nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Study of (In,Ga,Al)As/GaAs Quantum-Dot Heterostructures by X-ray Diffraction and Total Reflection
|
A. A. Zaitsev |
|
2004 |
33 |
1 |
p. 27-32 6 p. |
artikel |
2 |
A Study of (In,Ga,Al)As/GaAs Quantum-Dot Heterostructures by X-ray Diffraction and Total Reflection
|
Zaitsev, A. A. |
|
2004 |
33 |
1 |
p. 27-32 |
artikel |
3 |
Computer Evaluation of a Method for Combinational-Circuit Synthesis in FPGAs
|
S. V. Shalagin |
|
2004 |
33 |
1 |
p. 46-54 9 p. |
artikel |
4 |
Computer Evaluation of a Method for Combinational-Circuit Synthesis in FPGAs
|
Shalagin, S. V. |
|
2004 |
33 |
1 |
p. 46-54 |
artikel |
5 |
Evolution of the CoN/Ti/Si System in Magnetron Sputtering of Co onto a Heated Ti/Si(100) Substrate
|
A. G. Vasiliev |
|
2004 |
33 |
1 |
p. 1-6 6 p. |
artikel |
6 |
Evolution of the Co–N/Ti/Si System in Magnetron Sputtering of Co onto a Heated Ti/Si(100) Substrate
|
Vasiliev, A. G. |
|
2004 |
33 |
1 |
p. 1-6 |
artikel |
7 |
Making Al Metallization Patterns
|
V. K. Smolin |
|
2004 |
33 |
1 |
p. 7-12 6 p. |
artikel |
8 |
Making Al Metallization Patterns
|
Smolin, V. K. |
|
2004 |
33 |
1 |
p. 7-12 |
artikel |
9 |
Nonlinear Recombination Waves in Zn-Doped Si at Fully Developed Instability
|
B. V. Kornilov |
|
2004 |
33 |
1 |
p. 40-45 6 p. |
artikel |
10 |
Nonlinear Recombination Waves in Zn-Doped Si at Fully Developed Instability
|
Kornilov, B. V. |
|
2004 |
33 |
1 |
p. 40-45 |
artikel |
11 |
Photoelectrochemical Oxidation and Erosion of ZnO in Water
|
A. N. Gruzintsev |
|
2004 |
33 |
1 |
p. 33-39 7 p. |
artikel |
12 |
Photoelectrochemical Oxidation and Erosion of ZnO in Water
|
Gruzintsev, A. N. |
|
2004 |
33 |
1 |
p. 33-39 |
artikel |
13 |
Plasma-Assisted Diffusion Doping of Porous-Silicon Films
|
A. A. Kovalevskii |
|
2004 |
33 |
1 |
p. 13-17 5 p. |
artikel |
14 |
Plasma-Assisted Diffusion Doping of Porous-Silicon Films
|
Kovalevskii, A. A. |
|
2004 |
33 |
1 |
p. 13-17 |
artikel |
15 |
Reducing Absorbed Dose by Optimizing Chip Dimensions
|
V. K. Kislelev |
|
2004 |
33 |
1 |
p. 55-61 7 p. |
artikel |
16 |
Reducing Absorbed Dose by Optimizing Chip Dimensions
|
Kislelev, V. K. |
|
2004 |
33 |
1 |
p. 55-61 |
artikel |
17 |
Technological Methods for Improving IC Reliability in Mass Production
|
M. I. Gorlov |
|
2004 |
33 |
1 |
p. 18-26 9 p. |
artikel |
18 |
Technological Methods for Improving IC Reliability in Mass Production
|
Gorlov, M. I. |
|
2004 |
33 |
1 |
p. 18-26 |
artikel |