nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Boron electrical activation in dual B+ + N+ and B+ + Ar+ ion-implanted silicon
|
Odzhaev, V. B. |
|
1996 |
62 |
4 |
p. 355-358 |
artikel |
2 |
Electrical characteristics of the rf-excited oxygen plasma-cathodization-grown SiO2/Si interface
|
Liang, Z. X. |
|
1996 |
62 |
4 |
p. 391-395 |
artikel |
3 |
Growth enhancement of UF5 nano-particles assisted by α-ray ionization
|
Kuga, Y. |
|
1996 |
62 |
4 |
p. 373-379 |
artikel |
4 |
High-temperature structure of C60An in situ X-ray diffraction study
|
Vogel, W. |
|
1996 |
62 |
4 |
p. 295-301 |
artikel |
5 |
Investigation of ultrathin iron and iron/nickel layers prepared from Langmuir-Blodgett films
|
Faldum, T. |
|
1996 |
62 |
4 |
p. 317-322 |
artikel |
6 |
Ionic character of SrF2–B2O3–GeO2–SiO2 glasses for viscous flow and their applications to MOS capacitors
|
Kobayashi, K. |
|
1996 |
62 |
4 |
p. 313-315 |
artikel |
7 |
L X-ray fluorescence cross sections and yields for medium Z elements in the energy region 5.47≤E≤9.36 keV
|
Rao, D. V. |
|
1996 |
62 |
4 |
p. 381-386 |
artikel |
8 |
Microcavity dynamics during laser-induced spallation of liquids and gels
|
Paltauf, G. |
|
1996 |
62 |
4 |
p. 303-311 |
artikel |
9 |
Nature of the surface layer in ABO3-type perovskites at elevated temperatures
|
Szot, K. |
|
1996 |
62 |
4 |
p. 335-343 |
artikel |
10 |
On the recombination behaviour of iron in moderately boron-doped p-type silicon
|
Walz, D. |
|
1996 |
62 |
4 |
p. 345-353 |
artikel |
11 |
On the redistribution of 6Li+ ions implanted into polypropylene foils
|
Fink, D. |
|
1996 |
62 |
4 |
p. 359-367 |
artikel |
12 |
Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images
|
Stenkamp, D. |
|
1996 |
62 |
4 |
p. 369-372 |
artikel |
13 |
Raman spectroscopy of strained GeSi alloys deposited on Ge substrates
|
Gu, S. |
|
1996 |
62 |
4 |
p. 387-390 |
artikel |
14 |
Theoretical analysis of the surface thermal wave technique for measuring the thermal diffusivity of thin slabs
|
Zhang, B. |
|
1996 |
62 |
4 |
p. 323-334 |
artikel |