| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Anomalously Large Burgers Vectors of Screw Dislocations in Gallium Nitride Nanowires
|
Kirilenko, D. A.
|
|
|
66 |
4 |
p. 644-647
|
artikel
|
| 2 |
Application of Electron Energy-Loss Spectroscopy for Analysis of the Microstructure of Reactor Materials
|
Prikhod’ko, K. E.
|
|
|
66 |
4 |
p. 656-662
|
artikel
|
| 3 |
Application of the EBSD Method to Study the Fracture Mechanisms of Reactor Pressure Vessels Steels under Operational Factors
|
Maltsev, D. A.
|
|
|
66 |
4 |
p. 704-707
|
artikel
|
| 4 |
Editor-in-Chief’s Column
|
|
|
|
66 |
4 |
p. 551-552
|
artikel
|
| 5 |
Electron Microscopy and Electron Diffraction Studies of Morphology and Crystal Structure of Natural Silicas
|
Shklover, V. Ya.
|
|
|
66 |
4 |
p. 663-672
|
artikel
|
| 6 |
Electron Microscopy in the Study of Lunar Regolith
|
Mokhov, A. V.
|
|
|
66 |
4 |
p. 648-655
|
artikel
|
| 7 |
Electron Microscopy Study of Surface Islands in Epitaxial Ge3Sb2Te6 Layer Grown on a Silicon Substrate
|
Zaytseva, Yu. S.
|
|
|
66 |
4 |
p. 687-693
|
artikel
|
| 8 |
Extended Defects in O+-Implanted Si Layers and Their Luminescence
|
Vdovin, V. I.
|
|
|
66 |
4 |
p. 625-635
|
artikel
|
| 9 |
In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms
|
Rogilo, D. I.
|
|
|
66 |
4 |
p. 570-580
|
artikel
|
| 10 |
Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials
|
Bondarenko, V. I.
|
|
|
66 |
4 |
p. 594-600
|
artikel
|
| 11 |
Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials
|
Lukina, E. A.
|
|
|
66 |
4 |
p. 618-624
|
artikel
|
| 12 |
Microscopic Studies of Alignment Layers Processed by a Focused Ion Beam for the Creation of Liquid Crystal Metasurfaces
|
Artemov, V. V.
|
|
|
66 |
4 |
p. 673-681
|
artikel
|
| 13 |
Microstructural Features of Poly(N-Vinylpyrrolidone)−La(NO3)3 ⋅ 6H2O Hydrogel
|
Orekhov, A. S.
|
|
|
66 |
4 |
p. 699-703
|
artikel
|
| 14 |
Microstructure and Rheological Behavior of Stabilized Gold Nanoparticles Hydrosol
|
Kamyshinsky, R. A.
|
|
|
66 |
4 |
p. 612-617
|
artikel
|
| 15 |
Microstructure of Epitaxial GaN Layers Synthesized on Nanoprofiled Si(001) Substrates
|
Myasoedov, A. V.
|
|
|
66 |
4 |
p. 682-686
|
artikel
|
| 16 |
Specific Features of the Atomic Structure of Iron Silicide Nanocrystals in a Silicon Matrix
|
Gutakovskii, A. K.
|
|
|
66 |
4 |
p. 601-607
|
artikel
|
| 17 |
Structural Transformations of the Dislocation Cores in Si and Their Relationship with Photoluminescence
|
Fedina, L. I.
|
|
|
66 |
4 |
p. 636-643
|
artikel
|
| 18 |
Study of Wide-Gap Semiconductors Using Electron-Beam Induced Current Method
|
Yakimov, E. B.
|
|
|
66 |
4 |
p. 581-593
|
artikel
|
| 19 |
Technique for Determining the Fracture Relief Periodicity in Fractured Materials
|
Artamonov, M. A.
|
|
|
66 |
4 |
p. 694-698
|
artikel
|
| 20 |
The Electron Diffraction Investigation of the Phase Structures in the Systems MF2–RF3 (CaF2–ErF3, SrF2–LaF3)
|
Nikolaychik, V. I.
|
|
|
66 |
4 |
p. 608-611
|
artikel
|
| 21 |
Ultrafast Electron Microscopy: An Instrument of the XXI Century
|
Aseev, S. A.
|
|
|
66 |
4 |
p. 553-569
|
artikel
|
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