| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Atomic-scale STEM-EELS mapping across functional interfaces
|
Colliex, Christian
|
|
2010
|
62 |
12 |
p. 53-57
|
artikel
|
| 2 |
Behavior of dopant-modified interfaces in metallic nanocrystalline materials
|
Rajgarhia, Rahul K.
|
|
2010
|
62 |
12 |
p. 70-74
|
artikel
|
| 3 |
Characterization and analysis of Porous, Brittle solid structures by X-ray micro computed tomography
|
Lin, C. L.
|
|
2010
|
62 |
12 |
p. 86-89
|
artikel
|
| 4 |
Characterization of copper nanoparticles synthesized by a novel microbiological method
|
Varshney, Ratnika
|
|
2010
|
62 |
12 |
p. 102-104
|
artikel
|
| 5 |
Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques
|
Ludwig, W.
|
|
2010
|
62 |
12 |
p. 22-28
|
artikel
|
| 6 |
Get involved: Megan Frary, material advantage advisor
|
Zappas, Kelly
|
|
2010
|
62 |
12 |
p. 110
|
artikel
|
| 7 |
Interface-enabled defect reduction in He ion irradiated metallic multilayers
|
Zhang, X.
|
|
2010
|
62 |
12 |
p. 75-78
|
artikel
|
| 8 |
In the final analysis
|
|
|
2010
|
62 |
12 |
p. 2
|
artikel
|
| 9 |
Materials applications of photoelectron emission microscopy
|
Xiong, G.
|
|
2010
|
62 |
12 |
p. 90-93
|
artikel
|
| 10 |
Measuring depth-dependent dislocation densities and Elastic strains in an indented Ni-based Superalloy
|
Barabash, O. M.
|
|
2010
|
62 |
12 |
p. 29-34
|
artikel
|
| 11 |
Nanoanalysis of interfacial chemistry
|
Schmitz, G.
|
|
2010
|
62 |
12 |
p. 58-63
|
artikel
|
| 12 |
Out of Iowa: Students learn more than materials engineering in Mali
|
Robinson, Lynne
|
|
2010
|
62 |
12 |
p. 11-14
|
artikel
|
| 13 |
Physical, chemical and antimicrobial characterization of copper-bearing material
|
Li, Bowen
|
|
2010
|
62 |
12 |
p. 80-85
|
artikel
|
| 14 |
Rrevealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD
|
Nyilas, Ralph D.
|
|
2010
|
62 |
12 |
p. 44-51
|
artikel
|
| 15 |
Small-scale materials behavior from X-ray microdiffraction and imaging
|
Barabash, Rozaliya I.
|
|
2010
|
62 |
12 |
p. 21
|
artikel
|
| 16 |
Solar-grade silicon production by metallothermic reduction
|
Yasuda, Kouji
|
|
2010
|
62 |
12 |
p. 94-101
|
artikel
|
| 17 |
Solid State interfaces: Toward an atomistic-scale understanding of structure, properties, and behavior
|
Medlin, D. L.
|
|
2010
|
62 |
12 |
p. 52
|
artikel
|
| 18 |
The characterization of new and next-generation materials
|
Cai, Mingdong
|
|
2010
|
62 |
12 |
p. 79
|
artikel
|
| 19 |
The use of advanced characterization to study transitions across solid state interfaces
|
Srinivasan, R.
|
|
2010
|
62 |
12 |
p. 64-69
|
artikel
|
| 20 |
The use of Laue microdiffraction to study small-scale plasticity
|
Swygenhoven, H. Van
|
|
2010
|
62 |
12 |
p. 36-43
|
artikel
|
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