| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Check Total for Validating Standardless and Normalised EDX Analysis at Low kV
|
Statham, Peter J.
|
|
2004
|
145 |
1-4 |
p. 229-235
|
artikel
|
| 2 |
Analytical Electron Microscopy in a Discontinuous Precipitated Cu–In Alloy
|
López, Gabriel A.
|
|
2004
|
145 |
1-4 |
p. 101-105
|
artikel
|
| 3 |
An EPMA Study on KNbO3 and NaNbO3 Single Crystals – Potential Reference Materials for Quantitative Microanalysis
|
Samardzžija, Zoran
|
|
2004
|
145 |
1-4 |
p. 203-208
|
artikel
|
| 4 |
Certified Reference Materials for Micro-Analysis of Carbon and Nitrogen
|
Saunders, Stuart
|
|
2004
|
145 |
1-4 |
p. 209-213
|
artikel
|
| 5 |
Characterisation of Sugar Cane Combustion Particles in the Araraquara Region, Southeast Brazil
|
Godoi, Ricardo H. M.
|
|
2004
|
145 |
1-4 |
p. 53-56
|
artikel
|
| 6 |
Characterization of Interfacial Reactions in Cu/In/Cu Joints
|
Litynska, Lidia
|
|
2004
|
145 |
1-4 |
p. 107-110
|
artikel
|
| 7 |
Chemical Characterization of Airborne Particles in St. Martinus Cathedral in Weert, The Netherlands
|
Spolnik, Zoya
|
|
2004
|
145 |
1-4 |
p. 223-227
|
artikel
|
| 8 |
Chemical Investigation of Coloured Minerals in Natural Stones of Commercial Interest
|
Vaggelli, Gloria
|
|
2004
|
145 |
1-4 |
p. 249-254
|
artikel
|
| 9 |
Comparison of Dynamic Simulations with RBS Measurements of Low Energy Ion Implantation of Sb+ into SiO2/Si Substrates
|
Ignatova, Velislava A.
|
|
2004
|
145 |
1-4 |
p. 67-74
|
artikel
|
| 10 |
Composition Modulation in Low Temperature Growth of InGaAs/GaAs System: Influence on Plastic Relaxation
|
Herrera, Miriam
|
|
2004
|
145 |
1-4 |
p. 63-66
|
artikel
|
| 11 |
Contribution of EBSD to the Understanding of Massive γ Transformation in TiAl
|
Pouchou, Jean-Louis
|
|
2004
|
145 |
1-4 |
p. 177-182
|
artikel
|
| 12 |
Crystalline Inclusions Formed in C+N+BF2 Coimplanted on Silicon (111)
|
Ponce, Arturo
|
|
2004
|
145 |
1-4 |
p. 165-169
|
artikel
|
| 13 |
Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB)
|
Richter, Silvia
|
|
2004
|
145 |
1-4 |
p. 187-192
|
artikel
|
| 14 |
Design and Application of a Set of Vitreous Standards for EDS-SEM Microanalysis of Melting Shop Slags
|
Luna, Carmen
|
|
2004
|
145 |
1-4 |
p. 121-127
|
artikel
|
| 15 |
Detection of Gas Bubble by SIMS in Irradiated Nuclear Fuel
|
Lamontagne, Jérôme
|
|
2004
|
145 |
1-4 |
p. 91-94
|
artikel
|
| 16 |
EDS X-Ray Investigation of Interdiffusion in Au–Ni Micro- and Nanolayers
|
Rakowska, Anna
|
|
2004
|
145 |
1-4 |
p. 183-186
|
artikel
|
| 17 |
Effect of Different Electron Elastic-Scattering Cross Sections on Inelastic Mean Free Paths Obtained from Elastic-Backscattering Experiments
|
Jablonskiz, Aleksander
|
|
2004
|
145 |
1-4 |
p. 75-80
|
artikel
|
| 18 |
Electron Excited M X-Ray Spectra of the Elements 55≤Z≤58
|
Dellith, Jan
|
|
2004
|
145 |
1-4 |
p. 25-28
|
artikel
|
| 19 |
Examination of the Plenum and Deposition Coupon of the Phebus FPT4 Test by Scanning Electron Microscopy and Photoemission Spectroscopy
|
Bottomley, Paul D. W.
|
|
2004
|
145 |
1-4 |
p. 3-12
|
artikel
|
| 20 |
From Substrate to Coating: Micro- and Surface Analysis Techniques for the Development of Steel Products
|
Dillen, Rik
|
|
2004
|
145 |
1-4 |
p. 29-39
|
artikel
|
| 21 |
Identification by Electron Probe Microbeam Analysis of Submicron Borides in Joints of Nickel Base Superalloys
|
Pascal, Céline
|
|
2004
|
145 |
1-4 |
p. 147-151
|
artikel
|
| 22 |
Image Formation in Low Vacuum SEM
|
Thiel, Bradley L.
