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                             73 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An X-ray photoelectron spectroscopic study of novel SiON glasses Franke, R.
1998
361 6-7 p. 587-590
artikel
2 Atom probe study on the segregation behavior of the binary alloy Pt95Mo5 Eckschlager, A.
1998
361 6-7 p. 672-673
artikel
3 Auger investigations of thin SiC films Ecke, G.
1998
361 6-7 p. 564-568
artikel
4 Cathodoluminescence depth analysis in SiO2-Si-systems Goldberg, M.
1998
361 6-7 p. 560-561
artikel
5 Characterization and application of supported metal catalysts with well-tailored pore systems and metal dispersions Claus, P.
1998
361 6-7 p. 677-679
artikel
6 Characterization of Fe/Cr multilayers by analytical transmission electron microscopy Rennekamp, R.
1998
361 6-7 p. 621-625
artikel
7 Characterization of multilayers by means of EDXS in the analytical TEM Thomas, J.
1998
361 6-7 p. 633-636
artikel
8 Characterization of nanoscale metal structures obtained by template synthesis Schlottig, F.
1998
361 6-7 p. 684-686
artikel
9 Characterization of precursor-ceramic conversion in Si-C-(O,N)-systems by thermoanalytical methods Breuning, T.
1998
361 6-7 p. 592-593
artikel
10 Chemical-bond analysis of nanostructured materials using near-edge fine structures (ELNES) Schneider, R.
1998
361 6-7 p. 527-531
artikel
11 Contributions to accuracy improvement of simultaneous ICP atomic emission spectrometry using multi-line measurements of analyte and internal standard elements Applications for the analysis of permalloy Kucharkowski, R.
1998
361 6-7 p. 532-539
artikel
12 Correlation between mechanical and electrical properties on conductive SiC-fibre reinforced composites Fankhänel, B.
1998
361 6-7 p. 574-576
artikel
13 Depth profiling of Co/Ti – silicide films using total reflection X-ray fluorescence (TXRF) spectrometry combined with low energy ion beam etching (IBE) for sample preparation Frank, W.
1998
361 6-7 p. 625-627
artikel
14 Determination of the cubic to hexagonal structure transition in the metastable system TiN-AlN Cremer, R.
1998
361 6-7 p. 642-645
artikel
15 EDX depth profiling by means of effective layers Myint, Kyaw
1998
361 6-7 p. 637-639
artikel
16 Electrochemical characterisation of laser welding tracks Müller, W.-D.
1998
361 6-7 p. 662-666
artikel
17 Electrolytic hydride generation electrothermal atomic absorption spectrometry – in situ trapping of As on different pre-conditioned end-heated graphite tubes Denkhaus, E.
1998
361 6-7 p. 733-737
artikel
18 Electron probe microanalysis and magnetic characterization of compounds of the system Y-Ni-B-C Szillat, H.
1998
361 6-7 p. 682-684
artikel
19 ESCA investigations on pyrolytic carbon films for fiber coatings Dietrich, D.
1998
361 6-7 p. 601-602
artikel
20 Fluorine profiles in Antarctic meteorites by nuclear reaction analysis (NRA) Noll, K.
1998
361 6-7 p. 713-715
artikel
21 Identification of amber and imitations by near infrared reflection spectroscopy Golloch, A.
1998
361 6-7 p. 545-546
artikel
22 Improvement of the oxidation behavior of Ti1-xAlxN hard coatings by optimization of the Ti/Al ratio Witthaut, M.
1998
361 6-7 p. 639-641
artikel
23 Infrared spectroscopic characterization of the buried interface and surfaces of bonded silicon wafers Friedrich, M.
1998
361 6-7 p. 558-559
artikel
24 In-situ and ex-situ examination of the early stages of chemical vapor deposition Stock, H.-R.
1998
361 6-7 p. 645-646
artikel
25 In-situ investigation of aerosol particles by atomic force microscopy Köllensperger, G.
1998
361 6-7 p. 716-721
artikel
26 In situ investigations of the thermal fatigue behaviour of hot pressed Si3N4 by laser shock loading inside an SEM Kadner, Juliane
1998
361 6-7 p. 578-581
artikel
27 In-situ observation of the nitrogenation of Sm2Fe17 by means of high temperature x-ray diffraction Teresiak, Angelika
1998
361 6-7 p. 674-676
artikel
28 Interface analysis of new tooth filling materials Ziegler, C.
1998
361 6-7 p. 547-553
artikel
29 Investigation of divergent beam X-ray reflex sections especially indication by computer simulation and assignment to the grains in polycrystalline samples Langer, E.
1998
361 6-7 p. 728-732
artikel
30 Investigation of metallization schemes for high temperature devices based on silicon carbide Scholz, T.
1998
361 6-7 p. 570-573
artikel
31 Investigation of non-metallic impurities in High Speed Steel using SIMS imaging and scanning techniques Brunner, C.
1998
361 6-7 p. 667-671
artikel
32 Investigation of the electron beam induced transformation of Cu3 N-films Lesch, N.
1998
361 6-7 p. 604-607
artikel
33 Investigation of the metal adsorbate interface of the system silver coumarin and silver hydrocoumarin by means of surface enhanced Raman spectroscopy Vogel, E.
1998
361 6-7 p. 628-630
artikel
34 Investigation of the microstructure of IrSiX thin films Kurt, R.
1998
361 6-7 p. 609-613
artikel
35 Investigation of ZnS thin films on Si(100) by phase detection imaging and Young’s modulus microscopy Resch, R.
1998
361 6-7 p. 613-617
artikel
36 Investigations of nanocrystalline ceramics and powders by TEM, AFM and plasticity measurements Müller, E.
1998
361 6-7 p. 594-597
artikel
37 Investigations of residual stresses in carbon fibre/aluminium-composites using X-ray diffraction Wielage, B.
1998
361 6-7 p. 652-653
artikel
38 Investigations of the solid state reaction process in mechanically alloyed Zr-Al-Cu-Ni bulk metallic glasses by analytical transmission electron microscopy Seidel, M.
