| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy
|
Evsikov, I. D.
|
|
|
65 |
11 |
p. 1846-1852
|
artikel
|
| 2 |
An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO2(Y) Films
|
Filatov, D. O.
|
|
|
65 |
11 |
p. 1744-1747
|
artikel
|
| 3 |
An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy
|
Khalisov, M. M.
|
|
|
65 |
11 |
p. 1853-1858
|
artikel
|
| 4 |
Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy
|
Kuzin, S. V.
|
|
|
65 |
11 |
p. 1736-1739
|
artikel
|
| 5 |
A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range
|
Mitrofanov, A. V.
|
|
|
65 |
11 |
p. 1814-1821
|
artikel
|
| 6 |
Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility
|
Garakhin, S. A.
|
|
|
65 |
11 |
p. 1792-1799
|
artikel
|
| 7 |
Contact Stiffness Measurements with an Atomic Force Microscope
|
Ankudinov, A. V.
|
|
|
65 |
11 |
p. 1866-1872
|
artikel
|
| 8 |
Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy
|
Goray, L. I.
|
|
|
65 |
11 |
p. 1822-1827
|
artikel
|
| 9 |
Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph
|
Djuzhev, N. A.
|
|
|
65 |
11 |
p. 1755-1759
|
artikel
|
| 10 |
Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles
|
Semenov, M. B.
|
|
|
65 |
11 |
p. 1717-1725
|
artikel
|
| 11 |
Ion-Beam Methods for High-Precision Processing of Optical Surfaces
|
Zabrodin, I. G.
|
|
|
65 |
11 |
p. 1837-1845
|
artikel
|
| 12 |
Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations
|
Mironov, V. L.
|
|
|
65 |
11 |
p. 1740-1743
|
artikel
|
| 13 |
Material Surface Treatment for Design of Composite Optical Elements
|
Zorina, M. V.
|
|
|
65 |
11 |
p. 1828-1831
|
artikel
|
| 14 |
Microwave Volt–Impedance Spectroscopy of Semiconductors
|
Reznik, A. N.
|
|
|
65 |
11 |
p. 1859-1865
|
artikel
|
| 15 |
Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam
|
Garakhin, S. A.
|
|
|
65 |
11 |
p. 1780-1785
|
artikel
|
| 16 |
Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems
|
Pligovka, A.
|
|
|
65 |
11 |
p. 1771-1776
|
artikel
|
| 17 |
Multilayer Cr/Sc Mirrors with Improved Reflection for the “Water Transparency Window” Range
|
Polkovnikov, V. N.
|
|
|
65 |
11 |
p. 1809-1813
|
artikel
|
| 18 |
Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method
|
Toropov, M. N.
|
|
|
65 |
11 |
p. 1873-1879
|
artikel
|
| 19 |
Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography
|
Glagolev, P. Yu.
|
|
|
65 |
11 |
p. 1709-1716
|
artikel
|
| 20 |
Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire
|
Fomin, L. A.
|
|
|
65 |
11 |
p. 1748-1754
|
artikel
|
| 21 |
Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation
|
Barysheva, M. M.
|
|
|
65 |
11 |
p. 1726-1735
|
artikel
|
| 22 |
Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures
|
Abrosimova, N. D.
|
|
|
65 |
11 |
p. 1767-1770
|
artikel
|
| 23 |
The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors
|
Gurovich, B. A.
|
|
|
65 |
11 |
p. 1777-1779
|
artikel
|
| 24 |
The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy
|
Gusev, N. S.
|
|
|
65 |
11 |
p. 1832-1836
|
artikel
|
| 25 |
The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems
|
Smertin, R. M.
|
|
|
65 |
11 |
p. 1800-1808
|
artikel
|
| 26 |
The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range
|
Pleshkov, R. S.
|
|
|
65 |
11 |
p. 1786-1791
|
artikel
|
| 27 |
Using Atomic Force Microscopy in the Study of Superprotonic Crystals
|
Gainutdinov, R. V.
|
|
|
65 |
11 |
p. 1760-1766
|
artikel
|
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