subgrain misorientations observed by X-ray topography in reflection
|
Armstrong, R. W.
|
|
1980
|
13 |
5 |
p. 417-424
|
artikel
|
| 10 |
Données cristallographiques sur les thiocyanates de tris(éthylènediamine)rhodium(III) actif, racémique et racémique actif
|
Brouty, C.
|
|
1980
|
13 |
5 |
p. 452-453
|
artikel
|
| 11 |
Industrial crystallization 78 edited by E. J. De Jong and S. J. Jancic
|
Matz, G.
|
|
1980
|
13 |
5 |
p. 463
|
artikel
|
| 12 |
Phase transitions in ammonium nitrate
|
Choi, C. S.
|
|
1980
|
13 |
5 |
p. 403-409
|
artikel
|
| 13 |
Preparation and X-ray powder diffraction studies of triple orthovanadates having langbeinite structure
|
Nabar, M. A.
|
|
1980
|
13 |
5 |
p. 450-451
|
artikel
|
| 14 |
Scanning electron microscopy/1979. Parts I and II edited by O. Johari
|
Schiller, C.
|
|
1980
|
13 |
5 |
p. 463-464
|
artikel
|
| 15 |
Small-angle X-ray scattering due to sample shape
|
Stothart, P. H.
|
|
1980
|
13 |
5 |
p. 438-449
|
artikel
|
| 16 |
The measurement of the X-ray scattering factors of silicon from the fine structure of Laue-case rocking curves
|
Bonse, U.
|
|
1980
|
13 |
5 |
p. 410-416
|
artikel
|
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