nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of characteristics for periodically doped channel field-effect transistors under extreme thermal conditions
|
Krasnyuk, A. A. |
|
2015 |
44 |
4 |
p. 231-235 |
artikel |
2 |
Computer simulation of the heat distribution element for high-power microwave transistors
|
Glinskii, I. A. |
|
2015 |
44 |
4 |
p. 236-240 |
artikel |
3 |
Electrical properties of contacts with the IrSi-Si-based Schottky barrier
|
Kerimov, E. A. |
|
2015 |
44 |
4 |
p. 244-247 |
artikel |
4 |
Error correction coding for 28-nm CMOS two-phase logic elements
|
Katunin, Yu. V. |
|
2015 |
44 |
4 |
p. 263-268 |
artikel |
5 |
Formation of copper-based interconnects for GaAs monolithic microwave integrated circuits
|
Ishutkin, S. V. |
|
2015 |
44 |
4 |
p. 248-254 |
artikel |
6 |
Investigating the effect of amplitude and phase relaxation on the quality of quantum information technologies
|
Bogdanov, Yu. I. |
|
2015 |
44 |
4 |
p. 225-230 |
artikel |
7 |
Multiple-pixel X-ray linear detector based on single CdZnTe crystals
|
Dvoryankin, V. F. |
|
2015 |
44 |
4 |
p. 241-243 |
artikel |
8 |
Noise immunity of a 28-nm two-phase CMOS combinational logic to transient effects of single nuclear particles
|
Katunin, Yu. V. |
|
2015 |
44 |
4 |
p. 255-262 |
artikel |
9 |
Simulation of the spectroscopic response of photonic isomers with NV centers. Part I
|
Tsukanov, A. V. |
|
2015 |
44 |
4 |
p. 211-224 |
artikel |
10 |
Virtual scanning electron microscope. 5. Application in nanotechnology and in micro- and nanoelectronics
|
Novikov, Yu. A. |
|
2015 |
44 |
4 |
p. 269-282 |
artikel |