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7 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	Calculation of surface recombination current in bipolar microelectronic structures subjected to ionizing radiation	Pershenkov, V. S.		2009	38	1	p. 17-29	article
2	Experimental studies of the adequacy of laser simulations of dose rate effects in integrated circuits and semiconductor devices	Nikiforov, A. Yu.		2009	38	1	p. 2-16	article
3	Functional-logical simulation of quality of functioning integrated circuits under the effect of radiation and electromagnetic field	Barbashov, V. M.		2009	38	1	p. 30-42	article
4	Introduction to the cycle of articles devoted to methods and means of evaluation and prediction of radiation stability of submicron articles of microelectronics			2009	38	1	p. 1	article
5	Operability analysis of submicron CMOS-based VLSI RAMs operated under extreme thermal conditions	Krasnyuk, A. A.		2009	38	1	p. 48-57	article
6	Prospects for using submicron CMOS VLSI in fault-tolerant equipment operating under exposure to atmospheric neutrons	Betelin, V. B.		2009	38	1	p. 43-47	article
7	Specific features of radiation-stimulated breakdown of a nonuniformly doped p-n junction	Puzanov, A. S.		2009	38	1	p. 58-68	article

7 results found

Koninklijke Bibliotheek - National Library of the Netherlands