1998
361 6-7 p. 740-742
artikel
39 IR spectroscopic investigations on the determination of the water content in glasses Harder, U.
1998
361 6-7 p. 585-586
artikel
40 Local crystal textures: experimental techniques and future trends Schwarzer, R. A.
1998
361 6-7 p. 522-526
artikel
41 Mass spectrometric investigations on the vanadium-hydrogen-oxygen system Paulus, H.
1998
361 6-7 p. 647-648
artikel
42 Matrix sensitivity of solid sampling AAS. Determination of zinc in geological samples Danzer, K.
1998
361 6-7 p. 710-713
artikel
43 Microanalytical investigations on optical phase gratings in K(TiO)PO4 single crystals Kriegel, R.
1998
361 6-7 p. 687-689
artikel
44 Microstructure and composition of silicon carbide films deposited on carbon fibers by chemical vapor deposition Dietrich, D.
1998
361 6-7 p. 568-569
artikel
45 Nanoscopic phase-analysis of SiC containing BaTiO3-ceramic Neumann-Zdralek, J.
1998
361 6-7 p. 562-564
artikel
46 Nanostructure investigations with the analytical transmission electron microscope Bauer, H.-D.
1998
361 6-7 p. 515-521
artikel
47 New software tools for visualization of analytical data Wolkenstein, M. G.
1998
361 6-7 p. 722-724
artikel
48 Ninth International Conference on Solid State Analysis Marx, G.
1998
361 6-7 p. 513-514
artikel
49 Nucleation and crystallisation of amorphous SiC from polymeric precursors Martin, H.-P.
1998
361 6-7 p. 576-577
artikel
50 On matrix effects in HF-plasma-SNMS analysis of sintered ceramic Ti-Al-(Si)-O Börner, H.
1998
361 6-7 p. 590-591
artikel
51 On tertiary BOx± ions in HF-plasma SNMS Jenett, H.
1998
361 6-7 p. 737-740
artikel
52 Phase formation process of sputtered NiCr(37:63) thin films Pitschke, W.
1998
361 6-7 p. 608-609
artikel
53 Phases and solid structures by calcination of precursors for lead-magnesium-niobates Heegn, H.
1998
361 6-7 p. 598-600
artikel
54 Point defects in (Ti, Fe)N hard coatings, a Mössbauer study Kirsten, A.
1998
361 6-7 p. 649-651
artikel
55 Polarization sensitive in situ infrared spectroscopy: the adsorption of simple ions at platinum electrodes Bron, Michael
1998
361 6-7 p. 694-696
artikel
56 Porous silicon: repeatability of generation? Sperveslage, G.
1998
361 6-7 p. 554-557
artikel
57 Rapid soil analyses of overburden material from historic mines with SNMS Goschnick, J.
1998
361 6-7 p. 704-707
artikel
58 SEM-, EDS- and GDOES investigations for the identification of historical ferrous ore and slag from Sternmühlenthal valley in the outskirts of Chemnitz Dietrich, D.
1998
361 6-7 p. 701-703
artikel
59 SNMS and GDOES studies of the oxidation behavior of TiAl modified by niobium addition Sunderkötter, J. D.
1998
361 6-7 p. 659-662
artikel
60 Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy Witke, K.
1998
361 6-7 p. 619-620
artikel
61 Structural studies of ITO films using grazing incidence x-ray diffractometry Quaas, M.
1998
361 6-7 p. 617-618
artikel
62 Structure analysis of [Be(NCS)2(C5H5N)2] Böhland, H.
1998
361 6-7 p. 725-728
artikel
63 Study of CVD diamond C(100) by X-ray absorption spectroscopies Lübbe, M.
1998
361 6-7 p. 602-604
artikel
64 Submonolayer detection of polymer additives at the surface of industrial products Dietrich, R.
1998
361 6-7 p. 692-694
artikel
65 Surface analysis of titanium based biomaterials Born, R.
1998
361 6-7 p. 697-700
artikel
66 Surface- and microanalytical characterization of ion-implanted Si-C-N layers Klewe-Nebenius, H.
1998
361 6-7 p. 630-633
artikel
67 SXPS analysis of passivation and complexation on the CdS (101¯ 0) surface Mayer, D.
1998
361 6-7 p. 689-692
artikel
68 TEM-characterization of rapidly solidified Nb-Al ribbons Arnold, B.
1998
361 6-7 p. 656-659
artikel
69 The analysis of Si3N4, SiC and BN by combustion with elemental fluorine coupled to mass spectrometry Ruße, K.
1998
361 6-7 p. 582-584
artikel
70 The depth distribution of organic additives in mortar measured with plasma-based Secondary Neutral Mass Spectrometry Goschnick, J.
1998
361 6-7 p. 707-709
artikel
71 The effect of water vapor on the oxidation behavior of 9%Cr steels in simulated combustion gases Nickel, H.
1998
361 6-7 p. 540-544
artikel
72 XPS investigations on boron nitride fibre coatings prepared by chemical vapour deposition in comparison to their hydrolytic rate Dietrich, D.
1998
361 6-7 p. 653-655
artikel
73 X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique Schedel-Niedrig, T.
1998
361 6-7 p. 680-682
artikel
                             73 gevonden resultaten
 
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