nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of Co and Cr dopants in epitaxial films of β-FeSi2 by ERDA, RBS, EDX and AES
|
Bohne, W. |
|
1999 |
|
1-3 |
p. 258-262 |
artikel |
2 |
A photoelectrochemical study of anodic oxides on lead selenide surfaces in alkaline solutions
|
Meincke, H. |
|
1999 |
|
1-3 |
p. 147-149 |
artikel |
3 |
Application of infrared reflection spectroscopy for the analysis of hard coatings on metallic substrates
|
Heger, P. |
|
1999 |
|
1-3 |
p. 103-105 |
artikel |
4 |
Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum
|
Gritsch, M. |
|
1999 |
|
1-3 |
p. 188-194 |
artikel |
5 |
Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis
|
Schwenke, H. |
|
1999 |
|
1-3 |
p. 19-27 |
artikel |
6 |
Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM
|
Reiche, R. |
|
1999 |
|
1-3 |
p. 76-82 |
artikel |
7 |
Characterisation of biomaterials using ToF-SIMS
|
Léonard, D. |
|
1999 |
|
1-3 |
p. 3-11 |
artikel |
8 |
Characterisation of boron nitride fibre coatings with different crystalline order by TEM and XPS
|
Dietrich, D. |
|
1999 |
|
1-3 |
p. 255-257 |
artikel |
9 |
Characterization of polymers in PEFC-electrodes with EDX and XPS
|
Schulze, M. |
|
1999 |
|
1-3 |
p. 123-132 |
artikel |
10 |
Characterization of transition metal nitride formation in rapid thermal processing (RTP)
|
Galesic, Ivan |
|
1999 |
|
1-3 |
p. 199-202 |
artikel |
11 |
Chemical interaction and diffusion on interface cathode/electrolyte of SOFC
|
Naoumidis, A. |
|
1999 |
|
1-3 |
p. 277-281 |
artikel |
12 |
Combined atom probe and STM study of tip-substrate interactions
|
Fian, A. |
|
1999 |
|
1-3 |
p. 38-42 |
artikel |
13 |
Depth profile and microscopic structure of gold-implanted aluminum using X-ray spectroscopies
|
Baur, K. |
|
1999 |
|
1-3 |
p. 208-211 |
artikel |
14 |
Effect of surface oxidation on the solution of hydrogen in vanadium
|
Kiss, G. |
|
1999 |
|
1-3 |
p. 203-207 |
artikel |
15 |
Electron spectroscopy applied to metastable ceramic solution phases
|
Cremer, R. |
|
1999 |
|
1-3 |
p. 28-37 |
artikel |
16 |
EPMA sputter depth profiling of an InGaAs-InP heterostructure
|
Richter, S. |
|
1999 |
|
1-3 |
p. 221-226 |
artikel |
17 |
Examinations on the morphology of tarnish layers grown on stainless 18–10 chromium nickel steels
|
Pajonk, G. |
|
1999 |
|
1-3 |
p. 236-243 |
artikel |
18 |
Factor analysis and XPS-data preprocessing for non-conducting samples
|
Oswald, S. |
|
1999 |
|
1-3 |
p. 59-62 |
artikel |
19 |
High-resolution analytical transmission electron microscopy of semiconductor quantum structures
|
Schneider, R. |
|
1999 |
|
1-3 |
p. 217-220 |
artikel |
20 |
Investigation of the properties of a-C:H coatings with graded metal interlayers
|
Nöthe, M. |
|
1999 |
|
1-3 |
p. 249-254 |
artikel |
21 |
Investigations of local electrical surface characteristics by dynamical scanning force microscopy
|
Hietschold, M. |
|
1999 |
|
1-3 |
p. 96-98 |
artikel |
22 |
Investigations to calibrate reference standards for the thickness of coatings
|
Ahbe, T. |
|
1999 |
|
1-3 |
p. 55-58 |
artikel |
23 |
Material removal and chemical and structural changes induced by irradiation of polymer surfaces with KrF-excimer laser radiation
|
Wesner, D. A. |
|
1999 |
|
1-3 |
p. 183-187 |
artikel |
24 |
Mixed self-assembled monolayers of terminally functionalized thiols at gold surfaces characterized by angle resolved X-ray photoelectron spectroscopy (ARXPS) studies
|
Heeg, J. |
|
1999 |
|
1-3 |
p. 272-276 |
artikel |
25 |
Morphology and structure of nanoscale Co-Cu multilayers
|
Thomas, J. |
|
1999 |
|
1-3 |
p. 263-268 |
artikel |
26 |
Nitrogen incorporation into WTi films
|
Burschik, J. |
|
1999 |
|
1-3 |
p. 269-271 |
artikel |
27 |
Operation and application of a laser mass analyser (LASMA) for multielement analysis
|
Woll, D. M. |
|
1999 |
|
1-3 |
p. 70-75 |
artikel |
28 |
Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS
|
