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                             42 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A low-cost Richards box for superimposing molecular models on three-dimensional electron density maps Kennard, C. H. L.
1979
12 1 p. 137
artikel
2 An X-ray goniometer for producing accurately oriented crystal faces Lloyd, K. H.
1979
12 1 p. 127-128
artikel
3 A real-time back-reflection Laue camera Bilderback, D. H.
1979
12 1 p. 95-98
artikel
4 A semiautomatic coordinate measuring device for molecular models Mitsui, Y.
1979
12 1 p. 135
artikel
5 A status monitor for the Elliott rotating-anode X-ray source Massey, W. R.
1979
12 1 p. 136
artikel
6 Computer-generated standard stereographic projections Packer, M. E.
1979
12 1 p. 133-134
artikel
7 Constitutional defect structure of CuAl2 Zogg, H.
1979
12 1 p. 91-94
artikel
8 Copying Fees and Copyright Law 1979
12 1 p. 138-139
artikel
9 Correction de temps mort des raies de diffraction X Rigoult, J.
1979
12 1 p. 15-18
artikel
10 Crystal data for calcium fluoride silicon oxide (CaF2.SiO2), a dehydration product of fluorapophyllite Marriner, G. F.
1979
12 1 p. 131-132
artikel
11 Crystallographers 1979
12 1 p. 138
artikel
12 Crystallography by M. P. Shaskol'skaya Kaluski, Z.
1979
12 1 p. 139-140
artikel
13 Determination of the Burgers vector of perfect dislocations observed by X-ray topography in hexagonal single crystals G'Sell, C.
1979
12 1 p. 110-115
artikel
14 Diffraction line broadening of crystals containing small-angle boundaries Wilkens, M.
1979
12 1 p. 119-125
artikel
15 Diffractometry of closely superimposed twins and clusters: a method and a program for establishing UB matrices of single-crystal individuals Tichý, K.
1979
12 1 p. 10-14
artikel
16 Dépouillement par ordinateur des clichés de diffraction obtenus par la méthode de Laue Riquet, J.-P.
1979
12 1 p. 39-41
artikel
17 Détermination de l'intensité intégrée en step-scanning Rigoult, J.
1979
12 1 p. 116-118
artikel
18 Etude des défauts dans des monocristaux naturels de béryl. II. Etude de croissance Scandale, E.
1979
12 1 p. 78-83
artikel
19 Etude des défauts dans des monocristaux naturels de béryl. I. Observations des dislocations Scandale, E.
1979
12 1 p. 70-77
artikel
20 Etude précise des diagrammes de diffraction électronique de poudres de cristaux à grands paramètres. Exemple des phosphates de calcium. Intérêt de la diffraction à très haute tension. Calcul et tracé de diagrammes théoriques Puech, J.
1979
12 1 p. 84-90
artikel
21 Five new polytypes and polytypic change in PbI2 Minagawa, T.
1979
12 1 p. 57-59
artikel
22 FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing Smith, G. S.
1979
12 1 p. 60-65
artikel
23 Gandolfi attachment for a Debye–Scherrer camera Moss, G.
1979
12 1 p. 126
artikel
24 Harmonic-free single-crystal monochromators for neutrons and X-rays Hart, M.
1979
12 1 p. 129
artikel
25 Lattice parameters and birefringence in PbTiO3 single crystals Mabud, S. A.
1979
12 1 p. 49-53
artikel
26 Microfibril dimensions from small-angle X-ray scattering Crist, B.
1979
12 1 p. 27-33
artikel
27 Model drawing programs: manufacture of masks to produce optical transforms Kennard, C. H. L.
1979
12 1 p. 135-136
artikel
28 New crystal data for silver sulphide sulphate, Ag8S3SO4 Hirsch, H.
1979
12 1 p. 129-130
artikel
29 On the possibility of utilizing holographic schemes in X-ray microscopy Aristov, V. V.
1979
12 1 p. 19-24
artikel
30 Orientations mutuelles observées sur des cristaux d'hématite Rozière, J.
1979
12 1 p. 66-69
artikel
31 Piezoelectric and pyroelectric ionic displacements in Na(H3O)[I(OH)3O3] Abrahams, S. C.
1979
12 1 p. 104-106
artikel
32 Profile analysis of diffractometer data Lindqvist, O.
1979
12 1 p. 134
artikel
33 Pyroelectric temperature analysis as a method for study of ferroelectric transitions in polycrystalline materials Topić, M.
1979
12 1 p. 54-56
artikel
34 Quantitative analysis of multicomponent powders by full-profile refinement of Guinier–Hägg X-ray film data Werner, P.-E.
1979
12 1 p. 107-109
artikel
35 Small-angle X-ray data processing for planar multilayered structures. I. Theory Worthington, C. R.
1979
12 1 p. 42-48
artikel
36 Synchrotron Radiation Symposium, European Physical Society Fourth General Conference, York, England, 25–29 September 1978 Stuhrmann, H.
1979
12 1 p. 137-138
artikel
37 Teaching Crystallography for Today's Sciences, Summer School, Erice, Sicily, Italy, 6–16 September 1977 Authier, A.
1979
12 1 p. 138
artikel
38 The orientation of apatite crystals in bone Bacon, G. E.
1979
12 1 p. 99-103
artikel
39 Union Office, Change of Address 1979
12 1 p. 138
artikel
40 X-ray beam polarization measurements Le Page, Y.
1979
12 1 p. 25-26
artikel
41 X-ray diffraction study of MgCl2 aqueous solutions Caminiti, R.
1979
12 1 p. 34-38
artikel
42 X-ray television area detectors for macromolecular structural studies with synchrotron radiation sources Arndt, U. W.
1979
12 1 p. 1-9
artikel
                             42 gevonden resultaten
 
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