| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Analytical Potential of EDS at low Voltages
|
Boyes, Edward D.
|
|
2002
|
138 |
3-4 |
p. 225-234
|
article
|
| 2 |
Applications of Electron Microbeam Analysis in the Earth Sciences
|
Bowles, John F. W.
|
|
2002
|
138 |
3-4 |
p. 125-131
|
article
|
| 3 |
Benefits of X-Ray Spectrum Simulation at low Energies
|
Duncumb, Peter
|
|
2002
|
138 |
3-4 |
p. 249-258
|
article
|
| 4 |
Chemical Interactions by Low-Energy Electron-Induced X-Ray Emission Spectroscopy, LEXES
|
Bonnelle, Christiane
|
|
2002
|
138 |
3-4 |
p. 275-282
|
article
|
| 5 |
Design Features of a High Resolution Microcalorimeter EDX System
|
Höhne, Jens
|
|
2002
|
138 |
3-4 |
p. 259-264
|
article
|
| 6 |
Editorial: Modern Developments and Applications in Microbeam Analysis. Proceedings of the 7th Workshop of the European Microbeam Analysis Society (EMAS), May 6–10, 2001, Tampere, Finland
|
Heikinheimo, E.
|
|
2002
|
138 |
3-4 |
p. V-VIII
|
article
|
| 7 |
Energy Dispersive X-Ray Spectrometry by Microcalorimetry for the SEM
|
Newbury, Dale
|
|
2002
|
138 |
3-4 |
p. 265-274
|
article
|
| 8 |
EPMA Present and Future
|
Love, Glyn
|
|
2002
|
138 |
3-4 |
p. 115-124
|
article
|
| 9 |
Examples of Quantification in XPS on 5f Materials
|
Gouder, Thomas
|
|
2002
|
138 |
3-4 |
p. 207-215
|
article
|
| 10 |
Improving Matrix Corrections
|
Joy, David C.
|
|
2002
|
138 |
3-4 |
p. 105-113
|
article
|
| 11 |
Monitoring Fibre Surfaces with XPS in Papermaking Processes
|
Johansson, Leena-Sisko
|
|
2002
|
138 |
3-4 |
p. 217-223
|
article
|
| 12 |
Nanometer-Scale Chemical Surface Analysis by Scanning (Tunnelling) Atom Probes
|
Alkemade, Paul F. A.
|
|
2002
|
138 |
3-4 |
p. 195-206
|
article
|
| 13 |
Quantitative High Resolution Electron Microscopy
|
Van Dyck, D.
|
|
2002
|
138 |
3-4 |
p. 153-180
|
article
|
| 14 |
Soft X-Rays and Low-Voltage SEM in Practice
|
Kuypers, Stefan
|
|
2002
|
138 |
3-4 |
p. 235-247
|
article
|
| 15 |
Structural and Chemical Analysis of Materials with High Spatial Resolution
|
van Benthem, Klaus
|
|
2002
|
138 |
3-4 |
p. 181-193
|
article
|
| 16 |
The Legacy of Raimond Castaing
|
Grillon, François
|
|
2002
|
138 |
3-4 |
p. 99-104
|
article
|
| 17 |
X-Ray Microanalysis of Thin Surface Films and Coatings
|
Pouchou, Jean-Louis
|
|
2002
|
138 |
3-4 |
p. 133-152
|
article
|
Journal description