Hesse, R. |
|
1999 |
|
1-3 |
p. 48-54 |
artikel |
29 |
Potassium and oxygen diffusion and segregation in nickel
|
Schulze, M. |
|
1999 |
|
1-3 |
p. 178-182 |
artikel |
30 |
Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GD-OES and FT-IR
|
Dreer, S. |
|
1999 |
|
1-3 |
p. 85-95 |
artikel |
31 |
Quantitative comparison of ATR-IR spectra of LB and bulk layers of 22-tricosenic acid on inorganic supports
|
Müller, G. |
|
1999 |
|
1-3 |
p. 43-47 |
artikel |
32 |
Raman spectroscopy of C-, BN-, SiC-layers deposited on multifilament substrates
|
Meyer, N. |
|
1999 |
|
1-3 |
p. 133-135 |
artikel |
33 |
Recent instrumental developments in magnetic sector SIMS
|
Schuhmacher, M. |
|
1999 |
|
1-3 |
p. 12-18 |
artikel |
34 |
Robust automated three-dimensional segmentation of secondary ion mass spectrometry image sets
|
Wolkenstein, M. |
|
1999 |
|
1-3 |
p. 63-69 |
artikel |
35 |
Scanning electrochemical microscopy of enzymes immobilized on structured glass-gold substrates
|
Wilhelm, T. |
|
1999 |
|
1-3 |
p. 163-167 |
artikel |
36 |
SEM and AES depth profile studies of thin titanium and titanium oxide films covered by nanoscale evaporated Au layers
|
van den Berg, A. H. J. |
|
1999 |
|
1-3 |
p. 231-235 |
artikel |
37 |
SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron
|
Gastel, M. |
|
1999 |
|
1-3 |
p. 142-146 |
artikel |
38 |
SIMS depth profiling, line scanning and imaging analyses of the oxide layer on in-reactor corroded cladding specimens with high lateral resolution
|
Gebhardt, O. |
|
1999 |
|
1-3 |
p. 117-122 |
artikel |
39 |
Stepped current electromigration test of multilevel aluminum metallizations on wafer level
|
Strasser, M. |
|
1999 |
|
1-3 |
p. 99-102 |
artikel |
40 |
Structural and optical properties of thin silver films deposited on Si(111)
|
Masten, A. |
|
1999 |
|
1-3 |
p. 227-230 |
artikel |
41 |
Studies of polycrystalline materials by Pseudo Kossel technique
|
Langer, E. |
|
1999 |
|
1-3 |
p. 212-216 |
artikel |
42 |
Study of the surface composition of vanadyl pyrophosphate catalysts by XPS and ISS – Influence of Cs+ and water vapor on the surface P/V ratio of (VO)2P2O7 catalysts
|
Richter, F. |
|
1999 |
|
1-3 |
p. 150-153 |
artikel |
43 |
Surface analytical investigation of the electrochemical and corrosion behaviour of nanocrystalline FeAl8
|
John, A. |
|
1999 |
|
1-3 |
p. 136-141 |
artikel |
44 |
Surface and interface analysis of PVD Al-O-N and γ-Al2O3 diffusion barriers
|
Cremer, R. |
|
1999 |
|
1-3 |
p. 158-162 |
artikel |
45 |
Surface characterisation of laser irradiated SiC ceramics by AES and XPS
|
Baunack, S. |
|
1999 |
|
1-3 |
p. 173-177 |
artikel |
46 |
The dependence of fractal dimension on measuring conditions of scanning probe microscopy
|
Zahn, W. |
|
1999 |
|
1-3 |
p. 168-172 |
artikel |
47 |
The influence of an epitaxial CoSi2 layer on diffusion of B and Sb in underlying Si during oxidation
|
Tyagi, A. K. |
|
1999 |
|
1-3 |
p. 282-285 |
artikel |
48 |
The influence of ion beam sputtering on the composition of the near-surface region of silicon carbide layers
|
Ecke, G. |
|
1999 |
|
1-3 |
p. 195-198 |
artikel |
49 |
10th Working Conference on Applied Surface Analysis (AOFA 10)Kaiserslautern, 6–10 September 1998
|
Oechsner, H. |
|
1999 |
|
1-3 |
p. 1-2 |
artikel |
50 |
Ultra thin film sputter depth profiling
|
Moulder, J. F. |
|
1999 |
|
1-3 |
p. 83-84 |
artikel |
51 |
Water uptake of quartz investigated by means of ion-beam analysis
|
Dersch, O. |
|
1999 |
|
1-3 |
p. 114-116 |
artikel |
52 |
XANES and XPS characterization of hard amorphous CSixNy thin films grown by RF nitrogen plasma assisted pulsed laser deposition
|
Thärigen, T. |
|
1999 |
|
1-3 |
p. 244-248 |
artikel |
53 |
XPS analysis of electrochemically oxidized nickel surfaces
|
Lorenz, M. |
|
1999 |
|
1-3 |
p. 154-157 |
artikel |
54 |
XPS analysis of the degradation of Nafion
|
Schulze, M. |
|
1999 |
|
1-3 |
p. 106-113 |
artikel |