|
|
2004
|
145 |
1-4 |
p. 243-247
|
artikel
|
| 23 |
Investigation of Contemporary Forgeries of Ancient Silver Coins
|
Kraft, Gunther
|
|
2004
|
145 |
1-4 |
p. 87-90
|
artikel
|
| 24 |
Investigation of Nickel-Based Alloys Exposed to Supercritical Water Environments
|
Habicht, Wilhelm
|
|
2004
|
145 |
1-4 |
p. 57-62
|
artikel
|
| 25 |
Large-Field EBSD Mapping: Application to the Microstructure of a Friction Stir Welding Nugget
|
Pouchou, Jean-Louis
|
|
2004
|
145 |
1-4 |
p. 171-176
|
artikel
|
| 26 |
Microcalorimeter Detectors and Low Voltage SEM Microanalysis
|
Kenik, Edward A.
|
|
2004
|
145 |
1-4 |
p. 81-85
|
artikel
|
| 27 |
Microchemical Analysis and Microstructural Development of Cr-Doped Mullites
|
Villar, M. Pilar
|
|
2004
|
145 |
1-4 |
p. 255-260
|
artikel
|
| 28 |
Microchemical and Microstructural Characterization of the Early Stages of the Discontinuous Precipitation Reaction in Al-22 at.% Zn Alloy
|
Zieba, Paweł
|
|
2004
|
145 |
1-4 |
p. 275-279
|
artikel
|
| 29 |
Microstructure of Nickel Aluminides Formed in Situ in Aluminium Matrix Composites
|
Olszówka-Myalska, Anita
|
|
2004
|
145 |
1-4 |
p. 133-137
|
artikel
|
| 30 |
Misfit-Dislocation Induced Surface Morphology of InGaAs/GaAs Heterostructures
|
Yastrubchak, Oksana
|
|
2004
|
145 |
1-4 |
p. 267-270
|
artikel
|
| 31 |
Modern Developments and Applications in Microbeam Analysis. Proceedings of the 8th Workshop of the European Microbeam Analysis Society (EMAS), Chiclana de la Frontera, Spain, May 18–22, 2003
|
Llovet, Xavier
|
|
2004
|
145 |
1-4 |
p. 1-2
|
artikel
|
| 32 |
Monte Carlo Simulation of Electron Transport and X-Ray Generation. I. Electron Elastic and Inelastic Scattering
|
Salvat, Francesc
|
|
2004
|
145 |
1-4 |
p. 193-202
|
artikel
|
| 33 |
Monte Carlo Simulation of Electron Transport and X-Ray Generation. II. Radiative Processes and Examples in Electron Probe Microanalysis
|
Llovet, Xavier
|
|
2004
|
145 |
1-4 |
p. 111-120
|
artikel
|
| 34 |
M Spectra of the Rare Earth Elements Measured with an Ultra-Thin Window Si(Li) Detector
|
Wendt, Michael
|
|
2004
|
145 |
1-4 |
p. 261-265
|
artikel
|
| 35 |
New SIMS Procedures for the Characterization of a Complex Silicate Matrix, Na3(REE,Th,Ca,U)Si6O15·2.5H2O (Sazhinite), and Comparison with EMPA and SREF Results
|
Ottolini, Luisa
|
|
2004
|
145 |
1-4 |
p. 139-146
|
artikel
|
| 36 |
Phase and Element Contents of the cBN Based Composites as Estimated by XPS
|
Piskorska, Edyta
|
|
2004
|
145 |
1-4 |
p. 159-163
|
artikel
|
| 37 |
Relaxation of Alkali Glass Exposed to an Electron Beam
|
Gedeon, Ondrej
|
|
2004
|
145 |
1-4 |
p. 49-52
|
artikel
|
| 38 |
SIMS Analysis of Uranium and Actinides in Microparticles of Different Origin
|
Tamborini, Gabriele
|
|
2004
|
145 |
1-4 |
p. 237-242
|
artikel
|
| 39 |
Strategy for Applying Microanalytical Techniques
|
Sloof, Willem G.
|
|
2004
|
145 |
1-4 |
p. 215-221
|
artikel
|
| 40 |
Structural Study of Micro and Nanotubes Synthesized by Rapid Thermal Chemical Vapor Deposition
|
Morales, Francisco M.
|
|
2004
|
145 |
1-4 |
p. 129-132
|
artikel
|
| 41 |
Study of the Microtexture of Recrystallized Aluminium
|
Paul, Henryk
|
|
2004
|
145 |
1-4 |
p. 153-158
|
artikel
|
| 42 |
Study on the Chemistry and Structure of (Na(1−x)Bix)(Nb(1−y)Mny)O3 Ceramics by XPS, AES and EPMA
|
Ławniczak-Jabłońska, Krystyna
|
|
2004
|
145 |
1-4 |
p. 95-99
|
artikel
|
| 43 |
The Corrected Value of the Y La Mass Absorption Coefficient in Silicon
|
Zelechower, Michal
|
|
2004
|
145 |
1-4 |
p. 271-273
|
artikel
|
| 44 |
Thickness Determination of Ultra-Thin Films on Si Substrates by EPMA
|
Campos, Christiani S.
|
|
2004
|
145 |
1-4 |
p. 13-17
|
artikel
|
| 45 |
X-Ray Analysis of Multi-Films for Electrochromic Device Application
|
Cui, Hai-Ning
|
|
2004
|
145 |
1-4 |
p. 19-23
|
artikel
|
| 46 |
X-Ray Microanalysis of Real Materials Using Monte Carlo Simulations
|
Gauvin, Raynald
|
|
2004
|
145 |
1-4 |
p. 41-47
|
artikel
|
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