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                             12 results found
no title author magazine year volume issue page(s) type
1 A Contactless Device for Determining the Lifetime of Minor Charge Carriers in Silicon Wafers with pnJunctions O G Koshelev
 2000
 66 10 p. 669-670
2 p.
 article
2 A Microwave Method for Determination of the Recombination Rate of Nonequilibrium Charge Carriers in the Bulk and at the Surface of Doped Silicon Wafers O G Koshelev
 2000
 66 10 p. 663-665
3 p.
 article
3 An XRay Fluorescence Method for Determining the Average Density of Thin Films O S Trushin
 2000
 66 10 p. 674-675
2 p.
 article
4 Applicability of Approximate Equations to the Shape Analysis of Fatigue Curves Yu S Borisov
 2000
 66 10 p. 676-686
11 p.
 article
5 Diagnostics of Silicon Wafers Based on Measurement of Parameters and Thermal Radiation of Solar Cells Yu A Kontsevoi
 2000
 66 10 p. 666-668
3 p.
 article
6 Infrared Tomography of the Lifetime and the Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots V D Akhmetov
 2000
 66 10 p. 657-662
6 p.
 article
7 Mechanical Behavior of Polymer Specimens Subjected to Alternate Cyclic Loading O A Odinokova
 2000
 66 10 p. 687-689
3 p.
 article
8 Oxidation Test as a Method of Quality Control in the Production of Czochralsky SingleCrystal Silicon E E Votintseva
 2000
 66 10 p. 671-673
3 p.
 article
9 Qualimetry of Materials Based on Twisting Test at High Temperatures B A Migachev
 2000
 66 10 p. 690-696
7 p.
 article
10 Sampling Techniques for Analytical Monitoring of the Atmospheric Environment and Industrial Emissions O M Khobotova
 2000
 66 10 p. 697-699
3 p.
 article
11 Spectrophotometric FlowInjection Determination of pAminophenol in Mixtures M I Evgen'ev
 2000
 66 10 p. 653-656
4 p.
 article
12 XRay Fluorescence Analysis StateoftheArt and Trends of Development {Review} A G Revenko
 2000
 66 10 p. 637-652
16 p.
 article
                             12 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands