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                             17 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Controlling the Composition of Mo–Si–N–O Thin Films in Reactive Magnetron Sputtering Gromov, D. G.

53 7 p. 641-649
artikel
2 Design and Manufacturing Features of a Three-Dimensional Microsystem with Side Commutations Belyakov, I. A.

53 7 p. 749-758
artikel
3 Development of an RTL Model of a Pseudo-Random Number Generator Based on Nonlinear Feedback Shift Registers in a Gollmann Cascade Sobolev, V. A.

53 7 p. 728-732
artikel
4 Features of TCAD and SPICE Simulation of a Charged Particle Impact into a 6T SRAM Cell Manufactured Using the CMOS 28-nm Technology Node Petrosyants, K. O.

53 7 p. 737-743
artikel
5 Features of the Three-Dimensional Profile Control of the Elements and Structures of Nanoscale ICs: A Review Nelyubin, I. V.

53 7 p. 659-675
artikel
6 Influence of Cable Losses in Gain and Noise Figure Measurement on a Spectrum Analyzer Krupkina, T. Yu.

53 7 p. 733-736
artikel
7 Investigation of the Structural and Electrophysical Properties of Barium Titanate Nanowires Produced by Hydrothermal Synthesis Tarasov, A. M.

53 7 p. 635-640
artikel
8 Modeling and Optimization of MEMS Comb-Type Capacitive Acceleration Sensor Paing Soe Thu,

53 7 p. 744-748
artikel
9 Multilevel Metallization of High-Temperature Silicon IСs Based on Tungsten. Physics and Technology: A Review Timakov, A. V.

53 7 p. 650-658
artikel
10 Optimization of the Parameters of an Energy Converter Based on a Silicon p–i–n-Diode Saurov, M. A.

53 7 p. 708-713
artikel
11 Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results Moskovskaya, Yu. M.

53 7 p. 696-703
artikel
12 Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. I. System and Implementation Algorithms for Various Product Categories Moskovskaya, Yu. M.

53 7 p. 688-695
artikel
13 Research and Development of a Deep Anisotropic Silicon Plasma Etching Process with Reduced Sidewall Roughness of the Structures Golishnikov, A. A.

53 7 p. 676-681
artikel
14 Research of Factors Impacting Contact Resistance in Thermoelements Korchagin, E. P.

53 7 p. 682-687
artikel
15 Software-Hardware Complex for Accelerating System-on-Chip Design Verification Solodovnikov, A. P.

53 7 p. 722-727
artikel
16 Study of the Thermoelectric Properties of Powerful MOSFETs Smirnov, V. I.

53 7 p. 714-721
artikel
17 TCAD Simulation of a Heavy Charged Particle Impact on an n-MOS Structure as a Part of a Memory Cell Smirnova, V. P.

53 7 p. 704-707
artikel
                             17 gevonden resultaten
 
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