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8 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	An analysis of the radiation behavior of pulse voltage stabilizers	Kessarinskiy, L. N.		2012	41	4	p. 251-258	article
2	An estimate of the FPGA sensitivity to effects of single nuclear particles	Bobrovskii, D. V.		2012	41	4	p. 226-230	article
3	Electron transport in thin-base transistor structures exposed to high-energy photons	Puzanov, A. S.		2012	41	4	p. 278-284	article
4	Investigation of the possibility to develop radiation-hardness LSIs for navigational purposes according to the 0.35-μm domestic CMOS SOI technology	Elesin, V. V.		2012	41	4	p. 266-277	article
5	Radiation-induced degradation in the dynamic parameters of memory chips	Boruzdina, A. B.		2012	41	4	p. 259-265	article
6	Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells	Stenin, V. Ya.		2012	41	4	p. 231-238	article
7	Simulation of the local effect of nuclear particles on 65-nm CMOS elements of two-phase logics	Katunin, Yu. V.		2012	41	4	p. 239-250	article
8	Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination	Chumakov, A. I.		2012	41	4	p. 221-225	article

8 results found

Koninklijke Bibliotheek - National Library of the Netherlands